2019 IEEE 28th Asian Test Symposium (ATS)最新文献_第2页

Self-Checking Residue Number System for Low-Power Reliable Neural Network 低功耗可靠神经网络的自检剩余数系统

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.000-3

Tsung-Chu Huang

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引用次数: 10

ATS 2019 Organizing Committee ATS 2019组委会

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ats47505.2019.00010

引用次数: 0

Sanity-Check: Boosting the Reliability of Safety-Critical Deep Neural Network Applications 安全性检查:提高安全关键深度神经网络应用的可靠性

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.000-8

Elbruz Ozen, A. Orailoglu

引用次数: 40

ATS 2019 Welcome Message ATS 2019欢迎辞

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ats47505.2019.00-15

C. Metra

引用次数: 0

Latency Aware Fault Tolerant Cache in Multicore Using Dynamic Remapping Clusters 基于动态重映射集群的多核延迟感知容错缓存

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.00014

A. Choudhury, Brototi Mondal, B. Sikdar

引用次数: 0

Ensuring Correctness of Next Generation Devices: From Reconfigurable to Self-Learning Systems 确保下一代设备的正确性:从可重构到自学习系统

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.00029

R. Drechsler, Daniel Große

引用次数: 3

Message from the ATS 2019 General Co-Chairs 2019年ATS总联合主席致辞

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ats47505.2019.00-21

引用次数: 0

Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training 神经网络在延迟故障测试中的应用:测试点插入和随机电路训练

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.000-7

S. Millican, Yang Sun, Soham Roy, V. Agrawal

引用次数: 14

Towards Verifiably Secure Systems-on-Chip Platforms 迈向可验证安全的片上系统平台

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.00017

Sujit Kumar Muduli, Pramod Subramanyan

引用次数: 0

Deep Learning Based Diagnostics for Rowhammer Protection of DRAM Chips 基于深度学习的DRAM芯片Rowhammer保护诊断

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.00016

Anirban Chakraborty, Manaar Alam, Debdeep Mukhopadhyay

引用次数: 11