2011 IEEE International Test Conference最新文献_第3页

Transition test bring-up and diagnosis on UltraSPARCTM processors UltraSPARCTM处理器的过渡试验提出与诊断

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139167

Liang-Chi Chen, P. Dahlgren, P. Dickinson, S. Davidson

引用次数: 0

Analyzing ATE interconnect performance for serial links of 10 Gbps and above 分析10gbps及以上串行链路的ATE互连性能

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139158

Mitchell Lin, T. Tolman

引用次数: 1

Efficient combination of trace and scan signals for post silicon validation and debug 跟踪和扫描信号的有效组合后硅验证和调试

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139157

K. Basu, P. Mishra, Priyadarsan Patra

引用次数: 32

Evaluation of TSV and micro-bump probing for wide I/O testing 宽I/O测试中TSV和微碰撞探测的评价

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139180

Ken Smith, P. Hanaway, Mike Jolley, R. Gleason, E. Strid, T. Daenen, L. Dupas, B. Knuts, E. Marinissen, M. V. Dievel

引用次数: 63

Multi-site test of RF transceivers on low-cost digital ATE 射频收发器在低成本数字ATE上的多站点测试

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139142

Ivo Koren, Ben Schuffenhauer, F. Demmerle, Frank Neugebauer, Gert Pfahl, D. Rautmann

引用次数: 16

On using address scrambling to implement defect tolerance in SRAMs 利用地址置乱实现ram缺陷容错

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139149

R. Fonseca, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, N. Badereddine

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引用次数: 2

Test access and the testability features of the Poulson multi-core Intel Itanium® processor 测试访问和Poulson多核Intel Itanium®处理器的可测试性功能

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139168

D. Bhavsar, Steve Poehlman

引用次数: 3

A Software-Based Self-Test methodology for on-line testing of processor caches 一种基于软件的处理器缓存在线自检方法

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139154

G. Theodorou, N. Kranitis, A. Paschalis, D. Gizopoulos

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引用次数: 10

Development of an ATE test cell for at-speed characterization and production testing 开发用于高速特性和生产测试的ATE测试单元

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139134

J. Moreira

引用次数: 3

Techniques to improve memory interface test quality for complex SoCs 提高复杂soc内存接口测试质量的技术

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139172

V. Devanathan, S. Vooka

引用次数: 2