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2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)最新文献

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Switched-gain feedback amplifiers 开关增益反馈放大器
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282060
S. Mandal
{"title":"Switched-gain feedback amplifiers","authors":"S. Mandal","doi":"10.1109/MWSCAS.2015.7282060","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282060","url":null,"abstract":"We describe a simple switched-gain control technique for improving the settling time and peak overshoot of closed-loop amplifiers under power constraints. We consider the important particular case of two-pole amplifiers and show that the proposed compensation method out-performs standard linear compensation based on pole-splitting. Our results are supported by circuit simulations in a 0.18μm CMOS process.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123572516","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Feedback gain phase alignment effects on convergence characteristics in Lucy-Richardson deconvolution for inversely predicting complex-shaped RTN distributions 反馈增益相位对准对反向预测复杂形状RTN分布Lucy-Richardson反卷积收敛特性的影响
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282140
H. Yamauchi, Worawit Somha
{"title":"Feedback gain phase alignment effects on convergence characteristics in Lucy-Richardson deconvolution for inversely predicting complex-shaped RTN distributions","authors":"H. Yamauchi, Worawit Somha","doi":"10.1109/MWSCAS.2015.7282140","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282140","url":null,"abstract":"A technique to prevent deconvolution object from ringing errors in Lucy-Richardson-deconvolution (LRDec) iteration cycles is proposed, which is required for inversely analyzing complex-shaped Random Telegraph Noise (RTN) effects on SRAM margin variations. The proposed feedback gain phase alignment successfully circumvents the unwanted errors and makes it possible to avoid the need to give up on a benefit (smaller iteration cycles) from LRDec. The ringing elimination in a real LRDec analysis for the complex-shaped RTN distribution comprising three different sloped segments has been demonstrated for the first time, while exploiting a quicker convergence benefit of LRDec algorithm. The proposed technique reduces its relative errors of the complex-shaped RTN deconvolution by about 10 times, compared with the conventional LRDec.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115081656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A design flow to quantify and limit multiple patterning effects 量化和限制多种图案效果的设计流程
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282106
M. Harb, M. Dessouky
{"title":"A design flow to quantify and limit multiple patterning effects","authors":"M. Harb, M. Dessouky","doi":"10.1109/MWSCAS.2015.7282106","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282106","url":null,"abstract":"Despite the slight progress in Next Generation Lithography (NGL), including Extreme Ultra Violet (EUV) lithography, Multiple Patterning Technology (MPT) is still the solution used in sub-20nm technology nodes. The impact of using such technology is not well understood by circuit designers who face difficulties to predict the impact of MPT on their circuit's figures of merit. One of the impacts is the change in the coupling capacitance, since one physical layer should be patterned using 2 or more masks in MPT. The overlay error between the masks will change the intra-layer spaces between patterns, resulting in coupling capacitance deviation from designer's expectation. The uncertainty in the capacitance value at one node produces uncertainty at the node's waveform. This is crucial in circuits that are dependent on capacitance as a foundation of their working theory, like ring oscillators. In this paper, we are going to study how MPT can affect the output frequency of a ring oscillator. Moreover, we are going to provide a flow to capture that impact, which can be applied on other circuits. A feedback mechanism is implemented to provide the designer with sensitivity information of electrical node pairs. This mechanism can help designer to decide the appropriate layout modifications that can make his design less prone to MPT effects.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"1117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116476508","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A driver circuit based on the emerging GaN-on-CMOS process for the emerging Electroluminescent panels 基于GaN-on-CMOS工艺的新型电致发光面板驱动电路
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282215
T. Ge, L. Guo, Y. Kang, J. Zhou, H. He, P. Ng, E. Fitzgerald, K. Lee, J. Chang
{"title":"A driver circuit based on the emerging GaN-on-CMOS process for the emerging Electroluminescent panels","authors":"T. Ge, L. Guo, Y. Kang, J. Zhou, H. He, P. Ng, E. Fitzgerald, K. Lee, J. Chang","doi":"10.1109/MWSCAS.2015.7282215","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282215","url":null,"abstract":"The ElectroLuminescent (EL) panel is an emerging backplane lighting technology for advertising displays and facade (building) decoration. Compared to conventional lighting technologies, the major advantages of the emerging EL panel include large panel format (e.g. >100m2), significantly more-even illumination uniformity, (mechanical) flexibility, thinner form-factor, etc. As EL lighting is emerging, its driver circuit design is commensurably nascent, particularly for large EL panels, e.g., the driver circuit for very large EL panels (>100m2) remains unreported. In this paper, we describe the peculiarities of the EL panel and our design of a driver, based on the traditional LDMOS process and on the emerging GaN-on-CMOS process, capable of driving a large 100m2 EL panel. We show that the emerging GaN-on-CMOS process is advantageous over the traditional LDMOS, particularly the 37% reduced power dissipation and hence the ensuing substantially reduced heat sink form factor.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128219042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Materials and microfabrication processes for ARROW-based optofluidic biosensors 基于arrow的光流体生物传感器的材料和微加工工艺
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282086
T. Wall, J. Parks, H. Schmidt, A. Hawkins
{"title":"Materials and microfabrication processes for ARROW-based optofluidic biosensors","authors":"T. Wall, J. Parks, H. Schmidt, A. Hawkins","doi":"10.1109/MWSCAS.2015.7282086","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282086","url":null,"abstract":"This paper outlines the microfabrication processes and materials used to make an optofluidic lab-on-a-chip biosensor that detects individual biological particles. The biosensor uses a hollow-core ARROW waveguide with a low refractive index liquid core and is fabricated on a silicon wafer using a combination of PECVD deposition, RIE etching, and standard photolithographic processes. As a sensing example, detection of fluorescence signals emitted by labeled oligonucleotides inside the liquid core was used to illustrate the chip's potential to identify protein-coding regions of the Zaire Ebola virus genome.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132457349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A quadband concurrent linear/efficient power amplifier for multiband wireless applications 一种用于多波段无线应用的四频带并发线性/高效功率放大器
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282142
Bassem M. Abdelrahman, H. Ahmed
{"title":"A quadband concurrent linear/efficient power amplifier for multiband wireless applications","authors":"Bassem M. Abdelrahman, H. Ahmed","doi":"10.1109/MWSCAS.2015.7282142","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282142","url":null,"abstract":"In this paper, a design for a quadband linear/efficient class-AB power amplifier, with an output power exceeding 10-watts in all four bands is presented. The designed power amplifier - based on a GaN HEMT- provides a power added efficiency over 47% in all four bands. Source/load-pull simulations are used for optimum matching at each band; quadband stub-based matching is used for input matching whilst LC broadband matching, based on equiripple approximation, is used for output matching. Drain biasing is implemented using an efficient high impedance quarter wave open stubs (QWOS) precisely located at appropriate positions along transmission line, which furthermore provide low insertion loss at the operating frequency bands. Fractional bandwidths of 88, 15, 13.3 & 16.4% are reported in the operation bands of 900, 1600, 1900 & 2450 MHz, respectively.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134421483","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
CMOS impedance spectroscopy sensor array with synchronous voltage-to-frequency converters 带有同步电压-频率转换器的CMOS阻抗光谱传感器阵列
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282178
A. Ali, Neelanjana Pal, P. Levine
{"title":"CMOS impedance spectroscopy sensor array with synchronous voltage-to-frequency converters","authors":"A. Ali, Neelanjana Pal, P. Levine","doi":"10.1109/MWSCAS.2015.7282178","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282178","url":null,"abstract":"We present a four-channel 48-electrode CMOS sensor array for use in impedance-based cellular assays. Each channel contains a 2 × 6 surface working electrode array and a synchronous voltage-to-frequency converter (SVFC) which implements frequency response analysis to perform electrochemical impedance spectroscopy. The SVFC is composed of a simple circuit architecture which measures the charge transferred over half an input period to extract the real and imaginary components of the input ac current. An input offset correction circuit in each channel mitigates the effect of device mismatch in the SVFC integrator. We report experimental results from electronic characterization of a 1.8×1.5mm2 sensor array chip fabricated in a standard mixed-signal 1.8-V 0.18-μm CMOS process.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"16 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133824460","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Capacitive immunosensor for C-reactive protein quantification 用于c反应蛋白定量的电容免疫传感器
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282094
Christos Sapsanis, S. Sivashankar, H. Omran, U. Buttner, K. Salama
{"title":"Capacitive immunosensor for C-reactive protein quantification","authors":"Christos Sapsanis, S. Sivashankar, H. Omran, U. Buttner, K. Salama","doi":"10.1109/MWSCAS.2015.7282094","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282094","url":null,"abstract":"We report an agglutination-based immunosensor for the quantification of C-reactive protein (CRP). The developed immunoassay sensor requires approximately 15 minutes of assay time per sample and provides a sensitivity of 0.5 mg/L. We have measured the capacitance of interdigitated electrodes (IDEs) and quantified the concentration of added analyte. The proposed method is a label free detection method and hence provides rapid measurement preferable in diagnostics. We have so far been able to quantify the concentration to as low as 0.5 mg/L and as high as 10 mg/L. By quantifying CRP in serum, we can assess whether patients are prone to cardiac diseases and monitor the risk associated with such diseases. The sensor is a simple low cost structure and it can be a promising device for rapid and sensitive detection of disease markers at the point-of-care stage.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114694312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Design of IIR digital fractional-order differ-integrators using closed-form discretization 用封闭离散法设计IIR数字分数阶差分积分器
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282152
R. El-Khazali
{"title":"Design of IIR digital fractional-order differ-integrators using closed-form discretization","authors":"R. El-Khazali","doi":"10.1109/MWSCAS.2015.7282152","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282152","url":null,"abstract":"This paper introduces a new design method of fractional-order IIR digital differentiators (FODD) and integrators (FODI) using a closed-form discretization technique. Unlike the direct or the indirect discretization methods that uses CFE to generate a digital differential or integral operators, which sometimes yield an unstable non-minimum phase digital filter, the proposed approach always yields a minimum phase stable rational z-transfer functions for both FODDs and FODIs. The significance of the proposed method lies in the simplicity of the design, which only depends on the fractional-order differentiator or the integrator. The main points of this work are illustrated via numerical examples.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133582736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A novel normalization technique for multimodal biometric systems 一种新的多模态生物识别归一化技术
2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) Pub Date : 2015-10-01 DOI: 10.1109/MWSCAS.2015.7282214
Waziha Kabir, M. Ahmad, M. Swamy
{"title":"A novel normalization technique for multimodal biometric systems","authors":"Waziha Kabir, M. Ahmad, M. Swamy","doi":"10.1109/MWSCAS.2015.7282214","DOIUrl":"https://doi.org/10.1109/MWSCAS.2015.7282214","url":null,"abstract":"A multimodal biometric system consolidates multiple biometric sources and mitigates the limitations of the unimodal biometric system. The consolidation of information can be done at various levels of fusion. In this paper, a normalization technique for score-level fusion based on a new anchor, which is computed from the raw score set, has been proposed. This new anchor is independent of the statistatical properies of the biometric system (e.g., equal error rate). This work focuses on the improvement of the multimodal biometric system that consists of at least one weak classifier and does not have a prior knowledge of the genuine/impostor score distribution. The experimental results show that the performance of simple non-weighted fusion preceded by our EER independent anchor based normalization technique is better than that of the weak classifier of the system and is superior to that of two other normalization methods.","PeriodicalId":216613,"journal":{"name":"2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"171 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134116359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
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