2011 IEEE International Test Conference最新文献

Physically-aware analysis of systematic defects in integrated circuits 集成电路系统缺陷的物理感知分析

2011 IEEE International Test Conference Pub Date : 2012-08-02 DOI: 10.1109/MDT.2012.2211093

W. Tam, R. D. Blanton

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引用次数: 13

Post-bond testing of 2.5D-SICs and 3D-SICs containing a passive silicon interposer base 含无源硅中间体基的2.5 d - sic和3d - sic的键后测试

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139181

Chun-Chuan Chi, E. Marinissen, S. Goel, Cheng-Wen Wu

引用次数: 48

Using well/substrate bias manipulation to enhance voltage-test-based defect detection 利用井/衬底偏置操作来增强基于电压测试的缺陷检测

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139153

A. Gattiker, P. Nigh

引用次数: 4

Low power compression utilizing clock-gating 利用时钟门控的低功率压缩

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139145

J. Rajski, Elham K. Moghaddam, S. Reddy

引用次数: 20

Hardware hooks for transition scan characterization 用于过渡扫描表征的硬件挂钩

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139166

P. Pant, Eric Skeels

引用次数: 11

Actual implementation of multi domain test: Further reduction of cost of test 多域测试的实际实现:进一步降低测试成本

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139135

Yasuhiro Takahashi, A. Maeda, Mitsuhiro Ogura

引用次数: 3

IEEE Std 1581 — A standardized test access methodology for memory devices 存储器设备的标准化测试存取方法

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139141

H. Ehrenberg, Bob Russell

引用次数: 7

Application of a continuous-time level crossing quantization method for timing noise measurements 连续时间平交量化方法在定时噪声测量中的应用

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139177

Takahiro J. Yamaguchi, M. Soma, T. Aoki, Y. Furukawa, K. Degawa, K. Asada, M. Abbas, S. Komatsu

引用次数: 2

Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks 智能诊断:使用人工神经网络进行高效的板级诊断和修复

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139139

Zhaobo Zhang, K. Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu

{"title":"Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks","authors":"Zhaobo Zhang, K. Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu","doi":"10.1109/TEST.2011.6139139","DOIUrl":"https://doi.org/10.1109/TEST.2011.6139139","url":null,"abstract":"Diagnosis of functional failures at the board level is critical for improving product yield and reducing manufacturing cost. State-of-the-art board-level diagnostic software is unable to cope with high complexity and ever-increasing clock frequencies, and the identification of the root cause of failure on a board is a major problem today. Ambiguous or incorrect repair suggestions lead to long debug times and even wrong repair actions, which significantly increases the repair cost and adversely impacts yield. We propose a smart diagnosis method based on artificial neural networks that can learn from repair history and accurately localize the root cause of a failure. Fine-grained fault syndromes extracted from failure logs and the corresponding repair actions are used to train the neural network. The proposed network structure is simple, it can be rapidly trained, and it is scalable to large datasets. Moreover, the relationship between typical syndromes and the most appropriate repair actions can be easily inferred from the network structure. An industrial board, which is currently in production, is used to validate the diagnosis approach in terms of diagnostic accuracy, resolution, and quantifiable improvement over current diagnostic software.","PeriodicalId":260931,"journal":{"name":"2011 IEEE International Test Conference","volume":"13 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131575347","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 31

Cell-aware analysis for small-delay effects and production test results from different fault models 基于细胞感知的小延迟效应分析及不同故障模型的生产试验结果

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139151

F. Hapke, J. Schlöffel, W. Redemund, Andreas Glowatz, J. Rajski, Michael Reese, J. Rearick, J. Rivers

引用次数: 35