18th International Symposium on VLSI Design and Test最新文献

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A 45 uW 13 pJ/conv-step 7.4-ENOB 40 kS/s SAR ADC for digital microfluidic biochip applications 45 uW 13 pJ/反步7.4-ENOB 40 kS/s SAR ADC,用于数字微流控生物芯片应用
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881068
Indrajit Das, Manodipan Sahoo, P. Roy, H. Rahaman
{"title":"A 45 uW 13 pJ/conv-step 7.4-ENOB 40 kS/s SAR ADC for digital microfluidic biochip applications","authors":"Indrajit Das, Manodipan Sahoo, P. Roy, H. Rahaman","doi":"10.1109/ISVDAT.2014.6881068","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881068","url":null,"abstract":"In recent years Digital Micro-fluidic Bio-chips have become a suitable choice for point of care diagnostics. These devices can detect various properties of human blood by means of an optical detection technique. The data acquisition is generally done using a LED-photodiode setup working in conjunction with the biochip. The voltage signal obtained at the photodiode output needs to be converted into digital data for further processing. A low power 8 bit SAR ADC is designed for this purpose and implemented in UMC 180 nm technology. The functionality testing of the ADC is done using Spectre simulator of Cadence Analog Design Environment. The ADC consumes about 45 μWof power at 13 pJ/conv-step from a 1.8 V supply at 40 kS/s and achieves a SNDR of 46.5 dB, ENOB of 7.4 bits at a signal bandwidth of 10kHz. Mismatch analysis has been done by a set of Monte Carlo Simulations in Cadence. Even in worst case condition with 5% capacitance mismatch, the ADC achieves a SNDR of 43 dB, ENOB of 7 bits without any missing code.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"200 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133811107","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Distributed adaptive routing for spidergon NoC 蜘蛛蛛NoC的分布式自适应路由
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881058
Rimpy Bishnoi, P. K. Srivastava, V. Laxmi, M. Gaur, Apoorva Sikka
{"title":"Distributed adaptive routing for spidergon NoC","authors":"Rimpy Bishnoi, P. K. Srivastava, V. Laxmi, M. Gaur, Apoorva Sikka","doi":"10.1109/ISVDAT.2014.6881058","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881058","url":null,"abstract":"Spidergon is a popular NoC (Network-On-Chip) developed to realize cost effective multi-processor SoC (MPSoC) using a fixed optimized topology [1]. Increasing diversity of applications, quality of service requirements and deterministic routing schemes inhibit the performance by creating congestion bottlenecks. This paper presents an adaptive routing algorithm that exploits the path diversity of spidergon NoC and selects the optimal path on the basis of congestion level (CL). CL depicts current traffic conditions. Proposed scheme is compared with native deterministic routing schemes of spidergon NoC i.e. aFirst and aLast. Experimental results demonstrate that our algorithm distributes traffic evenly while reducing hot-spots resulting in a considerable performance improvement.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114977655","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Deterministic seed selection and pattern reduction in Logic BIST 逻辑BIST的确定性种子选择与模式约简
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881039
R. Bhakthavatchalu, Sreeja Krishnan, V. Vineeth, M. Nirmala Devi
{"title":"Deterministic seed selection and pattern reduction in Logic BIST","authors":"R. Bhakthavatchalu, Sreeja Krishnan, V. Vineeth, M. Nirmala Devi","doi":"10.1109/ISVDAT.2014.6881039","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881039","url":null,"abstract":"A new ad-hoc technique to select the proper seed and the number of the random test patterns to be generated is presented. This technique uses an offline algorithm to search and classify the random patterns based on the deterministic test patterns generated by the automatic test pattern generator (ATPG). The seed activated linear feedback shift register (LFSR) generates exhaustive test patterns which are applied on any design under test (DUT). The responses are received at the output of the scan chains in the DUT and they are compressed to produce a signature. It is shown that this scheme produces the same fault coverage with lesser number of random test patterns than an arbitrary seed. Also, this technique helps to estimate the number of BIST test patterns to be generated to achieve specific fault coverage. Results on six ISCAS-89 designs with the help of Cadence Encounter true time 13.1 ATPG is shown.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123038361","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
An approach for efficient FIR filter design for hearing aid application 一种用于助听器的高效FIR滤波器设计方法
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881051
Srinivasa Reddy Kotha, Devendra Bilaye, Utkarsh Jain, S. K. Sahoo
{"title":"An approach for efficient FIR filter design for hearing aid application","authors":"Srinivasa Reddy Kotha, Devendra Bilaye, Utkarsh Jain, S. K. Sahoo","doi":"10.1109/ISVDAT.2014.6881051","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881051","url":null,"abstract":"In this paper, a constant coefficient finite impulse response (FIR) filter design has been proposed for hearing aid application. The major change in the proposed architecture is the use of 4:2 compressors instead of using adders. The 17 order filter for hearing aid has been realized at gate level using Verilog HDL. The architectures have been implemented in UMC 90nm technology by the use of Cadence RTL compiler. Synthesis results of the proposed architecture show an improvement of 39.4% and 11.34% in speed and area respectively as compared to the recently published architecture. The proposed architecture provides significant gain of 46.3% in area-delay product (ADP) and 23.7% in power-delay product (PDP). Finally, the functionality of the architecture has been verified by Altera DSP Builder tool.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134110237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Artificial neural network modelling of ADS designed Double Pole Double Throw switch ADS双极双投开关的人工神经网络建模
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881066
S. Majumdar, Mohd. Zuhair, D. Biswas
{"title":"Artificial neural network modelling of ADS designed Double Pole Double Throw switch","authors":"S. Majumdar, Mohd. Zuhair, D. Biswas","doi":"10.1109/ISVDAT.2014.6881066","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881066","url":null,"abstract":"An alternative approach for designing a DPDT switch and characterizing it with the help of ANN modelling is presented in this work. ANN is one of the options which can be implemented to model the output parameters obtained from the designed switch. As, it does not require any detailed physical models, only a few training points are required to accurately model the standards. In this work, the DPDT switch circuit has been designed using ADS through UMS 0.15 μm pHEMT process design kit. Neural network training has been done using Levenberg-Marqaurdt back propagation algorithm employed in the ANN toolbox of MATLAB software. The outcome of simulated results in an ADS designed switch indicates an isolation of -31 to -17 dB, an insertion loss of -1.15 to -0.8 dB, a noise figure of 0.4 to 0.38 and port return loss of -8.44 to -14.36 dB for a frequency level of 1 to 5 GHz. All the results obtained from ADS simulation have been validated using ANN modelling, and it shows a close agreement with a mean squared error of about 10-8.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129259370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An FPGA implementation of image signature based visual-saliency detection 基于图像签名的视觉显著性检测的FPGA实现
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881060
Bhavit Kaushik, Ravi Saini, Anil K. Saini, Sanjay Singh, A. S. Mandal
{"title":"An FPGA implementation of image signature based visual-saliency detection","authors":"Bhavit Kaushik, Ravi Saini, Anil K. Saini, Sanjay Singh, A. S. Mandal","doi":"10.1109/ISVDAT.2014.6881060","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881060","url":null,"abstract":"In this paper we present a prototype FPGA design for Saliency detection based on image signature technique to support embedded vision application. Visual attention supports biological vision to restrict our gaze only to the region of interest of a visual scene. We propose a pipelined architecture using Gaussian filter, Discrete Cosine Transform, Inverse Discrete Cosine Transform and Averaging block that is shared across the system. The investigation involves simulation and synthesis of VHDL code using ModelSimTM and Xilinx Synthesis Toolbox as design environments. Due to real-time requirements and computational-cost constraints in embedded systems, it is necessary to accelerate Saliency detection algorithm by hardware implementation. Experiment shows that the proposed hardware has the maximum clock speed of 160 MHz with Xilinx ML510 (Virtex-5 FX130T) FPGA platform.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121145965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Study of reverse substrate bias effect of 22nm node epitaxial delta doped channel MOS transistor for low power SoC applications 低功耗SoC中22nm节点外延δ掺杂沟道MOS晶体管的反向衬底偏置效应研究
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881050
Debayan Bairagi, Soumya Pandit
{"title":"Study of reverse substrate bias effect of 22nm node epitaxial delta doped channel MOS transistor for low power SoC applications","authors":"Debayan Bairagi, Soumya Pandit","doi":"10.1109/ISVDAT.2014.6881050","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881050","url":null,"abstract":"This paper presents a comprehensive study of the reverse substrate bias effects of an n-channel epitaxial delta doped channel (EδDC) MOS transistor. The transistor consists of a two layered channel structure, a low doped epitaxial layer followed by a high doped screening layer. The study has been performed using Silvaco TCAD device simulator, calibrated with experimental results. Significant amount of substrate bias effect has been achieved in EδDC transistor in comparison to conventional uniform doped channel transistor (UDC), even for gate length as small as 22nm. The screening phenomenon of the depletion region leads to better control of the channel by substrate and is the key to enhanced substrate bias effect in EδDC transistor. The variations of leakage power dissipation and intrinsic delay with substrate bias have been compared for EδDC and UDC transistor. Significant amount of leakage power saving is achieved in EδDC transistor in comparison to UDC transistor, at the cost of reduced intrinsic speed. The dependence of the substrate sensitivity of the EδDC transistor on the epitxial region thickness and concentration of the high doped screening region has been investigated.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129305709","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Modeling and simulation of variable thickness based stepped MEMS cantilever designs for biosensing and pull-in voltage optimization 基于变厚度阶跃式MEMS悬臂设计的生物传感与拉入电压优化建模与仿真
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881055
D. K. Parsediya, Jawar Singh, P. K. Kankar
{"title":"Modeling and simulation of variable thickness based stepped MEMS cantilever designs for biosensing and pull-in voltage optimization","authors":"D. K. Parsediya, Jawar Singh, P. K. Kankar","doi":"10.1109/ISVDAT.2014.6881055","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881055","url":null,"abstract":"Highly sensitive microcantilevers have most commonly and widely been adopted for Bio-MEMS and RF-MEMS applications. The μl and pl blood serums contain few triglyceride (TG) and glucose molecules. Hence, the conventional rectangular microcantilever sensors are not good enough to detect these small TG and glucose concentrations. In mM or μM level TG and glucose detection, the proposed variable sectional thickness based stepped beams showed nearly 3 to 5x more tip deflection then the conventional beam, while surface area, length and width of each beams were kept constant. In RF switching application by electrostatic actuation, the proposed stepped beam switches require less bias voltage for perfect switching and inferred less pull-in voltage requirement as the conventional switch. The mathematical models of proposed variable sectional thickness microcantilevers have also developed, which showed good agreement with simulation results.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129385314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
UVM based STBUS verification IP for verifying SoC architectures 基于UVM的STBUS验证IP,用于验证SoC架构
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881037
P. Samanta, Deepak Chauhan, Sujay Deb, P. Gupta
{"title":"UVM based STBUS verification IP for verifying SoC architectures","authors":"P. Samanta, Deepak Chauhan, Sujay Deb, P. Gupta","doi":"10.1109/ISVDAT.2014.6881037","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881037","url":null,"abstract":"In this paper, we propose the design and development of verification IP (VIP) of STBUS, a widely used bus protocol from STMicroelectronics [1]. VIP is a standalone, pre-verified and built-in verification infrastructure, which can be easily plugged in the simulation-based tests. We have followed Universal Verification Methodology (UVM) for the modelling of the STBUS VIP. Firstly we have verified the important properties of the STBUS protocol and made the VIP. Then we have shown how to use the VIP in a SoC to verify IPs.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126782477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
An ultra low power MICS/ISM band transmitter in 0.18 μm CMOS 超低功耗MICS/ISM波段发射器,0.18 μm CMOS
18th International Symposium on VLSI Design and Test Pub Date : 2014-07-16 DOI: 10.1109/ISVDAT.2014.6881077
Amitava Ghosh, A. Dhar, Achintya Halder
{"title":"An ultra low power MICS/ISM band transmitter in 0.18 μm CMOS","authors":"Amitava Ghosh, A. Dhar, Achintya Halder","doi":"10.1109/ISVDAT.2014.6881077","DOIUrl":"https://doi.org/10.1109/ISVDAT.2014.6881077","url":null,"abstract":"In this paper the design of an ultra low power transmitter in MICS/ISM band has been presented. The transmitter uses Frequency Shift Keying (FSK) as the modulation scheme. At the heart of the transmitter is an oscillator whose frequency is periodically calibrated. A ring type oscillator has been considered instead of LC type as it reduces the buffer power consumption immediately following the oscillator. Within the ring-based topology a one-stage ring oscillator (basically an astable multivibrator) with fine frequency resolution has been considered for even lower power consumption. The periodically activated frequency calibration system is based on measuring the fraction when the oscillator frequency is divided by a reference frequency and thereby correcting the oscillator frequency. The power amplifier (PA) used is Class-E type. A switch is present to disconnect the frequency calibration unit and turn on the PA after the channel frequencies have been calibrated. The transmitter can work from a data rate of 250kbps to 1Mbps consuming only the minimum bandwidth required for FSK transmission and allowing for simultaneous transmission in the band. It draws an average current of 180 μA from a 1.6V supply achieving the lowest current consumption for a transmitter designed at the specified band and allowing for multichannel operation.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128155189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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