2019 IEEE 28th Asian Test Symposium (ATS)

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2019 IEEE 28th Asian Test Symposium (ATS) - 最新文献

Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test

Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.000-5 Manobendra Nath Mondal, A. B. Chowdhury, Manjari Pradhan, S. Sur-Kolay, B. Bhattacharya

Machine-Learning-Based Multiple Abstraction-Level Detection of Hardware Trojan Inserted at Register-Transfer Level

Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.00018 Hau Sim Choo, C. Y. Ooi, M. Inoue, N. Ismail, M. Moghbel, Sreedharan Baskara Dass, Chee Hoo Kok, F. Hussin

Net Classification Based on Testability and Netlist Structural Features for Hardware Trojan Detection

Pub Date : 2019-12-01 DOI: 10.1109/ATS47505.2019.00020 Chee Hoo Kok, C. Y. Ooi, M. Inoue, M. Moghbel, Sreedharan Baskara Dass, Hau Sim Choo, N. Ismail, F. Hussin

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