Technology insertion in a MATE station: lessons learned

The authors explore issues of inserting new technology into test equipment, especially equipment built to the US Air Force's modular automatic test equipment (MATE) standards. The specific results and lessons learned from one such upgrade of new digital technology into a MATE station are discussed. The issue of compatibility with existing test program sets (TPSs) is usually one of the driving forces for the selection of the new equipment. Analog signal compatibility and pin mapping also must be maintained as much as possible to avoid excessive changes to the test adapters. Analog compatibility issues for digital upgrades include clock ranges, voltage levels, input impedances, and pin drive capabilities. Another major interface to be considered for MATE testers is the CIIL language. Some benefits of technology insertion are considered. Some of the lessons learned that apply to upgrading any test station are in the area of the hidden interfaces and system behaviours that will not be visible from just studying specifications. Some questions are suggested that, if asked, may reduce the problems of upgrading the ATE. In the end, tradeoffs must be made between the cost of TPS incompatibilities and the benefits of newer technology.<>