2011 IEEE International Test Conference最新文献_第6页

Generic, orthogonal and low-cost March Element based memory BIST 通用的、正交的、低成本的基于三月元的存储器BIST

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139148

A. V. Goor, S. Hamdioui, H. Kukner

引用次数: 18

Accurate signature driven power conscious tuning of RF systems using hierarchical performance models 使用分层性能模型的射频系统精确签名驱动的功率有意识调谐

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139144

A. Banerjee, Shreyas Sen, S. Devarakond, A. Chatterjee

引用次数: 12

Online timing variation tolerance for digital integrated circuits 数字集成电路在线时序变化公差

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139136

Guihai Yan, Xiaowei Li

引用次数: 1

Wafer probe test cost reduction of an RF/A device by automatic testset minimization — A case study 通过自动最小化测试集来降低RF/A器件的晶圆探头测试成本-一个案例研究

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI: 10.1109/TEST.2011.6139143

D. Drmanac, M. Laisne

引用次数: 7

Real-time testing method for 16 Gbps 4-PAM signal interface 16gbps 4-PAM信号接口的实时测试方法

2011 IEEE International Test Conference Pub Date : 1900-01-01 DOI: 10.1109/TEST.2011.6139160

M. Ishida, K. Ichiyama, D. Watanabe, M. Kawabata, T. Okayasu

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引用次数: 2