{"title":"一种时间最优鲁棒路径延迟故障自检测加法器","authors":"B. Becker, R. Drechsler","doi":"10.1109/EURDAC.1992.246216","DOIUrl":null,"url":null,"abstract":"A log(n)-time robust path-delay-fault (PDF) testable adder is presented. The adder is a modified version of a conditional carry adder (CCA). An optimal test set of size Theta (n/sup 2/*log(n)) is constructed. The realization of a selftest for the adder is discussed; an algorithm of complexity O(n/sup 3/) for the generation of a complete test set is used. A short hardware analysis of the CCA and its robust PDF-modification are presented.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A time optimal robust path-delay-fault self-testable adder\",\"authors\":\"B. Becker, R. Drechsler\",\"doi\":\"10.1109/EURDAC.1992.246216\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A log(n)-time robust path-delay-fault (PDF) testable adder is presented. The adder is a modified version of a conditional carry adder (CCA). An optimal test set of size Theta (n/sup 2/*log(n)) is constructed. The realization of a selftest for the adder is discussed; an algorithm of complexity O(n/sup 3/) for the generation of a complete test set is used. A short hardware analysis of the CCA and its robust PDF-modification are presented.<<ETX>>\",\"PeriodicalId\":218056,\"journal\":{\"name\":\"Proceedings EURO-DAC '92: European Design Automation Conference\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings EURO-DAC '92: European Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EURDAC.1992.246216\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings EURO-DAC '92: European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1992.246216","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A time optimal robust path-delay-fault self-testable adder
A log(n)-time robust path-delay-fault (PDF) testable adder is presented. The adder is a modified version of a conditional carry adder (CCA). An optimal test set of size Theta (n/sup 2/*log(n)) is constructed. The realization of a selftest for the adder is discussed; an algorithm of complexity O(n/sup 3/) for the generation of a complete test set is used. A short hardware analysis of the CCA and its robust PDF-modification are presented.<>