2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)最新文献_第2页

Comparison of TDC parameters in 65 nm and 0.13 μm CMOS 65 nm和0.13 μm CMOS中TDC参数的比较

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270544

Marijan Jurgo, R. Navickas

{"title":"Comparison of TDC parameters in 65 nm and 0.13 μm CMOS","authors":"Marijan Jurgo, R. Navickas","doi":"10.1109/AIEEE.2017.8270544","DOIUrl":"https://doi.org/10.1109/AIEEE.2017.8270544","url":null,"abstract":"In this paper parameters of time to digital converter (TDC), which is often used as phase detector in all-digital frequency synthesizers, designed in 65 nm and 0.13 μm CMOS integrated circuit technologies, were analyzed. The structure of the designed TDC is a variety of 2D Vernier time to digital converter, based on gated ring oscillators. Performance of these oscillators has biggest impact on resolution of TDC. Therefore, oscillators were simulated using analog approach using Cadence integrated circuit design software. Simulations were carried out in nominal (1.2 V, 40 °C, typical transistor models), worst (1.1 V, 40 °C, slow transistor models) and best (1.3 V, −40 °C, fast transistor models) operation conditions. In the nominal operation conditions, the frequency of gated ring oscillator can be tuned from 0.68 GHz to 3.38 GHz and from 0.33 GHz to 0.71 GHz respectively in 65 nm and 0.13 μm technology. The delay of single stage can be changed from 491 ps to 98 ps and from 1.013 ns to 0.466 ns respectively in 65 nm and 0.13 μm CMOS. At least 3 and 5 sections of oscillator need to be enabled respectively in 65 nm and 0.13 μm CMOS for oscillator to start. Tuning step of oscillator's stage delay, which corresponds to resolution of TDC, in nominal operating conditions can be changed from 3.4 ps to 0.8 ps and from 5.8 ps to 1.1 ps respectively in 65 nm and 0.13 μm CMOS, when number of enabled oscillator's sections is changed from 20 to 48. Total area of silicon occupied by TDC is 123 μm × 148.8 μm in 65 nm CMOS technology and 244.2 μm × 295.8 μm in 0.13 μm CMOS technology.","PeriodicalId":224275,"journal":{"name":"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129214438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Logo detection in images using HOG and SIFT 基于HOG和SIFT的图像Logo检测

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270535

J. Glagolevs, Kārlis Freivalds

引用次数: 5

10-bit High-speed CMOS comparator with offset cancellation technique 带有偏移抵消技术的10位高速CMOS比较器

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270524

Lida Kouhalvandi, Sercan Aygün, Gökhan Güneş Özdemir, Ece Olcay Günes

引用次数: 1

Investigation of the influence of attack and decay parameters on the performance of loudness control algorithm 研究攻击参数和衰减参数对响度控制算法性能的影响

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270556

Saulius Sakavičius, A. Serackis, D. Plonis

{"title":"Investigation of the influence of attack and decay parameters on the performance of loudness control algorithm","authors":"Saulius Sakavičius, A. Serackis, D. Plonis","doi":"10.1109/AIEEE.2017.8270556","DOIUrl":"https://doi.org/10.1109/AIEEE.2017.8270556","url":null,"abstract":"In acoustics, loudness is the subjective perception of sound pressure. Loudness control systems involving loudness control algorithms are used in radio and television broadcasting. In this paper we present a research on the influence of attack and decay parameters on the performance of loudness control algorithms. Attack and decay are temporal parameters of the algorithm, that define the rate at which the algorithm applies the correction to the audio material. For this investigation, a relatively simple real time loudness control algorithm was devised, having only the two parameters: the attack and the decay rate of the algorithm's reaction. The input signal for the algorithm is the weighted sum of the loudness measurements of the source material the in three temporal scales, as per EBU R-128 recommendation. Experiments were conducted with various summing weights of the input signal. The test sound material was acquired from actual commercial TV broadcast. The performance of the algorithm were evaluated by measuring differences of three parameters of the corrected material before and after the correction as a function of the attack and decay values: the loudness range, overflow percentage, and average integrated loudness level.","PeriodicalId":224275,"journal":{"name":"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115863116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Comparison of LC-VCO and LC-DCO parameters in 65 nm CMOS technology 65纳米CMOS工艺中LC-VCO和LC-DCO参数的比较

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270549

V. Macaitis, R. Navickas

引用次数: 2

Models and algorithms of operational planning and control of dynamical objects with application of the Pontryagin's Maximum principle 基于庞特里亚金极大值原理的动态目标作战规划与控制模型与算法

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270541

B. Sokolov, A. Gnidenko, A. Shalyto

引用次数: 1

Concept of cost-effective power-assisted wheelchair: Human-in-the-loop subsystem 经济高效的动力辅助轮椅概念:人在环子系统

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270559

M. Vorobyov, I. Galkin

引用次数: 8

Edge computing in IoT: Preliminary results on modeling and performance analysis 物联网中的边缘计算:建模和性能分析的初步结果

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270555

Julius Skirelis, D. Navakauskas

引用次数: 1

Machine learning techniques application for lung diseases diagnosis 机器学习技术在肺部疾病诊断中的应用

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270528

A. Poreva, Y. Karplyuk, V. Vaityshyn

引用次数: 20

Embedded software performance estimations at different compiler optimisation levels 不同编译器优化水平下的嵌入式软件性能评估

2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) Pub Date : 2017-11-01 DOI: 10.1109/AIEEE.2017.8270530

P. Ruberg, Keijo Lass, Elvar Liiv, P. Ellervee

引用次数: 2