{"title":"Reliability investigations of printed circuit boards","authors":"S. Ehrler","doi":"10.1109/IEMTIM.1998.704628","DOIUrl":"https://doi.org/10.1109/IEMTIM.1998.704628","url":null,"abstract":"Summary form only given. Reliability is one of the key performance measures of current printed circuit boards. This paper deals with the reliability of various PCB base materials. The influence of plated Cu-thickness, surface finish metallization and aspect ratio and the possible difference between connections on the outer and inner layers of a board are considered.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"55 Pt B 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131713177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Kobayashi, S. Itaya, K. Ikeda, J. Kawasaki, H. Honma
{"title":"Application of via post interconnection for build up printed circuit board","authors":"T. Kobayashi, S. Itaya, K. Ikeda, J. Kawasaki, H. Honma","doi":"10.1109/IEMTIM.1998.704666","DOIUrl":"https://doi.org/10.1109/IEMTIM.1998.704666","url":null,"abstract":"Recently, printed circuit boards (PCBs) have been downsized and electronic circuits have become more dense, because of the tendency for electronic component miniaturization. With the shrinkage of PCBs, the build up process has become an important production technique in PCB preparation. For the build up technique, each of the electric circuit layers is electrically connected with via holes. The via holes are metallized by means of electroless plating and electroplating of copper. In the electroless plating process with miniaturization of via hole diameter, if the via hole deposition uniformity is decreased, the electrical reliability between the layers significantly deteriorates. Accordingly, the authors investigated build up printed circuit boards using via posts, which are metallized using the Cu electroplating method. The shear strength between electroplated via posts and electrolessly plated underlayers was evaluated. It was found that electroplated via posts with higher shear strength are obtained by optimization of the pretreatment process and electroplating conditions. In particular, it was important that oxide films on the copper underlayer were removed for improved shear strength.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129042125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fuzzy logic based thermal design for MCM placement","authors":"Y. Huang, S. Fu, Y. Chang","doi":"10.1109/IEMTIM.1998.704560","DOIUrl":"https://doi.org/10.1109/IEMTIM.1998.704560","url":null,"abstract":"An algorithm that perform a global placement procedure by taking into account both routability and reliability is presented in this paper. For reliability considerations, the design methodology addresses the placement of the power dissipating chips to achieve a uniform thermal distribution. Placement for routability is based on minimization of the total wire length. The placement trade-offs between routing and reliability are investigated. Our approach to the placement problem is based on the modified force-directed placement method. The proposed thermal force-directed placement method relates the force equations to the power dissipation values of the individual bare chips. Examples of multichip placement are presented. The finite element simulation results show that our approach can obtain better a thermal distribution than other traditional placement methods.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124711608","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Kobayashi, Y. Kumashiro, A. Takahashi, K. Morita, T. Tanabe
{"title":"Epoxy adhesive sheet with copper foil for multiple IVH build-up technology","authors":"K. Kobayashi, Y. Kumashiro, A. Takahashi, K. Morita, T. Tanabe","doi":"10.1109/IEMTIM.1998.704520","DOIUrl":"https://doi.org/10.1109/IEMTIM.1998.704520","url":null,"abstract":"The interstitial via hole (IVH) structure, in which the interconnections of signal layers are designed with nonthrough holes, is strongly focused to meet the need for small and high-performance electronic equipment with thinner and high wiring density multilayer boards (MLBs). A new epoxy adhesive sheet with copper foil was developed for multiple IVH build-up technology. Since no glass cloth is used for reinforcement, the adhesive sheet allows IVH structure fabrication by CO/sub 2/ laser ablation. It has superior resin flow properties for filling both inner-pattern and inner-layer IVH structures. The surface flatness of the build-up layer with this new sheet allows very fine wiring patterns on to be fabricated. This sheet, which does not concave during the wire-bonding process since its surface is hard at high temperature, is suitable for MLBs with semiconductor chips. This material is effective for manufacture of thin MLBs with IVH structure and high wiring densities.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121635229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The application of flip chip bonding technology using anisotropic conductive film to the mobile communications terminals","authors":"A. Torii, M. Takizawa, M. Sawano","doi":"10.1109/IEMTIM.1998.704531","DOIUrl":"https://doi.org/10.1109/IEMTIM.1998.704531","url":null,"abstract":"In the field of mobile communications systems, the terminals have been downsized and given higher functions very rapidly. High-density surface mount technology is therefore required. For this reason, flip chip bonding (FCB) technology, which is the ultimate high-density surface mount technology at present, has been developed in Toshiba's Hino Works. This technology has been developed by using gold ball bumps and anisotropic conductive film (ACF). Bondability and reliability after FCB and after reflow soldering had already been confirmed for experimental materials. As the next items in the development, bondability and reliability after reflow soldering as well as after FCB were confirmed on the products. Also, the bonding process for the products was established. Moreover, mass production technology using the FCB method has been developed with fully automatic bonding machines and applied to the LCD module for a pager, which is one of the mobile communications terminals.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133245030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of the thermal network method to the transient thermal analysis of multichip modules","authors":"M. Ishizuka, Y. Fukuoka","doi":"10.1109/IEMTIM.1998.704549","DOIUrl":"https://doi.org/10.1109/IEMTIM.1998.704549","url":null,"abstract":"In recent years, there has been a growing demand to have smaller and lighter electronic circuits which have greater complexity, multifunctionality and reliability. High-density multichip packaging technology has been used in order to meet these requirements. The higher the density scale, the larger the power dissipation per unit area becomes. In the design process, it has therefore become very important to carry out thermal analysis. However, the heat transport model in multichip modules is very complex and its treatment is tedious and time consuming. This paper describes an application of the thermal network method to the transient thermal analysis of multichip modules and proposes a simple model for the thermal analysis of multichip modules as a preliminary thermal design tool. Based on the results of transient thermal analysis, the validity of the thermal network method and the simple thermal analysis model are confirmed.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117140477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Performance of metal ball grid array (metal BGA) package","authors":"H. Tanaka, J. Tanaka, M. Morita, H. Waki","doi":"10.1109/IEMTIM.1998.704502","DOIUrl":"https://doi.org/10.1109/IEMTIM.1998.704502","url":null,"abstract":"For the transmission of high frequency signals, it is important to adopt the microstrip line structure in BGA packages. Metal BGA packages consist of a Cu/polyimide/Cu substrate system without an epoxy adhesive layer, such that its electrical characteristics are superior to other plastic package which include an epoxy resin insulator. It is easy to fabricate the 90 /spl mu/m pitch fine pattern circuit due to the polyimide surface flatness. The polyimide layer in the chip mounting area is removed by chemical etching and a cavity down structure is formed by the mechanical stamping process. The reliability of the metal BGA was investigated. Good results were obtained for pressure cooker testing over 288 hrs. The dielectric constant (/spl epsiv//sub r/) of polyimide is 3.2 and tan-/spl delta/ is 0.002 at a frequency of 11.3 GHz. These values are very good for the construction of microstrip line structures in BGAs. The pulse response of a 10 mm long 50 /spl Omega/ line in the metal BGA was measured, and a rise time of 0.35 nsec was observed. This result indicates the possibility of a maximum operating frequency of more than 500 MHz.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124689860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Feingold, P. Amstutz, R.L. Wahlers, C. Huang, S. Stein, J. Mazzochette
{"title":"New PTC and NTC thick film materials for gigahertz range temperature variable attenuators","authors":"A. Feingold, P. Amstutz, R.L. Wahlers, C. Huang, S. Stein, J. Mazzochette","doi":"10.1109/IEMTIM.1998.704540","DOIUrl":"https://doi.org/10.1109/IEMTIM.1998.704540","url":null,"abstract":"Negative temperature coefficient (NTC) and positive temperature coefficient (PTC) thick film thermistor pastes were developed. Using these materials, cost effective temperature variable attenuators (TVA) for use up to 18 GHz are described. These devices maintain the signal level in amplifiers, switches, delay lines, and other microwave and RF signal processing devices. By combining NTC and PTC thermistors in \"T\" and \"/spl Pi/\" configurations, the attenuation changes to compensate for temperature induced signal level changes. Judicious choice of resistance and TCR yields constant impedance over the operating range, thus avoiding unwanted signal reflections. While the temperature sensitivity of NTC and PTC chip thermistors is large, their use in TVAs requires a large and expensive inventory to provide the required resistance and TCR values. Thick film thermistor systems were developed to overcome these limitations. These include an NTC materials series with TCR values as high as -500,000 ppm//spl deg/C and resistance range coverage from 100 /spl Omega//sq. to 1M /spl Omega//sq. The complimentary PTC system features linear TCR values of 3000 ppm//spl deg/C and greater with resistance values of 5-5000 /spl Omega//sq. Process variables for these new thick film thermistor materials are discussed. Attenuation and frequency curves are presented. Impedance match, as characterized by VSWR versus frequency curves are presented. Current applications include Thermopad/sup R/ type TVAs with improved high frequency performance appropriate for mobile communications and similar uses.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132910208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}