9th International Symposium on Quality Electronic Design (isqed 2008)最新文献

A Low Energy Two-Step Successive Approximation Algorithm for ADC Design 一种用于ADC设计的低能量两步逐次逼近算法

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2009-05-24 DOI: 10.1109/ISCAS.2009.5117674

R. Y. Choi, C. Tsui

引用次数: 14

Robust Analog Design for Automotive Applications by Design Centering with Safe Operating Areas 基于安全操作区域的汽车应用鲁棒模拟设计

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2009-05-05 DOI: 10.1109/ISQED.2008.33

U. Sobe, Karl-Heinz Rooch, A. Ripp, M. Pronath

引用次数: 26

Characterization of Standard Cells for Intra-Cell Mismatch Variations 细胞内错配变异标准细胞的表征

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2009-02-03 DOI: 10.1109/ISQED.2008.11

S. Sundareswaran, J. Abraham, A. Ardelea, R. Panda

{"title":"Characterization of Standard Cells for Intra-Cell Mismatch Variations","authors":"S. Sundareswaran, J. Abraham, A. Ardelea, R. Panda","doi":"10.1109/ISQED.2008.11","DOIUrl":"https://doi.org/10.1109/ISQED.2008.11","url":null,"abstract":"With the adoption of statistical timing across industry, there is a need to characterize all gates/cells in a digital library for delay variations (referred to as, statistical characterization). Statistical characterization need to be performed efficiently with acceptable accuracy as a function of several process and environment parameter variations. In this paper, we propose an approach to consider intra-cell process mismatch variations to characterize a cell's delay and output transition time (output slew) variations. A straightforward approach to address this problem is to model these mismatch variations by characterizing for each device fluctuation separately. However, the runtime complexity for such characterization becomes of the order of number of devices in the cell and the number of simulations required can easily become infeasible. We analyze the fluctuations in switching and non-switching devices and their impact on delay variations. Using these properties of the devices, we propose a clustering approach to characterize for cell's delay variations due to intra-cell mismatch variations. The proposed approach results in as much as 12X runtime improvements with acceptable accuracy, compared with Monte Carlo simulations. We show that this approach ensures an upper-bound on the results while keeping the number of simulations for each cell independent of the number of devices.","PeriodicalId":243121,"journal":{"name":"9th International Symposium on Quality Electronic Design (isqed 2008)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132691702","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 24

A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors 亚阈值电流镜中CMOS工艺波动的统计特性

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2008-03-17 DOI: 10.1109/ISQED.2008.44

Lei Zhang, Zhiping Yu, Xiangqing He

{"title":"A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors","authors":"Lei Zhang, Zhiping Yu, Xiangqing He","doi":"10.1109/ISQED.2008.44","DOIUrl":"https://doi.org/10.1109/ISQED.2008.44","url":null,"abstract":"A novel method to characterize CMOS process fluctuations in subthreshold current mirrors (SCM) is reported in this paper. The proposed model is succinct in methodology and calculation complexity comparing to the reported statistical models, however, provides favorable estimations of CMOS process fluctuations on the SCM circuit, which makes it being promising for engineering applications. The model statistically abstracts physical parameters, which depend on IC process, into random variables with certain mean values and standard deviations, while aggregating all the random impacts into a discrete martingale. The correctness of proposed method is experimentally verified by an SCM circuit implemented in SMIC 0.18 mum CMOS 1P6M mixed signal process with a conversion factor of 100 over an input range from 100 pA to 1 muA. The proposed theory successfully predicted the ~plusmn10% of die-to-die fluctuation measured in experiment, and also suggested the ~ 1 mV of threshold voltage standard deviation over a single die, which meets the process parameters suggested by the design kit from the foundry. The deviations between calculated probabilities and measured data are less than 8%. Meanwhile, pertinent suggestions to high fluctuation tolerance subthreshold analog circuits design are also made and discussed.","PeriodicalId":243121,"journal":{"name":"9th International Symposium on Quality Electronic Design (isqed 2008)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116949733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Output Remapping Technique for Soft-Error Rate Reduction in Critical Paths 降低关键路径软错误率的输出重映射技术

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2008-03-17 DOI: 10.1109/ISQED.2008.86

Q. Ding, Yu Wang, Hui Wang, Rong Luo, Huazhong Yang

引用次数: 9

Plenary Speech 2P1: Consumerization of Electronics and Nanometer Technologies: Implications for Manufacturing Test 全体会议演讲2P1:电子和纳米技术的消费化:对制造测试的影响

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2008-03-17 DOI: 10.1109/ISQED.2008.178

S. Taneja

{"title":"Plenary Speech 2P1: Consumerization of Electronics and Nanometer Technologies: Implications for Manufacturing Test","authors":"S. Taneja","doi":"10.1109/ISQED.2008.178","DOIUrl":"https://doi.org/10.1109/ISQED.2008.178","url":null,"abstract":"Summary form only given. Test has long been recognized as the bridge between design and manufacturing. However, innovation and deep integration in design and test tools has not kept pace with the consumerization of electronics and the rapidly evolving nanometer IC design and manufacturing. As a result, the full potential of Test has not been harnessed by the mainstream semiconductor community.The consumerization of electronics places significant new demands on low power, correctness and time-to-volume production.The rapid advances in nanometer technologies pose additional set of challenges due to the advanced physics effects and higher scales of transistor integration. The EDA industry needs to establish a new paradigm and a \"deep integration\" to meet these challenges. During the design phase, a power-aware DFT architecture must integrate tightly with low power design and implementation flow. Later, during the manufacturing phase, the benefits of DFT must be seamlessly harnessed for rapid scan diagnostics based yield learning using not only logic information from the design database but also using layout timing and power information. This keynote will discuss these challenges and possible solutions and scenarios.","PeriodicalId":243121,"journal":{"name":"9th International Symposium on Quality Electronic Design (isqed 2008)","volume":"33 1-2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116717565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Hotspot Based Yield Prediction with Consideration of Correlations 考虑相关性的基于热点的产量预测

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2008-03-17 DOI: 10.1109/ISQED.2008.30

Qing Su, C. Chiang, J. Kawa

引用次数: 1

Automated Standard Cell Library Analysis for Improved Defect Modeling 改进缺陷建模的自动化标准细胞库分析

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2008-03-17 DOI: 10.1109/ISQED.2008.169

J. G. Brown, Shawn Blanton

引用次数: 1

A Basis for Formal Robustness Checking 形式鲁棒性检验的基础

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2008-03-17 DOI: 10.1109/ISQED.2008.4479838

G. Fey, R. Drechsler

引用次数: 44

Plenary Speech 2P2: Statistical Techniques to Achieve Robustness and Quality 全体会议演讲2P2:实现稳健性和质量的统计技术

9th International Symposium on Quality Electronic Design (isqed 2008) Pub Date : 2008-03-17 DOI: 10.1109/ISQED.2008.179

C. Visweswariah

引用次数: 3