Test access and the testability features of the Poulson multi-core Intel Itanium® processor

Abstract

This paper presents the “t-Ring” based DFX access architecture and the testability features of Intel's latest multi-core Itanium® processor. The architecture solves many common challenges of testing a multi-core CPU using distinctive and innovative solutions. At the core of the architecture is a hierarchical and scalable test access mechanism design providing flexible access for a variety of use models in high volume manufacturing test and debug platforms.