Roberto Blanco, P. Malagón, J. Cilla, Jose M. Moya
{"title":"Multiclass Network Attack Classifier Using CNN Tuned with Genetic Algorithms","authors":"Roberto Blanco, P. Malagón, J. Cilla, Jose M. Moya","doi":"10.1109/PATMOS.2018.8463997","DOIUrl":"https://doi.org/10.1109/PATMOS.2018.8463997","url":null,"abstract":"Intrusion Detection Systems (IDS) are implemented by service providers and network operators to monitor and detect attacks to protect their infrastructures and increase the service availability. Many machine learning algorithms, standalone or combined, have been proposed, including different types of Artificial Neural Networks (ANN). This work evaluates a Convolutional Neural Network (CNN), created for image classification, as a multiclass network attack classifier that can be deployed in a router. A Genetic Algorithm (GA) is used to find a high-quality solution by rearranging the layout of the input features, reducing the amount of different features if required. The tests have been done using two different public datasets with different ratio of attacks: UNSW (10 classes) and NSL-KDD (4 classes). Both classifiers distinguish correctly normal traffic from attack. However, in order to correctly classify the attack, the latter works better because it can be proportionate between the different classes, obtaining a cross-validated multi-class classifier with $K$ of 0.95.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127705518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"FPGA-Based Platform for Fast Accurate Evaluation of Ultra Low Power SoC","authors":"Guillaume Patrigeon, P. Benoit, L. Torres","doi":"10.1109/PATMOS.2018.8464173","DOIUrl":"https://doi.org/10.1109/PATMOS.2018.8464173","url":null,"abstract":"Accurate evaluation of Ultra Low Power Systems on Chip (ULP SoC) is a huge challenge for designers and developers. In embedded applications, especially for Internet of Things end-node devices, ULP SoCs have to interact with their environment and need self-management. For this kind of applications, modelling a complete SoC, including processor(s), memories, all the peripherals components, their interaction and low-power policies, can be very complex in terms of developments and benchmarking. In order to cope with this challenge, an approach is to implement the desired system on FPGA with a monitoring infrastructure dedicated to fast and accurate performance evaluation. In this paper, we propose a set of different tools used during the evaluation step that can also be easily implemented on the final product and used by the system itself for self-assessment to enable adaptive behaviour. Illustrated by a simple architecture implemented on an FPGA-based platform, this method brings flexible, cycle accurate, fast and reliable performance evaluation and self-evaluation, with the possibility to use the platform for low-cost prototyping.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130638475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Nikolaos Georgoulopoulos, Ioannis Giannou, Alkiviadis A. Hatzopoulos
{"title":"UVM-Based Verification of a Mixed-Signal Design Using SystemVerilog","authors":"Nikolaos Georgoulopoulos, Ioannis Giannou, Alkiviadis A. Hatzopoulos","doi":"10.1109/PATMOS.2018.8464148","DOIUrl":"https://doi.org/10.1109/PATMOS.2018.8464148","url":null,"abstract":"One of the most significant trends in the semiconductor industry is mixed-signal applications. A great amount of effort is focused on creating fast and accurate designs, which include both analog and digital components. As a result, mixed-signal verification poses a major concern. Previous traditional verification techniques offer slow verification time and relatively small robustness. In this work, an efficient UVM-based verification architecture for a flash ADC real number model using SystemVerilog is presented. The UVM capabilities of the proposed methodology combined with the RNM model of the flash ADC favors the generation of a reusable, time-to-market fast and robust verification environment. Cadence Incisive Enterprise Simulator was used for the testbench creation and simulation. The proposed verification architecture uses constrained-random stimulus generation, analog assertions and coverage metrics, in order to achieve high gains in verification efficiency.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"51 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114126337","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"VCO Verilog AMS Model for Fast Simulation in VCO-Based ADC","authors":"David Buffeteau, D. Morche, J. L. Jiménez","doi":"10.1109/PATMOS.2018.8463999","DOIUrl":"https://doi.org/10.1109/PATMOS.2018.8463999","url":null,"abstract":"This work presents an event-driven all-digital VCO model to be used into a VCO-based ADC for reduced computational time behavioral simulations. The proposed model is explained and compared with standard models in terms of both simulation speed and accuracy. It takes into account important analog behaviors such as non-linearity and phase noise. Results highlight the fact that the proposed model allows to reduce the simulation time up to 92% while used in a feedback system: a VCO-based ADC.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122446569","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Worst-Case Performance Analysis Under Random Telegraph Noise Induced Threshold Voltage Variability","authors":"A. Islam, H. Onodera","doi":"10.1109/PATMOS.2018.8464147","DOIUrl":"https://doi.org/10.1109/PATMOS.2018.8464147","url":null,"abstract":"RTN induced threshold voltage distribution has a long tail that can degrade the worst-case distribution severely. In this paper, we analyze the effect of RTN on worst-case performance based on variability models extracted from a 65 nm silicon-on-thin-body low threshold voltage process. Monte Carlo based simulation results reveal that with the lowering of supply voltage, RTN can degrade the worst-case delay by more than 10 % when the number of critical paths is 10. The worst-case delay degradation can go as high as 100 % if the critical path number increases to 100. Because of the RTN induced threshold voltage fluctuation, several outliers appear at near/sub-threshold operation. Considering RTN amplitude can increase at weak-inversion operation, low-voltage operation needs careful consideration of RTN.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127927746","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 40nm Critical Path Monitor for the Detection of Setup and Hold Time Violations","authors":"Hernán Aparicio, P. Ituero","doi":"10.1109/PATMOS.2018.8464155","DOIUrl":"https://doi.org/10.1109/PATMOS.2018.8464155","url":null,"abstract":"In the current context of strict low-power requirements, complex dynamic frequency and voltage scale systems try to constantly push the operating conditions of electronic chips to the lower bound that fulfills the performance requirements. Also, at test time of a synchronous electronic system, any occurrence of timing violations, especially hold time violations, must be identified, located and corrected. Critical path monitors serve these two purposes, they measure the delays where transients are produced in relation to the clock signal for the critical paths of the system. This work introduces a critical path monitor architecture that yields two configurable digital outputs: one for setup time violations, and another for hold time violations. The monitor directly senses the critical path, without the need to introduce synthesized replicas. The architecture has been validated in a 40nm commercial technology, it takes an area of 4028 $mu mathrm{m}^{2}$ and it is very robust against PVT variations.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116297783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Lembit Jurimagi, R. Ubar, M. Jenihhin, J. Raik, S. Devadze, S. Kostin
{"title":"Hierarchical Timing-Critical Paths Analysis in Sequential Circuits","authors":"Lembit Jurimagi, R. Ubar, M. Jenihhin, J. Raik, S. Devadze, S. Kostin","doi":"10.1109/PATMOS.2018.8464176","DOIUrl":"https://doi.org/10.1109/PATMOS.2018.8464176","url":null,"abstract":"The conventional design techniques struggle with integration density and constantly strengthening requirements of today's nanometer technology. Timing-critical paths analysis is one of such tasks. It has applications in critical path identification, path delay fault simulation, circuit reliability analysis e.g. Bias Temperature Instability (BTI) induced aging, and in several others. In this paper, we propose a scalable simulation based hierarchical technique for explicit identification of true timing-critical paths in sequential circuits. We explore the circuits at two levels - at the flat gate-level and at a higher level as a network of modules or sub-circuits. The result of timing analysis carried out at the gate-level is used for calculating the delays on the topological critical paths through the network of higher level modules. To speed-up the module level timing analysis, the theory of Structurally Synthesized BDDs (SSBDD) is used. Experimental results demonstrate considerable speed-up of the SSBDD based timing analysis, compared to the flat gate-level analysis.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"113 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122416902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Guillem Martinez de Arriba, E. Coskuner, J. García-García
{"title":"Enhanced RF Harvesting System by the Utilization of Resonant Cavities","authors":"Guillem Martinez de Arriba, E. Coskuner, J. García-García","doi":"10.1109/PATMOS.2018.8464175","DOIUrl":"https://doi.org/10.1109/PATMOS.2018.8464175","url":null,"abstract":"This paper proposes a novel approach to the problem of harvesting the energy of the RF spectrum. Unlike the unusual impedance matching network, the combination of a Fabry-Perot cavity with commercial Wi-Fi antennas is proposed to enhance the energy captation in frequency range between hundreds of MHz and few GHz energy of a wide band. To show the viability of the method, an illustrative prototype has been implemented and tested. The experimental measurements shows the viability of the approach. Work is in progress to combine the enhanced RF transductor with standard energy management in order to test the efficiency of a full harvesting system with load capacity up to 5.2 V.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129512792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Jürimägi, R. Ubar, M. Jenihhin, J. Raik, S. Devadze, S. Kostin, Roberto Sierra, Carlos Carreras, G. Caffarena, Dominique Morche, Amal Ben Ameur, Michel Auguin, François Verdier, Valerio Frascolla, Ertugrul Coskuner, V. A. Bartlett, Izzet Kale, Wolffhardt Schwabe, T. Lieske, M. Reichenbach, Dietmar Fey, PA Hager, H. Fatemi, J. P. D. Gyvez, Asghar Bahramali
{"title":"Technical Papers","authors":"L. Jürimägi, R. Ubar, M. Jenihhin, J. Raik, S. Devadze, S. Kostin, Roberto Sierra, Carlos Carreras, G. Caffarena, Dominique Morche, Amal Ben Ameur, Michel Auguin, François Verdier, Valerio Frascolla, Ertugrul Coskuner, V. A. Bartlett, Izzet Kale, Wolffhardt Schwabe, T. Lieske, M. Reichenbach, Dietmar Fey, PA Hager, H. Fatemi, J. P. D. Gyvez, Asghar Bahramali","doi":"10.1109/ivsw.2018.8494871","DOIUrl":"https://doi.org/10.1109/ivsw.2018.8494871","url":null,"abstract":"Timing Analysis Methods and Characterization","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121844606","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Goudos, N. Karagiorgos, M. Ntogramatzi, I. Messaris, S. Nikolaidis
{"title":"Evaluation of an Artificial Neural Network Approach for Timing Modeling of CMOS Gates","authors":"S. Goudos, N. Karagiorgos, M. Ntogramatzi, I. Messaris, S. Nikolaidis","doi":"10.1109/PATMOS.2018.8464162","DOIUrl":"https://doi.org/10.1109/PATMOS.2018.8464162","url":null,"abstract":"The development of reliable and fast timing models for CMOS logic gates is a significant task for the IC technology. Analytical approaches have been proposed to accelerate timing analysis while keeping the accuracy in acceptable levels. However, the complexity of the analytical modeling procedure increases as we are moving towards new technology nodes influencing mostly the provided accuracy. The artificial neural network (ANN) approach could be a solution to this complexity. In this paper, the use of ANNs for timing modeling of CMOS gates is evaluated. Several different ANNs schemes are developed, optimized and studied regarding their accuracy, resource requirements and speed. Moreover, we design a new training method by combing the Particle Swarm Optimization (PSO) a meta-heuristic algorithm in conjunction with the Levenberg-Marquardt (LM) backpropagation algorithm. The outcomes show that the new training method obtains better results that the LM algorithm. The efficiency of adopting a common neural network structure, letting the coefficients to distinguish between the different logic gates is investigated.","PeriodicalId":234100,"journal":{"name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"87 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129865876","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}