Emission measurements of microcontrollers

T. Steinecke
{"title":"Emission measurements of microcontrollers","authors":"T. Steinecke","doi":"10.1109/ICSMC2.2003.1428203","DOIUrl":null,"url":null,"abstract":"The experience described in this paper is valuable for both microcontroller/ASIC manufacturers and their customers. Based on the international standard IEC 61967 for electromagnetic emission characterization of clocked semiconductor devices, the most important test setups are described. The common usage of those test standards by semiconductor manufacturers enable the comparison of several design steps. On the other hand, system designers are able to compare several competitive microcontrollers/ASICs with respect to their electromagnetic emission behaviour","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSMC2.2003.1428203","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The experience described in this paper is valuable for both microcontroller/ASIC manufacturers and their customers. Based on the international standard IEC 61967 for electromagnetic emission characterization of clocked semiconductor devices, the most important test setups are described. The common usage of those test standards by semiconductor manufacturers enable the comparison of several design steps. On the other hand, system designers are able to compare several competitive microcontrollers/ASICs with respect to their electromagnetic emission behaviour
微控制器的发射测量
本文描述的经验对微控制器/ASIC制造商及其客户都很有价值。根据国际标准IEC 61967对时钟半导体器件的电磁发射特性,描述了最重要的测试设置。半导体制造商通常使用这些测试标准,以便对几个设计步骤进行比较。另一方面,系统设计人员能够比较几种竞争微控制器/ asic的电磁发射行为
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信