{"title":"Noise Contribution to Switching Current Distributions in NbN Nanowires","authors":"Ashley Qu, Di Zhu, K. Berggren","doi":"10.1109/ISEC46533.2019.8990925","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990925","url":null,"abstract":"The working mechanism behind superconducting nanowire-based devices is the electrothermal transition from the superconducting to normal state, at which the point is known as the switching current. Due to the stochastic nature of nanowires from thermal fluctuations, quantum fluctuations, electrical noise, and black-body radiation, superconducting nanowire-based devices suffer from low repeatability in measurements. Here, we use a tapered and non-tapered NbN nanowire to identify and quantify the effects of ramp rate on the switching current distribution at 1 K. We also plan to expand the model presented by McCaughan et al that includes the noise of the measurement system.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114884208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Computational Analysis of Defect Signals of All-Round Pipe Inspection using HTS-SQUID-based Guided Wave Testing","authors":"Y. Azuma, Y. Hatsukade","doi":"10.1109/ISEC46533.2019.8990918","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990918","url":null,"abstract":"In this paper, we demonstrated all-round inspections on aluminum pipe samples with different types of defects using HTS-SQUID-based ultrasonic guided waves, and analyzed defect signals using computer simulation. In order to transceive uniformly distributed T (0, 1) mode guided waves on aluminum pipe samples, two pairs of nickel thin plates magnetized in the longitudinal direction using a solenoid coil were glued on each sample with different angle arrangement. They were used as magnetostriction-based guided wave transceivers, and a coil was wound around one pair of the nickel plates as a transmitter, while the other was used as a receiver. Artificial defects, such as a slit perpendicular to axis of the pipe and inclined slit, were made on the respective pipe samples. All-round inspection of the T (0, 1) mode guided waves around circumferences of the pipes were carried out by rotating the pipe for 360° with step of 45°. Signals of reflected wave from the artificial slits were well detected. We simulated distribution of the guided waves propagating on the pipes with the slits using an ultrasonic simulator for two-dimensional models. The guided wave signal distributions including the defect signals obtained by experiments and simulations agreed well.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126396083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Crété, Y. Lemaître, B. Marcilhac, J. Trastoy, C. Ulysse
{"title":"Effect of self-induced flux in parallel arrays of Josephson junctions","authors":"D. Crété, Y. Lemaître, B. Marcilhac, J. Trastoy, C. Ulysse","doi":"10.1109/ISEC46533.2019.8990895","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990895","url":null,"abstract":"We have studied the self-field effect on a parallel array of 21 Josephson junctions based on an ion-damaged barrier technology [1]. The device is made of 2 chips: a superconducting chip integrating the Josephson junction array, and another chip with single layer of normal metal (gold) patterned with a grid of parallel stripes. These chips are assembled in a piggy-back configuration, and wire bonded in such a way that the bias current flowing through the array can be drained in different positions with respect to the Josephson array. As expected, we observed that the antipeak of the voltage response to an applied magnetic field was shifted by the proximity of the drained current. In addition, we observed a change in the shape of the response which we attribute to a change of the supercurrent distribution in the array. This geometry will allow proper biasing of large parallel and 2D arrays of Josephson junctions.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132857944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reconfigurable Logic Cell for Superconducting Magnetic Field Programmable Gate Array","authors":"N. Katam, Haolin Cong, M. Pedram","doi":"10.1109/ISEC46533.2019.8990919","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990919","url":null,"abstract":"Field Programmable gate arrays (FPGAs) are one of the most successful circuits in the semiconductor industry. In the absence of a reliable three-terminal switch like MOSFET for rapid single flux quantum(RSFQ) technology, it was difficult to implement FPGA like reconfiguralbe circuits. However, a recently proposed superconducting magnetic FPGA (SMFPGA) implements a controllable switch by controlling the critical current of magnetic Josephson Junctions (MJJs) placed in energy-efficient RSFQ bias network. For implementing a configurable logic block (CLB) with a smaller area for the said FPGA, we designed a reconfigurable gate that can implement four basic logical functions: AND, OR, XOR and NOT. The programmability to implement the four functions is achieved by introducing MJJs in the circuit at specific locations and programming their critical current. The gate is made reconfigurable by having the ability to change both the bias current at different ports and the critical current of a JJ in the gate to two different values. This makes the size of CLB ten times smaller compared to the earlier design and simplifies the SMFPGA. We describe the design methodology and the simulation results of the reconfigurable gate.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121711721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Timing Verification for Rapid Single-Flux-Quantum (RSFQ) Logic: New Paradigm and Models","authors":"Fangzhou Wang, S. Gupta","doi":"10.1109/ISEC46533.2019.8990904","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990904","url":null,"abstract":"RSFQ is an attractive technology due to its low energy and high speed. However, it is imperative to certify speed for each design (via timing verification) and each fabricated chip (via delay testing). In this paper, we describe completely new phenomena in RSFQ circuits that arise due to their unique characteristics and require the development of new concepts, methods, and tools for timing verification and delay testing. We show that single-pattern timing verification and delay testing is possible in RSFQ technology. We also show that due to the gate-level pipelined nature of RSFQ circuits, imposing a guard-band to resolve the setup time issue will reduce the performance dramatically and lose some of the speed benefits of RSFQ. More importantly, inserting scan logic for every pipelined gate in RSFQ will cause astronomical area overheads. Therefore, the increased clock-to-Q delay (i.e., timing bleed) must be allowed, and delay faults in fabricated chip must be tested for multi-cycle paths. Further, the polarity of the logic gate is an important determinant for selecting target multi-cycle path. Also, we have observed a completely new delay failure behavior in RSFQ. If the clock period is insufficient compared to circuit delays, in addition to a missing pulse at output in one clock cycle, an additional pulse can be generated in the next cycle. This provides additional opportunities to detect timing problems for timing verification and delay testing. In addition to describing above major differences from CMOS and their implications, we outline a completely new paradigm for Automatic Test Pattern Generation (ATPG) for timing verification and delay testing of RSFQ circuits.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129140324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reducing the Maximum Length of Connections in Single Flux Quantum Circuits During Routing","authors":"Ting-Ru Lin, M. Pedram","doi":"10.1109/ISEC46533.2019.8990897","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990897","url":null,"abstract":"As the number of nets connecting single-flux-quantum (SFQ) cells in large-scale SFQ circuits grows, powerful electronic design automation (EDA) tools are needed to mitigate the wire routing task. Moreover, the clock frequency of SFQ circuits is heavily influenced by the longest wire delay. However, current routing tools have no means to control the maximum length of routing wires. In this paper, we present an innovative post-routing optimization framework which reduces the maximum wirelength in SFQ circuits. A framework is developed in which the longest wire is ripped and re-routed by resorting to a maze routing algorithm after the acquisition of wire density distribution using a machine learning method. Based on the MIT-LL SFQ5ee process technology and using a small library of SFQ logic cells, we show that the proposed framework can complete post-routing optimization of 13 SFQ circuits in 8 minutes while reducing the length of the longest wire by 11.8% on average over the state-of-the-art EDA routing tool for large-scale SFQ circuits.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127796772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"qBSA: Logic Design of a 32-bit Block-Skewed RSFQ Arithmetic Logic Unit","authors":"Souvik Kundu, G. Datta, P. Beerel, M. Pedram","doi":"10.1109/ISEC46533.2019.8990921","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990921","url":null,"abstract":"Single flux quantum (SFQ) circuits are an attractive beyond-CMOS technology because they promise two orders of magnitude lower power at clock frequencies exceeding 25 GHz. However, every SFQ gate is clocked creating very deep gate-level pipelines that are difficult to keep full, particularly for sequences that include data-dependent operations. This paper proposes to increase the throughput of SFQ pipelines by redesigning the datapath to accept and operate on least-significant bits (LSBs) clock cycles earlier than more significant bits. This skewed datapath approach reduces the latency of the LSB side which can be feedback earlier for use in subsequent data-dependent operations increasing their throughput. In particular, we propose to group the bits into 4-bit blocks that are operated on concurrently and create block-skewed datapath units for 32-bit operation. This skewed approach allows a subsequent data-dependent operation to start evaluating as soon as the first 4-bit block completes. Using this general approach, we develop a block-skewed MIPS-compatible 32-bit ALU. Our gate-level Verilog design improves the throughput of 32-bit data dependent operations by 2x and 1.5x compared to previously proposed 4-bit bit-slice and 32-bit Ladner-Fischer ALUs respectively. We have quantified the benefit of this design on instructions per cycle (IPC) for various RISC-V benchmarks assuming a range of non-ALU operation latencies from one to ten cycles. Averaging across benchmarks, our experimental results show that compared to the 32-bit Ladner-Fischer our proposed architecture provides a range of IPC improvements between 1.37x assuming one-cycle non-ALU latency to 1.2x assuming ten-cycle non-ALU latency. Moreover, our average IPC improvements compared to a 32-bit ALU based on the 4-bit bit-slice range from 2.93x to 4x.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125443412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Improved Transmission Line Parameter Calculation through TCAD Process Modeling for Superconductor Integrated Circuit Interconnects","authors":"H. F. Herbst, P. Le Roux, Kyle Jackman, C. Fourie","doi":"10.1109/ISEC46533.2019.8990927","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990927","url":null,"abstract":"The FLOOXS technology CAD (TCAD) process modeling tools developed at the University of Florida have been adapted under the IARPA SuperTools program to support the MIT Lincoln Laboratory SFQ5ee fabrication process. We use FLOOXS to build meshed models of passive transmission lines from superconductor integrated circuit layouts. We have previously developed a numerical solver that extracts transmission line parameters from the meshed model. In this work, we convert a layout slice to FLOOXS inputs, generate 2D meshes of cross-sectional geometries from simulated process steps, and then extract the transmission line parameters from the meshes. Results are shown compared against the results for simplified transmission lines that do not utilize process modeling. We conclude with a discussion on the application of TCAD process modeling for parameter extraction of structures in superconductor integrated circuits beyond the device level and make a recommendation on the necessity of process modeling for high-quality parameter extraction.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130455084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Estimation of Focused Helium Ion Beam Josephson Junction Width","authors":"Yan-Ting Wang, E. Cho, Hao Li, S. Cybart","doi":"10.1109/ISEC46533.2019.8990939","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990939","url":null,"abstract":"Josephson junctions fabricated with a focused helium ion beam exhibit electrical properties that are strongly dependent on the size of the junction. The length of the junction, in the direction of the super-current, is one of the critical parameters. In this report, we compare three methods of estimating this critical feature, utilizing resistive and capacitive transport data and Monte Carlo ion implantation simulations. Our results find that the barrier is 3 ± 1 nm long and agree well with one another.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"59 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128009823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Development of Programmable Integrated Quantum Voltage Noise Source","authors":"C. Urano, T. Irimatsugawa, Takahiro Yamada","doi":"10.1109/ISEC46533.2019.8990935","DOIUrl":"https://doi.org/10.1109/ISEC46533.2019.8990935","url":null,"abstract":"We have been developing a Johnson noise thermometer using an integrated quantum voltage noise source (IQVNS) as a reference signal source. IQVNS is a superconducting integrated circuit that generates pseudo random signals. The power spectral density of output signal of IQVNS can be described with quantum accuracy by fundamental physical constants $e$ and h, the clock frequency of the circuit, and a numerical coefficient. In the previous version of IQVNS the numerical coefficient was fixed by the circuit design. However, to cope with the measurement of thermodynamic temperature in a wide temperature range, it is desirable to make the output of IQVNS variable. In this study, we improved part of the design of the device to be able to change the power spectral density of the output signal and confirmed by measurement that the output signal can be variable as designed.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127531069","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}