{"title":"聚焦氦离子束约瑟夫森结宽度的估计","authors":"Yan-Ting Wang, E. Cho, Hao Li, S. Cybart","doi":"10.1109/ISEC46533.2019.8990939","DOIUrl":null,"url":null,"abstract":"Josephson junctions fabricated with a focused helium ion beam exhibit electrical properties that are strongly dependent on the size of the junction. The length of the junction, in the direction of the super-current, is one of the critical parameters. In this report, we compare three methods of estimating this critical feature, utilizing resistive and capacitive transport data and Monte Carlo ion implantation simulations. Our results find that the barrier is 3 ± 1 nm long and agree well with one another.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"59 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Estimation of Focused Helium Ion Beam Josephson Junction Width\",\"authors\":\"Yan-Ting Wang, E. Cho, Hao Li, S. Cybart\",\"doi\":\"10.1109/ISEC46533.2019.8990939\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Josephson junctions fabricated with a focused helium ion beam exhibit electrical properties that are strongly dependent on the size of the junction. The length of the junction, in the direction of the super-current, is one of the critical parameters. In this report, we compare three methods of estimating this critical feature, utilizing resistive and capacitive transport data and Monte Carlo ion implantation simulations. Our results find that the barrier is 3 ± 1 nm long and agree well with one another.\",\"PeriodicalId\":250606,\"journal\":{\"name\":\"2019 IEEE International Superconductive Electronics Conference (ISEC)\",\"volume\":\"59 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Superconductive Electronics Conference (ISEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEC46533.2019.8990939\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Superconductive Electronics Conference (ISEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEC46533.2019.8990939","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Estimation of Focused Helium Ion Beam Josephson Junction Width
Josephson junctions fabricated with a focused helium ion beam exhibit electrical properties that are strongly dependent on the size of the junction. The length of the junction, in the direction of the super-current, is one of the critical parameters. In this report, we compare three methods of estimating this critical feature, utilizing resistive and capacitive transport data and Monte Carlo ion implantation simulations. Our results find that the barrier is 3 ± 1 nm long and agree well with one another.
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