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Proceedings EURO-DAC '92: European Design Automation Conference最新文献

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Calculation of the Rademacher-Walsh spectrum from a reduced representation of Boolean functions 从布尔函数的简化表示计算Rademacher-Walsh谱
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246245
B. Falkowski, Ingo Schäfer, M. Perkowski
{"title":"Calculation of the Rademacher-Walsh spectrum from a reduced representation of Boolean functions","authors":"B. Falkowski, Ingo Schäfer, M. Perkowski","doi":"10.1109/EURDAC.1992.246245","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246245","url":null,"abstract":"A theory has been developed to calculate the Rademacher-Walsh transform from a reduced representation (disjoint cubes) of incompletely specified Boolean functions. The transform algorithm makes use of the properties of an array of disjoint cubes and allows the determination of the spectral coefficients in an independent way. The program for the algorithms uses advantages of C language to speed up the execution. The comparison of different versions of the algorithm has been carried out. The algorithm successfully overcomes all drawbacks in the calculation of the transform from the design automation system based on spectral methods.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121556707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
A time optimal robust path-delay-fault self-testable adder 一种时间最优鲁棒路径延迟故障自检测加法器
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246216
B. Becker, R. Drechsler
{"title":"A time optimal robust path-delay-fault self-testable adder","authors":"B. Becker, R. Drechsler","doi":"10.1109/EURDAC.1992.246216","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246216","url":null,"abstract":"A log(n)-time robust path-delay-fault (PDF) testable adder is presented. The adder is a modified version of a conditional carry adder (CCA). An optimal test set of size Theta (n/sup 2/*log(n)) is constructed. The realization of a selftest for the adder is discussed; an algorithm of complexity O(n/sup 3/) for the generation of a complete test set is used. A short hardware analysis of the CCA and its robust PDF-modification are presented.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122115413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Delay macromodels for the timing analysis of GaAs DCFL 用于GaAs DCFL时序分析的延迟宏模型
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246251
A. Kayssi, K. Sakallah
{"title":"Delay macromodels for the timing analysis of GaAs DCFL","authors":"A. Kayssi, K. Sakallah","doi":"10.1109/EURDAC.1992.246251","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246251","url":null,"abstract":"A timing macromodel for gallium arsenide direct-coupled FET logic (GaAs DCFL) cells is derived. It calculates the delay of a cell as a function of such parameters as transistor sizes, capacitive loading, fanout, and input switching time. Calculations based on the derived macromodel show excellent agreement with circuit simulation at two to three orders of magnitude savings in computation time.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122883277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Routing algorithms for multi-chip modules 多芯片模块的路由算法
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246230
J. Lienig, K. Thulasiraman, M. Swamy
{"title":"Routing algorithms for multi-chip modules","authors":"J. Lienig, K. Thulasiraman, M. Swamy","doi":"10.1109/EURDAC.1992.246230","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246230","url":null,"abstract":"Routing algorithms for multi-chip modules are presented. Two routing strategies, a channel routing and a grid-based routing, are discussed. The channel routing enables the designer to examine an effective routing during the placement phase. The grid-based routing calculates the net ordering with a new cost function and includes an effective rip-up and reroute procedure. The routing results of three different multichip modules are presented. Experimental results show that there is no direct correlation between the routing results of the channel algorithm and the grid-based one. It is concluded that channel routing is preferable only if the placement structure enables the generation of regular channels. In all other cases the grid-based algorithm is more effective using the channel routing just as a fast placement estimation.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125579059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Subtype concept of VHDL for synthesis constraints 用于综合约束的VHDL子类型概念
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246184
W. Ecker, Sabine März
{"title":"Subtype concept of VHDL for synthesis constraints","authors":"W. Ecker, Sabine März","doi":"10.1109/EURDAC.1992.246184","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246184","url":null,"abstract":"The authors propose to exploit the VHSIC hardware description language (VHDL) subtype concept for formulating ranges for design constraints which could be used as inputs for synthesis tools. The proposed method relies on interpreting the range of a VHDL constant's type as a range specification for a design constraint. Presynthesis simulation is done with an estimated value inside the specified range. Postsynthesis simulation in order to check functionality as well as consistency with design constraints is performed by using the actual values resulting from synthesis.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"29 7","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120845007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Verification of digital circuits based on formal semantics of a hardware description language 基于硬件描述语言形式语义的数字电路验证
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246258
M. Mutz
{"title":"Verification of digital circuits based on formal semantics of a hardware description language","authors":"M. Mutz","doi":"10.1109/EURDAC.1992.246258","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246258","url":null,"abstract":"The author presents basic concepts of defining semantics of the hardware description language VIOLA based on higher-order logic (HOL). The verification procedures of the hardware verification system VERENA are based on transformations of VIOLA terms. The correctness of these transformation steps can be formally verified based on the HOL semantics of the related VIOLA terms. As a mechanical tool, the HOL prove assistant is used. Basic concepts of a special verification system for the formal verification of digital circuits are presented. HOL serves as the formalism to define the underlying theory.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115559038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Temporal verification of behavioral descriptions in VHDL VHDL中行为描述的时间验证
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246188
Djamel Boussebha, N. Giambiasi, J. Magnier
{"title":"Temporal verification of behavioral descriptions in VHDL","authors":"Djamel Boussebha, N. Giambiasi, J. Magnier","doi":"10.1109/EURDAC.1992.246188","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246188","url":null,"abstract":"An approach for verifying the temporal scheduling of behavioral models of VHSIC hardware description language (VHDL) is presented. The aim is to verify that the control flow of a behavioral description satisfies its behavioral specifications described in a formalism based on reified temporal logics, and on a notion of physical activity. From this formalism, a verification procedure is established which starts by extracting the temporal subbehaviors from given VHDL descriptions and then gives them to the temporal demonstrator to prove whether they respect the behavioral specifications.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131420737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
State machine abstraction from circuit layouts using BDDs: applications in verification and synthesis 使用bdd从电路布局中提取状态机:在验证和综合中的应用
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246259
T. Kam, P. Subrahmanyam
{"title":"State machine abstraction from circuit layouts using BDDs: applications in verification and synthesis","authors":"T. Kam, P. Subrahmanyam","doi":"10.1109/EURDAC.1992.246259","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246259","url":null,"abstract":"The authors discuss a formal technique for abstracting a finite state machine (FSM) from a transistor netlist, given information relating to clock signals and clo.cking methodology. The abstracted FSM is represented as a transition relation using binary decision diagrams (BDDs) and then converted into a synchronous sequential network. Both the relational and network representations are common starting points for various sequential synthesis and verification tools.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130054900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Design of delay insensitive circuits using multi-ring structures 多环结构延迟不敏感电路的设计
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246271
J. Sparsø, J. Staunstrup, Michael Dantzer-Sørensen
{"title":"Design of delay insensitive circuits using multi-ring structures","authors":"J. Sparsø, J. Staunstrup, Michael Dantzer-Sørensen","doi":"10.1109/EURDAC.1992.246271","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246271","url":null,"abstract":"The design and VLSI implementation of a delay insensitive circuit that computes the inner product of two vec.tors is described. The circuit is based on an iterative serial-parallel multiplication algorithm. The design is based on a data flow approach using pipelines and rings that are combined into larger multi ring structures by the joining and forking of signals. The implementation is based on a small set of building blocks (latches, combinational circuits and switches) that are composed of C-elements and simple gates. By following this approach, delay insensitive circuits with nontrivial functionality and reasonable performance are readily designed.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131008115","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 88
Tackling cost optimization in testable design by forward inferencing 用前向推理解决测试设计中的成本优化问题
Proceedings EURO-DAC '92: European Design Automation Conference Pub Date : 1992-11-01 DOI: 10.1109/EURDAC.1992.246235
M. Kraak, R. Otten
{"title":"Tackling cost optimization in testable design by forward inferencing","authors":"M. Kraak, R. Otten","doi":"10.1109/EURDAC.1992.246235","DOIUrl":"https://doi.org/10.1109/EURDAC.1992.246235","url":null,"abstract":"The authors describe how the forward chaining mechanism of an expert system's inference engine is employed to achieve automated cost optimization in designing testable circuits. The characteristics of forward chaining are used to explore the set of applicable testability strategies. This exploration is preceded by a testability analysis, using a set of testability rules with the emphasis on maximization of fault coverage. The analysis locates the places in the design that are not optimally accessible, taking into account the characteristics of the concerning parts, such as function and design style. A testability synthesis is accomplished by the forward chaining inference engine. A conflict set is compiled, containing rules which relate to testability strategies that will relax the violations of the analysis rules. The forward chaining mechanism in combination with the structural testability analysis directly drives the testability strategy that makes the best use of the available circuit resources.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114559621","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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