A VXI-based architecture for a digital test system

Abstract

VXI offers significant advantages as a basis for a board test system, but building VXI-based digital test subsystems is difficult because of the limited resources available in VXI. A distributed-resource architecture, modern integration techniques, and a hard-dock scanning solution enable a high-performance VXI-based digital test subsystem to be built. The digital subsystem is described. The development of a hard-docking scanning and fixturing solution for VXI-based automated test equipment systems solves the problems of connecting the digital subsystem to the unit under test, maintains a high-quality ground system, and also provides a means of routing extra power to the digital subsystem.<>