{"title":"Development of soft x-ray absorption spectroscopy technique with simultaneous measurement in electron- and fluorescence-yield modes from high vacuum to ambient pressure for observation of surface adsorbed species.","authors":"Kohei Shibuya, Kenta Amemiya","doi":"10.1063/5.0225539","DOIUrl":"https://doi.org/10.1063/5.0225539","url":null,"abstract":"<p><p>To understand the reactions of heterogeneous catalysts at the solid-gas interface under actual reaction conditions, it is important to develop a method to observe the surface-adsorbed species during the reaction, including the changes before and after the adsorption of light elements involved in the surface reaction. We developed a soft x-ray absorption spectroscopy (XAS) technique that allows simultaneous measurements in the electron- and fluorescence-yield modes in the pressure range of 10-4-1 × 105 Pa. In the developed system, the reaction gas near the sample surface is separated from the beamline vacuum by a Si3N4 window and confined to a small area to suppress x-ray absorption by the gas. The electron-yield spectra were obtained by measuring the sample current while applying a bias potential to the Si3N4 window. XAS measurements were performed from high vacuum to ambient pressure by setting the bias potential to 600 and 39 V below and above 100 Pa, respectively. An anatase TiO2 nanoparticle-deposited film was prepared by spin coating, and soft XAS was performed to observe the photocatalytic oxidative decomposition reactions of isopropanol in the presence of water and oxygen. The obtained O K-edge spectra showed that it is possible to observe adsorbed oxygen on solid oxides even under ambient pressure conditions containing 0.1% of oxygen gas.</p>","PeriodicalId":21111,"journal":{"name":"Review of Scientific Instruments","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142626931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S Hörmann, M Cavedon, M Griener, D Wendler, R Dux, K Schmid, A Kappatou, M Wischmeier, D J Cruz-Zabala, E Viezzer, U Stroth
{"title":"Thermal helium beam diagnostic for 2D profile measurements in the divertor of ASDEX Upgrade.","authors":"S Hörmann, M Cavedon, M Griener, D Wendler, R Dux, K Schmid, A Kappatou, M Wischmeier, D J Cruz-Zabala, E Viezzer, U Stroth","doi":"10.1063/5.0237317","DOIUrl":"https://doi.org/10.1063/5.0237317","url":null,"abstract":"<p><p>A new thermal helium beam diagnostic has been implemented in the outer lower divertor of the ASDEX Upgrade tokamak. The purpose of this diagnostic is to measure two-dimensional profiles of electron density (ne) and temperature (Te) with high temporal and spatial resolution. The geometry of the lines of sight is chosen to avoid the influence of prompt recycling and to optimize the resolution without significantly impacting the divertor structure. Moreover, the effect of long-term helium recycling has been analyzed, and its amplitude compared to the active signal is negligible. Finally, the reconstruction of ne and Te is done via a collisional radiative model, while a static and a dynamic model were implemented and compared with SOLPS simulations as well as divertor Thomson scattering data. Furthermore, a new 2D parameterization of the outer divertor volume, which is required for the dynamic model, was developed. Due to its fast and local ne and Te profile measurements, the diagnostic is suitable for investigating fast processes such as divertor transitions and filaments.</p>","PeriodicalId":21111,"journal":{"name":"Review of Scientific Instruments","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142626969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Alexandra J Howzen, Justin Caspar, Alparslan Oztekin, Nicholas C Strandwitz
{"title":"Design of an atomic layer deposition system with in situ reflection high energy electron diffraction.","authors":"Alexandra J Howzen, Justin Caspar, Alparslan Oztekin, Nicholas C Strandwitz","doi":"10.1063/5.0206286","DOIUrl":"https://doi.org/10.1063/5.0206286","url":null,"abstract":"<p><p>We report the design, fabrication, and testing of an atomic layer deposition (ALD) system that is capable of reflection high energy electron diffraction (RHEED) in a single chamber. The details and specifications of the system are described and include capabilities of RHEED at varied accelerating voltages, sample rotation (azimuthal) control, sample height control, sample heating up to set temperatures of 1050 °C, and either single- or dual-differential pumping designs. Thermal and flow simulations were used to justify selected system dimensions as well as carrier gas/precursor mass flow rates. Temperature calibration was conducted to determine actual sample temperatures that are necessary for meaningful analysis of thermally induced transitions in ALD thin films. Several demonstrations of RHEED in the system are described. Calibration of the camera length was conducted using a gold thin film by analyzing RHEED images. Finally, RHEED conducted at a series of increasing temperatures was used to monitor the crystallization of an ALD HfO2 thin film. The crystallization temperature and the ring pattern were consistent with the monoclinic structure as determined by separate x-ray diffraction-based measurements.</p>","PeriodicalId":21111,"journal":{"name":"Review of Scientific Instruments","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142626795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The infrared thermography system on the MAST-U tokamak.","authors":"J M Stobbs, A Tookey, A J Thornton, T Farley","doi":"10.1063/5.0219544","DOIUrl":"https://doi.org/10.1063/5.0219544","url":null,"abstract":"<p><p>Power loading from plasma in the scrape-off layer limits the lifetime of plasma-facing components in tokamak-based power plants. The Mega Ampere Spherical Tokamak Upgrade [W. Morris et al., IEEE Trans. Plasma Sci. 46(5), 1217-1226 (2018)] (MAST-U) features four divertor strike points (SP) owing to its up-down symmetry. This paper introduces the five-camera infrared thermography system, covering all four SPs and their mode of operation on MAST-U. The system employs both medium and long wavelength cameras, offering high frame rates up to 4 kHz and spatial resolutions of down to 3 mm. Postprocessing involves artifact elimination and heat flux calculation using in-house analysis software that incorporates the inverse heat transfer code, THEODOR (THermal Energy Onto DivertOR).</p>","PeriodicalId":21111,"journal":{"name":"Review of Scientific Instruments","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142649037","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}