{"title":"Subsystem's influence on a system eigenvalue","authors":"Y. Ye, K. Youcef-Toumi","doi":"10.1109/SECON.2000.845573","DOIUrl":"https://doi.org/10.1109/SECON.2000.845573","url":null,"abstract":"Identifying subsystems and/or components that determine a given eigenvalue of the overall system is an interesting and important topic in industry and academia. This paper proposes a set of theorems leading to an efficient procedure for such purpose. Given the eigenvectors of an LTI system, this procedure returns components/subsystems irrelevant to the corresponding eigenvalue. The bond graph representation of dynamic systems is utilized in the procedure, leading to higher efficiency.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"294 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116113527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Two-dimensional analytical model for drain induced barrier lowering (DIBL) in short channel MOSFETs","authors":"A. Mutlu, M. Rahman","doi":"10.1109/SECON.2000.845589","DOIUrl":"https://doi.org/10.1109/SECON.2000.845589","url":null,"abstract":"An analytical model to elucidate various effects of drain induced barrier lowering in a short channel MOSFET's performance is presented. In particular, the amount of drain bias induced depletion charge under the gate is assessed and an expression for the distribution of this charge along the channel length is developed. Then, based on a simplified two-dimensional solution of Poisson's equation along the channel, the potential barrier lowering between source and channel, and consequently threshold voltage shift is estimated. The results are compared with numerical simulation data for deep submicron NMOS devices. Finally, the dependence of threshold voltage on drain bias for LDD and non-LDD MOSFETs with effective channel lengths down to deep submicron range has been investigated. Due to its simplicity, the developed model is suitable for circuit simulators.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125656512","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multimedia streaming on a personal computer for virtual music video television station","authors":"H. Browne, S. Suthaharan","doi":"10.1109/SECON.2000.845605","DOIUrl":"https://doi.org/10.1109/SECON.2000.845605","url":null,"abstract":"Over the last few years, streaming video and audio content over the Internet has become increasingly popular. Communication industries and individuals have successfully created various types of streaming media including live and pre-recorded television and radio programs, stereo-quality music, and various types of video and audio files. The purpose of this paper is to create a cost-effective virtual music video television station in which music and music video files can be sent from an audio/video station database through a communication line, such as the Internet, telecommunication channel and satellite transmission lines to the down-link processing station.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122956545","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Comparison of neural network architectures for the modeling of robot inverse kinematics","authors":"J. A. Driscoll","doi":"10.1109/SECON.2000.845423","DOIUrl":"https://doi.org/10.1109/SECON.2000.845423","url":null,"abstract":"Describes the use of neural networks to model the inverse kinematics of robot manipulators, including a redundant manipulator The use of multiple cooperating networks for the overall modeling of inverse kinematics was explored. A variety of network architectures was used, and their performance was compared. Neural networks were also used to train robots in specified obstacle-avoidance trajectories.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114527781","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An investigation into unsupervised clustering techniques","authors":"H.S. Lee, N. H. Younan","doi":"10.1109/SECON.2000.845446","DOIUrl":"https://doi.org/10.1109/SECON.2000.845446","url":null,"abstract":"The performance of several unsupervised clustering techniques is compared using two clearly separated 3-D data sets that are not separable by any hyperplane. The result shows that the self-organizing feature map can cluster data sets successfully without any prior information of given data while the k-means and the fuzzy k-means algorithm fail to cluster correctly.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114843354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A teaching technique using SOCKET model","authors":"A. Basher, S. Isa","doi":"10.1109/SECON.2000.845622","DOIUrl":"https://doi.org/10.1109/SECON.2000.845622","url":null,"abstract":"A novel teaching technique is introduced utilizing the Student Oriented Comprehensive Knowledge Enhancement Technique (SOCKET). There are three main components to this model: the Learning Objectives (LO), Class Activity Modules (CAM), and Assessment Module (AM). In the Learning Objectives, the course contents are broken into smaller concepts that progresses from basic to advanced level within the topic. The Class Activity Modules are developed strictly based on the concepts outlined in the LO. The design of these modules takes into account the student comprehension of the concepts and the completion of the classroom activities with minimal difficulty. The Assessment Module (AM) is basically a test bank that is used to assess the students' learning status. The development of a course using the SOCKET model can be both time consuming and challenging to the instructor but the end justifies the means. Assessment tools using student feedback are one of the key elements of this technique since it is intended to be dynamic in nature. One of the ultimate goals of SOCKET model is the development of self-learners and the promotion of active learning. The other goal focuses on the fact that when SOCKET is fully developed, it should lend itself easily to multi-platform delivery. Its application to classroom instruction has already proven to be simple, so we are confident that its subsequent application to Web/distance education should be simple as well. Samples of the SOCKET model are illustrated.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115293577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A new implementation technique for memory management","authors":"Mehran Rezaei, Krishna M. Kavi","doi":"10.1109/SECON.2000.845587","DOIUrl":"https://doi.org/10.1109/SECON.2000.845587","url":null,"abstract":"Dynamic memory management is an important and essential part of computer systems design. Efficient memory allocation, garbage collection and compaction are becoming increasingly more critical in parallel, distributed and real-time applications using object-oriented languages like C++ and Java. We present a technique that uses a binary tree for the list of available memory blocks and show how this method can manage memory more efficiently and facilitate easy implementation of well known garbage collection techniques.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115595385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multiple-fault detection for the balanced and unbalanced conditional-sum adders","authors":"C. Arjhan, R. G. Deshmukh","doi":"10.1109/SECON.2000.845593","DOIUrl":"https://doi.org/10.1109/SECON.2000.845593","url":null,"abstract":"In this paper the pair-fault (pf) model (Arjhan and Deshmukh 1998), its concept of multiple fault boundaries (MFBs) and fault-dominance are applied to detect multiple stuck-at faults of the conditional-sum type adders' carry-tree. There are 2n+1 test patterns (n is the operand width) to be applied through the primary inputs of the carry binary-trees. The tree can be balanced or unbalanced. For this purpose, the architecture of the adders is reformulated such that they will correspond to the parallel-prefix lookahead adders and the proof of testability is then followed.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129621015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"HPC software usability enhancement through evaluation and training","authors":"Mingsheng Guo, S. Devgan","doi":"10.1109/SECON.2000.845607","DOIUrl":"https://doi.org/10.1109/SECON.2000.845607","url":null,"abstract":"The National Grand Challenges program has identified ten computational critical technology areas (CTAs) and there is a need to enhance HPC software usability to address these critical CTAs. We have evaluated the software training needs of HPC users based on the user survey records of 1998. An analysis of the HPC user survey indicates six major types of software being used at various locations. These are divided among system software, compiler software, special application software (in-house, large scale, and library software), software tools, virtualization software and small-scale software. We have ranked software by user training needs in the above six areas. The user software training needs for different software categories are ranked as: FORTRAN90, C++, C, and HPF for compiler software; MATLAB for small-scale software; LS-DYNA3D for special application software; FAST for virtualization software; MPI, and PVM for software tools; and Origin2000, T3E, C90, T90, and SP for system software. Additionally we have identified various Web sites and sources that offer software training courses. In addition, we offer on-site courses for training in FORTRAN, C++, C, and MATLAB and are planning to develop Web based courses in these areas. These training programs will increase the pool of well trained HPC software users and thus enhance HPC software usability.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127248037","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A non-destructive method of testing for radiation hardness of integrated circuits","authors":"M. Awipi, S. Drews","doi":"10.1109/SECON.2000.845591","DOIUrl":"https://doi.org/10.1109/SECON.2000.845591","url":null,"abstract":"There has existed a long-standing need to design integrated circuits that withstand the effects of ionizing radiation as part of the effort to obtain radiation hardened electronic systems. The results of design efforts require testing to verify the degree of radiation hardness achieved. But testing that involves the application of ionizing radiation directly is destructive and can only be applied during product development. In this paper, we have proposed a non-destructive method of testing for radiation hardness of integrated circuits using high magnetic fields. Experimental data is included to show the correlation between the effects of ionizing radiation and high magnetic fields on the current-voltage characteristics of transistors and the input-output voltage transfer characteristics of logic gates. A preliminary estimate is made that 8 T of magnetic fields can produce the same effect as 1 Megarad (Si) of total ionizing radiation dose for testing purposes.","PeriodicalId":206022,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2000. 'Preparing for The New Millennium' (Cat. No.00CH37105)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126136985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}