G. Lakshminarayana, A. Raghunathan, N. Jha, S. Dey
{"title":"Transforming control-flow intensive designs to facilitate power management","authors":"G. Lakshminarayana, A. Raghunathan, N. Jha, S. Dey","doi":"10.1145/288548.289107","DOIUrl":"https://doi.org/10.1145/288548.289107","url":null,"abstract":"We present techniques to transform scheduled descriptions of control-flow intensive (CFI) designs to facilitate power management. We investigate the factors that inhibit the application of power management in synthesized register-transfer level (RTL) implementations. Based on these insights, we present transformation techniques based on the concepts of variable protection, variable renaming and re-assignment, and limited controller state memory insertion that result in inherently power-managed architectures. Our transformation techniques can be easily used in conjunction with any existing resource sharing algorithm or in the framework of existing high-level synthesis tools. Experimental results on CFI designs indicate reductions of up to 76.6% (35.6% on average) in power consumption at area overheads not exceeding 10.1% (1.1% on average) over already power-optimized designs.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116668768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"h-gamma: an RC delay metric based on a gamma distribution approximation of the homogeneous response","authors":"Tao Lin, Emrah Acar, L. Pileggi","doi":"10.1145/288548.288555","DOIUrl":"https://doi.org/10.1145/288548.288555","url":null,"abstract":"Recently a probability interpretation of moments was proposed as a compromise between the Elmore delay and higher order moment matching for RC timing estimation (Kay and Pileggi, 1998). By modeling RC impulses as time-shifted incomplete gamma distribution function, the delays could be obtained via table lookup using a gamma integral table and the first three moments of the impulse response. However, while this approximation works well for many examples, it struggles with responses when the metal resistance becomes dominant, and produces results with impractical time shift values In this paper the probability interpretation is extended to the circuit homogeneous response, without requiring the time shift parameter. The gamma distribution is used to characterize the normalized homogeneous portion of the step response. For a generalized RC interconnect model (RC tree or mesh), the stability of the homogeneous-gamma distribution model is guaranteed. It is demonstrated that when a table model is carefully constructed, the h-gamma approximation provides for excellent improvement over the Elmore delay in terms of accuracy, with very little additional cost in terms of CPU time.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"1063 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116292815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Kazuhiro Nakamura, K. Takagi, S. Kimura, Katsumasa Watanabe
{"title":"Waiting false path analysis of sequential logic circuits for performance optimization","authors":"Kazuhiro Nakamura, K. Takagi, S. Kimura, Katsumasa Watanabe","doi":"10.1145/288548.289059","DOIUrl":"https://doi.org/10.1145/288548.289059","url":null,"abstract":"The paper introduces a new class of false path, which is sensitizable but does not affect the decision of the clock period. We call such false paths waiting false paths, which correspond to multi cycle operations controlled by wait states. The allowable delay time of waiting false paths is greater than the clock period. When the number of allowable clock cycles for each path is determined, the delay of the path can be the product of the clock period and the allowable cycles. The paper presents a method to analyze allowable cycles and to detect waiting false paths based on symbolic traversal of FSM. We have applied our method to 30 ISCAS89 FSM benchmarks and found that 22 circuits include such paths. 11 circuits among them include such paths which are critical paths, where the delay is measured as the number of gates on the path. Information on such paths can be used in the logic synthesis to reduce the number of gates and in the layout synthesis to reduce the size of gates.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126940201","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reencoding for cycle-time minimization under fixed encoding length","authors":"B. Iyer, M. Ciesielski","doi":"10.1145/288548.288631","DOIUrl":"https://doi.org/10.1145/288548.288631","url":null,"abstract":"The paper presents efficient reencoding and resynthesis algorithms for cycle time minimization of multilevel implementations of synchronous finite state machines (FSMs) under a fixed encoding length. The proposed technique is applicable to both gate level and technology independent synchronous network representations. We present two algorithms for identifying useful reencodings-one is based on Boolean cube representation applicable to technology independent synchronous networks and the other employs recursive learning techniques appropriate for gate netlists. We show that the proposed XOR/XNOR based reencoding technique explores a sufficiently rich set of encodings to identify implementations with smaller cycle times. The Boolean and structural interpretations of reencoding are explored and its relationship to isomorphic sequentially redundant faults is presented. We also show that the reencoded circuit always has a valid initial state and present a simple procedure to derive it. The effectiveness of the proposed technique is illustrated on a large set of benchmark circuits which indicates an average cycle time improvement of 15.26% for a small area overhead of 3.56% over that of performance driven combinational logic optimization.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126008998","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reduced-order modelling of linear time-varying systems","authors":"J. Roychowdhury","doi":"10.1145/288548.288581","DOIUrl":"https://doi.org/10.1145/288548.288581","url":null,"abstract":"We present a theory for reduced order modelling of linear time varying systems, together with efficient numerical methods for application to large systems. The technique, called TVP (Time-Varying Pade), is applicable to deterministic as well as noise analysis of many types of communication subsystems, such as mixers and switched capacitor filters, for which existing model reduction techniques cannot be used. TVP is therefore suitable for hierarchical verification of entire communication systems. We present practical applications in which TVP generates macromodels which are more than two orders of magnitude smaller but still replicate the input-output behaviour of the original systems accurately. The size reduction results in a speedup of more than 500.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121536992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"CONCERT: a concurrent transient fault simulator for nonlinear analog circuits","authors":"J. Hou, A. Chatterjee","doi":"10.1145/288548.289058","DOIUrl":"https://doi.org/10.1145/288548.289058","url":null,"abstract":"The paper presents a novel concurrent fault simulator (called CONCERT) for nonlinear analog circuits. Three primary techniques in CONCERT including fault ordering, state prediction, and reduced order fault matrix computation, greatly simplify fault simulation by making use of the residual similarities between the faulty and fault free circuits. Between successive time steps, all circuits in the fault list are simulated concurrently before the simulator proceeds to the next time step. CONCERT also generates accurate fault coverage statistics that are tied to the circuit specifications. Up to two orders of magnitudes speedup are obtained for complete fault simulation, without any loss of accuracy. More speedup is achieved by CONCERT for evaluating the fault coverage of a test, using fault ordering and fault dropping technique.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121474325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Improving the computational performance of ILP-based problems","authors":"M. Narasimhan, J. Ramanujam","doi":"10.1145/288548.289091","DOIUrl":"https://doi.org/10.1145/288548.289091","url":null,"abstract":"Many interesting problems in VLSI design are computationally extremely difficult, and as such, there exist no efficient (read polynomial time) algorithms for these problems. Such problems include placement, routing, scheduling and partitioning. A commonly used technique for solving these problems is to model them as an integer linear programming (ILP) problem, and to then solve the resulting model using a generic ILP solver. So far, improving the computational efficiency of these problems was considered equivalent to improving the model. We show that large performance improvements can be achieved by incorporating problem specific information into the ILP solver itself. While the techniques that we present are general in nature, for the sake of concreteness, we illustrate them by applying them to scheduling problems in high level synthesis. It is shown that there is a lot of problem specific information that can be incorporated into the model solver, and that doing so actually improves the performance considerably. We present experimental results to show that the problem specific ILP solver is considerably faster, often showing improvements by a factor of 1000 in execution time.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130309875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Robust latch mapping for combinational equivalence checking","authors":"J. Burch, V. Singhal","doi":"10.1145/288548.289087","DOIUrl":"https://doi.org/10.1145/288548.289087","url":null,"abstract":"Existing literature on combinational equivalence checking concentrates on comparing combinational blocks and assumes that a latch mapping (register mapping) has already been constructed. We describe an algorithm for automatically constructing a latch mapping. It is based on the functionality of the circuits being compared rather than on heuristics. As a result, if two circuits are combinationally equivalent, then our algorithm is guaranteed to find a latch mapping. Our empirical results show that the method is practical on large circuits.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134151517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Shaping a VLSI wire to minimize delay using transmission line model","authors":"Youxin Gao, D. F. Wong","doi":"10.1145/288548.289096","DOIUrl":"https://doi.org/10.1145/288548.289096","url":null,"abstract":"We consider continuous wire sizing optimization for non uniform wires. Our objective is to find the shape function of a wire which minimizes delay. This problem has been studied recently under the Elmore delay model (W.C. Elmore, 1948). However, it is well known that Elmore delay is only a rough estimate of the actual delay and thus more accurate models should be used to determine the wire shape function. Our study uses the transmission line model which gives a very accurate estimation of the actual delay. Since previous studies under Elmore delay model suggest that exponential wire shape is effective for delay minimization, we restrict the wire shape function to be of the form f(x)=ae/sup -bx/. By solving the diffusion equation, we derive the transient response in the time domain as a function of a and b for both step and ramp input. The coefficients a and b are then determined so that the actual delay (50% delay) is minimized. Our algorithm is very efficient; in all the experiments we performed, the wire shape functions can be determined in less than 1 second.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130079258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"High-order Nystrom schemes for efficient 3-D capacitance extraction","authors":"S. Kapur, D. Long","doi":"10.1145/288548.288604","DOIUrl":"https://doi.org/10.1145/288548.288604","url":null,"abstract":"Integral equation based approaches are popular for extracting the capacitance of integrated circuit structures. Typically, first order collocation or Galerkin methods are used. The resulting dense system of equations is efficiently solved by combining matrix sparsification with an iterative solver. While the speed-up over direct factorization is substantial, the first order methods still lead to large systems even for simple problems. We introduce a high order Nystrom scheme. For the same level of discretization, the high order schemes can be an order of magnitude more accurate than the first order approaches at the same computational cost. As a consequence, we obtain the same level of accuracy with a much smaller matrix.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134484487","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}