存储器设备的标准化测试存取方法

2011 IEEE International Test Conference Pub Date : 2011-09-01 DOI:10.1109/TEST.2011.6139141

H. Ehrenberg, Bob Russell

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引用次数: 7

摘要

每一代存储设备都变得越来越复杂，这一趋势很可能会持续下去。不同类型的存储器对板级测试应用提出了不同的挑战。在本文中，我们讨论了其中的一些挑战，并将介绍一种新的标准测试技术IEEE Std 1581，为与存储设备引脚的板和系统级连接性测试相关的许多问题提供了一个优雅的解决方案。

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IEEE Std 1581 — A standardized test access methodology for memory devices

Memory devices have been becoming more complex with every generation and this trend is very likely to continue. Different kinds of memories present different challenges for board level test applications. In this paper we discuss several of those challenges and will introduce a new test technology standardized as IEEE Std 1581, offering an elegant solution to many problems related to the test of the board and system level connectivity at memory device pins.

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2011 IEEE International Test Conference

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