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2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.最新文献

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EMF technical standardisation in the EU 欧盟EMF技术标准化
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428180
G. Goldberg
{"title":"EMF technical standardisation in the EU","authors":"G. Goldberg","doi":"10.1109/ICSMC2.2003.1428180","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428180","url":null,"abstract":"The health effects of EMF on humans are a very topical problem. The Commission of the EU has issued several documents to deal with this matter and CENELEC has set up a technical committee 106x to prepare, together with other committees, relevant product standards. The paper explains the purpose of the EU regulations and gives an overview on the present EMF product standards relating to the limitation of EMF emissions","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123814199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Theoretical and experimental investigation of box-to-antenna coupled EMI noise on a helicopter under the influence of rotors 旋翼影响下直升机盒天线耦合电磁干扰噪声的理论与实验研究
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428284
F. Ustuner, O. Cerezci, N. Ari, S. Seker, Z. Demir, B. Kilic
{"title":"Theoretical and experimental investigation of box-to-antenna coupled EMI noise on a helicopter under the influence of rotors","authors":"F. Ustuner, O. Cerezci, N. Ari, S. Seker, Z. Demir, B. Kilic","doi":"10.1109/ICSMC2.2003.1428284","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428284","url":null,"abstract":"In this work, a specific box-to-antenna EMI coupling problem in an helicopter platform is investigated. The problem is reduced to an antenna-to-antenna coupling problem by modeling the EMI source with a monopole antenna. The VHF high band blade antenna was chosen as the victim antenna. The effect of the main and tail rotors on the coupling is also considered and the rotor modulation effect on the coupling is analyzed. The investigation consisted of two stages; numerical analysis and scaled model measurements. The analysis and measurement results are compared for both maximum coupling and for different rotor positions. A good agreement is found between the numerical analysis and measurement","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"12 12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122868795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Electromagnetic scattering by two parallel conducting elliptic cylinders: iterative solution 两个平行导电椭圆柱体的电磁散射:迭代解
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428182
A. Hamid, M. Hussein
{"title":"Electromagnetic scattering by two parallel conducting elliptic cylinders: iterative solution","authors":"A. Hamid, M. Hussein","doi":"10.1109/ICSMC2.2003.1428182","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428182","url":null,"abstract":"An analytic solution to the problem of a plane electromagnetic wave scattering by two parallel elliptic conducting cylinders is presented using an iterative procedure to account for the multiple scattered field between the cylinders. To compute the higher order terms of the scattered fields, the translation addition theorem for Mathieu functions is implemented to express the field scattered by one cylinder in terms of the elliptic coordinate system of the other cylinder to impose the boundary conditions. Scattered field coefficients of various orders are obtained and written in matrix form. Numerical results are obtained for the scattered field in the far zone for different axial ratios, electrical separations and angles of incidence","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"473 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123055133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Characteristics of an optical magnetic field probe consisting of a loop antenna element doubly-loaded with LiNbO/sub 3/ 双载LiNbO/ sub3 /的环形天线组成的光磁场探头的特性
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428200
E. Suzuki, T. Miyakawa, H. Ota, K. Arai, R. Sato
{"title":"Characteristics of an optical magnetic field probe consisting of a loop antenna element doubly-loaded with LiNbO/sub 3/","authors":"E. Suzuki, T. Miyakawa, H. Ota, K. Arai, R. Sato","doi":"10.1109/ICSMC2.2003.1428200","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428200","url":null,"abstract":"We propose a new type of optical probe designed to detect magnetic near-fields with high accuracy up to the gigahertz range. The probe head consists of a loop antenna element doubly-loaded with electro-optic crystals. It optically realizes the operation of a conventional doubly-loaded loop probe and requires no metallic cables or hybrid junction. We examined the probe characteristics for magnetic field detection up to 10 GHz. We confirmed that the probe can detect magnetic fields near a microstrip line and suppress the influence of electric fields","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115140369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Evaluation of the scattering matrix for impedance sphere 阻抗球散射矩阵的计算
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428184
N. Tezel, S. Simsek
{"title":"Evaluation of the scattering matrix for impedance sphere","authors":"N. Tezel, S. Simsek","doi":"10.1109/ICSMC2.2003.1428184","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428184","url":null,"abstract":"In this work, scattering matrix of the constant impedance sphere is investigated by using series expansion of the incident and the scattering field. Using impedance boundary condition, unknown coefficients in the scattering field were found. We consider the there dimensional case as, sphere is illuminated by plane wave that be along z direction. We obtained the general expressions of the scattered field. Then we sought for the scattering matrix for the y-z plane","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132741955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Frequency domain analysis of the lightning current distribution to ground at the transmission line tower with cellular phone base station 蜂窝电话基站传输线塔地雷电电流分布的频域分析
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428339
L. Greev, A. V. van Deursen, J. V. van Waes
{"title":"Frequency domain analysis of the lightning current distribution to ground at the transmission line tower with cellular phone base station","authors":"L. Greev, A. V. van Deursen, J. V. van Waes","doi":"10.1109/ICSMC2.2003.1428339","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428339","url":null,"abstract":"Cellular phone base stations are often placed in the poles of power transmission lines. We consider the case when such base stations are powered from the low-voltage network. Of special concern is the current that might be led through the cable metallic shields to other customers' premises in case of lightning stroke, which is a frequent cause of flashover of the high-voltage insulators and a subsequent phase to ground fault. This paper presents an analysis in the frequency domain of the lightning current distribution between the earth wires, grounding systems and power cable network, in case of lightning stroke at the tower. The models and the analysis are applied to a practical case","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133440338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation and control methods for the EMC of interlocking systems in the railway environment 铁路环境下联锁系统电磁兼容性的研究与控制方法
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428280
B. Jaekel
{"title":"Investigation and control methods for the EMC of interlocking systems in the railway environment","authors":"B. Jaekel","doi":"10.1109/ICSMC2.2003.1428280","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428280","url":null,"abstract":"Installations in railway systems represent a classic example of extended, large and complex systems. Controlling and ensuring their electromagnetic compatibility is therefore a challenging task and beyond it a fundamental condition because many aspects of personal safety have to be considered. This paper describes the requirements and problems associated with measures to be undertaken when railway infrastructure has to be modernized. It outlines the procedure for analysis and control of EMC in the case when an electronic interlocking system will be introduced into an existing railway environment replacing an old mechanical or electromechanical system. Criteria will be presented for the performance of EMC analysis. Selected potential interference situations regarding track detection systems will be described","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133481561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Automotive EMC test harnesses: standard lengths and their effect on conducted emissions 汽车电磁兼容测试线束:标准长度及其对传导排放的影响
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428237
M. O'hara, J. Colebrooke
{"title":"Automotive EMC test harnesses: standard lengths and their effect on conducted emissions","authors":"M. O'hara, J. Colebrooke","doi":"10.1109/ICSMC2.2003.1428237","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428237","url":null,"abstract":"The harness used on any vehicle is unique to that model, having a specific length of wiring to optimize connections between circuits and a unique configuration of signal and power cabling for each model. The international automotive EMC standards, however, all specify specific \"standard\" lengths for test purposes. While using a standard harness length makes comparison of results easier to perform for different electronic-sub assemblies (ESA) for use on vehicles, does it affect the actual test performance? Presented here is the result of radiated emissions tests conducted to the European automotive EMC directive (95/54/EC) utilising five different \"standard\" length test harnesses and a wide-band noise source. The results illustrate the differences that the harness length has on this individual test technique and discussion on the implications this may have on final installation is provided","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134374527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Emission measurements of microcontrollers 微控制器的发射测量
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428203
T. Steinecke
{"title":"Emission measurements of microcontrollers","authors":"T. Steinecke","doi":"10.1109/ICSMC2.2003.1428203","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428203","url":null,"abstract":"The experience described in this paper is valuable for both microcontroller/ASIC manufacturers and their customers. Based on the international standard IEC 61967 for electromagnetic emission characterization of clocked semiconductor devices, the most important test setups are described. The common usage of those test standards by semiconductor manufacturers enable the comparison of several design steps. On the other hand, system designers are able to compare several competitive microcontrollers/ASICs with respect to their electromagnetic emission behaviour","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116283416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A promising solution of how to evolve present radiated emission standards in order to protect digital communication services 如何改进现有的辐射发射标准以保护数字通信业务是一个很有前途的解决方案
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428303
P. Stenumgaard
{"title":"A promising solution of how to evolve present radiated emission standards in order to protect digital communication services","authors":"P. Stenumgaard","doi":"10.1109/ICSMC2.2003.1428303","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428303","url":null,"abstract":"Present radiated emission standards are developed to protect analog communications services. The issue of finding a new EMI measurement detector, with proper weighting properties for the effect of disturbance on digital communication services, is the key issue in the evolution of present radiated emission standards in order to protect digital communication services. It has recently been shown that the RMS detector has a response that can be correlated to the interference impact on digital communication systems that do not use error-correcting codes or use block codes. In this paper, we show that this conclusion is also valid for systems using convolutional codes. These results form a basis upon which a solution for future radiated emission standards can be built","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122548850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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