Thirteenth International Symposium on Quality Electronic Design (ISQED)最新文献

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A variation and energy aware ILP formulation for task scheduling in MPSoC MPSoC中任务调度的可变和能量感知ILP公式
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-04-19 DOI: 10.1109/ISQED.2012.6187578
Mahboobeh Ghorbani
{"title":"A variation and energy aware ILP formulation for task scheduling in MPSoC","authors":"Mahboobeh Ghorbani","doi":"10.1109/ISQED.2012.6187578","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187578","url":null,"abstract":"In nanometer-scale process technologies, the effects of process variations are observed in Multiprocessor System-on-Chips (MPSoC) in terms of variations in frequencies and leakage powers among the processors on the same chip as well as across different chips of the same design. Traditional approaches try to improve the worst-case value for energy of a system whereas statistical optimizations are more recently employed to optimize the energy yield under a given energy constraint. In this work, we have formulated statistical optimization by integer linear programming. Our experimental results on E3S benchmark suite show that statistical approach for task scheduling can achieve up to 22% improvement over the conventional approach in terms of energy yield and demonstrate this superiority is improved when the amount of variation increases.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"12 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132798027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Automated correction of design errors by edge redirection on High-Level Decision Diagrams 在高级决策图上通过边缘重定向自动纠正设计错误
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-04-19 DOI: 10.1109/ISQED.2012.6187566
Anton Karputkin, R. Ubar, M. Tombak, J. Raik
{"title":"Automated correction of design errors by edge redirection on High-Level Decision Diagrams","authors":"Anton Karputkin, R. Ubar, M. Tombak, J. Raik","doi":"10.1109/ISQED.2012.6187566","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187566","url":null,"abstract":"The paper presents a new method for design error correction by edge redirection on High-Level Decision Diagrams (HLDDs). In this paper, a canonical form of HLDDs developed by the authors is applied to automated correction of design errors. We show how realistic design errors can be represented by the redirection-based fault model. The theoretical basis of the approach is presented with the key advantages being the ability to handle multiple errors as well as the fact that the error correction is not restricted by the input stimuli. The method has been evaluated on a set of ITC99 benchmarks and on three real-world cores. Experiments show that the method is capable of correcting multiple design errors in very short run times.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128245125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Dynamically biased low power high performance 3.3V output buffer in a single well bulk CMOS 1.8V oxide 45nm process 动态偏置低功耗高性能3.3V输出缓冲器,单孔体CMOS 1.8V氧化物45nm工艺
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-03-19 DOI: 10.1109/ISQED.2012.6187489
K. Rajagopal
{"title":"Dynamically biased low power high performance 3.3V output buffer in a single well bulk CMOS 1.8V oxide 45nm process","authors":"K. Rajagopal","doi":"10.1109/ISQED.2012.6187489","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187489","url":null,"abstract":"Integration of legacy interfaces demand need for 3.3V I/Os in modern day SOCs. Low cost solutions exists by build 3.3V I/Os using specially biased 1.8V transistors imposing a serious limitation of trade-off between power, performance and reliability. This paper presents an I/O built using a dynamically biased differential amplifier based pre-driver circuit, with which excellent performance has been achieved up to 200MHz along with up to 30X reduction in power without compromise to reliability.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"193 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115643754","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Effcient approaches to overcome non-convexity issues in analog design automation 模拟设计自动化中克服非凸性问题的有效方法
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-03-19 DOI: 10.1109/ISQED.2012.6187550
S. Maji, P. Mandal
{"title":"Effcient approaches to overcome non-convexity issues in analog design automation","authors":"S. Maji, P. Mandal","doi":"10.1109/ISQED.2012.6187550","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187550","url":null,"abstract":"We propose two approaches to overcome limitation of convex programming technique for analog design automation. Analog design performance constraints are cast in posynomial inequality format for suitability into convex optimization based application. But in most cases original equations are not in posynomial so, either they are deliberately modeled or approximated. This leads to inaccuracy. Our first approach is based on exploiting apparent benefit of convex programming based global optimizer but still making use of highly accurate non-posynomial or signomial model. To achieve that, we combine both global and local optimizer. Global optimizer handles less accurate posynomial equation ensuring global optimality. And the initial guess obtained therefore is used by local optimizer to handle accurate signomial model. Second approach demonstrates that the targeted region to be modeled for circuit sizing can be reduced which invariably leads to better model accuracy. We develop low dropout regulator (LDO) performance metrics in posynomial and signomial format for use in the proposed methodology.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123769268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Functional composition: A new paradigm for performing logic synthesis 功能组合:执行逻辑综合的新范例
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-03-19 DOI: 10.1109/ISQED.2012.6187500
Mayler G. A. Martins, Renato P. Ribas, A. Reis
{"title":"Functional composition: A new paradigm for performing logic synthesis","authors":"Mayler G. A. Martins, Renato P. Ribas, A. Reis","doi":"10.1109/ISQED.2012.6187500","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187500","url":null,"abstract":"This paper presents the functional composition (FC), a new paradigm for combinational logic synthesis. FC is based on the following principles: (1) representation of logic functions as a bonded pair of functional/structural representations; (2) it starts from a set of initial functions; (3) simpler functions are associated to create more complex ones; (4) a partial order that enables dynamic programming is respected; (5) a set of allowed functions is maintained to reduce execution time/memory consumption. We present functional composition algorithms variants for Boolean factoring, AIG rewriting, minimum decision chain computation and SOP generation.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125392199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Hot peripheral thermal management to mitigate cache temperature variation 热外围热管理,以减轻缓存温度变化
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-03-19 DOI: 10.1109/ISQED.2012.6187576
H. Homayoun, M. Rahmatian, Vasileios Kontorinis, Shahin Golshan, D. Tullsen
{"title":"Hot peripheral thermal management to mitigate cache temperature variation","authors":"H. Homayoun, M. Rahmatian, Vasileios Kontorinis, Shahin Golshan, D. Tullsen","doi":"10.1109/ISQED.2012.6187576","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187576","url":null,"abstract":"Modern microprocessor caches are often regarded as cool chip components that dissipate power uniformly. This research demonstrates that this uniformity is a misconception. Memory cell peripherals dissipate considerably higher power than the actual memory cell and this can result in up to 30°C of temperature difference between the warmest and the coolest part of the cache. To be effective and accurate, cache temperature and power modeling and management must take this effect into account. Further, this paper focuses on the surrounding logic of the memory cell and applies two novel techniques, peripheral bit swapping (PBS) and peripheral monitor and shutdown (PMSD), to reduce the thermal variation as well as reduce the corresponding steady-state temperature and leakage power of the cache. Overall, these techniques decrease temperature by 8°C for the L1 Data Cache and 5°C for the shared L2 cache and reduce their thermal gradient by more than 75%, on average.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116128592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Ordinary Kriging metamodel-assisted Ant Colony algorithm for fast analog design optimization 普通Kriging元模型辅助蚁群算法快速模拟设计优化
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-03-19 DOI: 10.1109/ISQED.2012.6187533
Oghenekarho Okobiah, S. Mohanty, E. Kougianos
{"title":"Ordinary Kriging metamodel-assisted Ant Colony algorithm for fast analog design optimization","authors":"Oghenekarho Okobiah, S. Mohanty, E. Kougianos","doi":"10.1109/ISQED.2012.6187533","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187533","url":null,"abstract":"This paper explores an ordinary Kriging based metamodeling technique that allows designers to create a model of a circuit with very good accuracy, while greatly reducing the time required for simulations. Regression and interpolation based methods have been researched extensively and are a commonly used technique for creating metamodels. However, they do not take into account the effect of correlation between design and process parameters, which are critical in the nanoscale regime. Kriging provides an improved metamodeling technique which takes into effect correlation effects during the metamodel generation phase. The ordinary Kriging metamodels are subjected to an Ant Colony Optimization (ACO) algorithm that enables fast optimization of the circuit. This design methodology is evaluated on a sense amplifier circuit as a case study. The results show that the Kriging based metamodels are very accurate and the ACO based algorithm optimizes the sense amplifier precharge time with power consumption as a design constraint in an average time of 3.7 minutes (optimization on the metamodel), compared to 72 hours (optimization on the SPICE netlist).","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128504779","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Design quality tradeoff studies for 3D ICs built with nano-scale TSVs and devices 采用纳米级tsv和器件构建的3D集成电路的设计质量权衡研究
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-03-19 DOI: 10.1109/ISQED.2012.6187574
Kaiyuan Yang, Daehyun Kim, S. Lim
{"title":"Design quality tradeoff studies for 3D ICs built with nano-scale TSVs and devices","authors":"Kaiyuan Yang, Daehyun Kim, S. Lim","doi":"10.1109/ISQED.2012.6187574","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187574","url":null,"abstract":"Three dimensional integrated circuits (3D ICs) built with through-silicon vias (TSVs) have smaller footprint area, shorter wire-length, and better performance than 2D ICs. However, the quality of 3D ICs is strongly dependent on TSV dimensions and parasitics. Using large TSVs may cause silicon area overhead and reduce the amount of wirelength reduction in 3D ICs. In addition, non-negligible TSV parasitic capacitance can result in delay overhead affecting the delay of 3D ICs. Meanwhile, with the development of TSV manufacturing technology, nano-scale TSVs are emerging, which is expected to reduce the overheads caused by using large TSVs. Therefore, this paper investigates the impact of nano-scale TSVs on the quality of 3D ICs at future technology nodes. For this study, we develop a 16nm standard cell library, design 3D ICs using different process technologies (45nm, 22nm, and 16nm) and various TSVs diameters (from 5μm to 0.1μm), and discuss the impact of nano-scale TSVs.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123635405","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Efficient reduction techniques for statistical model generation of standard cells 标准细胞统计模型生成的高效约简技术
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-03-19 DOI: 10.1109/ISQED.2012.6187518
Sachin Shrivastava, H. Parameswaran
{"title":"Efficient reduction techniques for statistical model generation of standard cells","authors":"Sachin Shrivastava, H. Parameswaran","doi":"10.1109/ISQED.2012.6187518","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187518","url":null,"abstract":"Statistical analysis has become an important technique to accurately factor in the effect of process variations in circuit behavior. Statistical analysis techniques depend on the generation of compact, fast, accurate and robust models that capture some specific aspect of the circuit behavior. The process of characterizing the circuit behavior to generate variation-aware models for standard cells has a large runtime penalty (l00x of nominal model generation). This runtime explosion is primarily due to the additional numbers of simulations required to capture the effects of within-die (WID) variations. We look at the techniques used for capturing WID effects in model generation and present some techniques to reduce the runtime of statistical delay and leakage characterization significantly. We show that our technique can speed up timing model generation by l0x and leakage model generation by approximately 2x.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134201179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Error mitigation in digital logic using a feedback equalization with schmitt trigger (FEST) circuit 利用施密特触发器(FEST)电路的反馈均衡降低数字逻辑中的误差
Thirteenth International Symposium on Quality Electronic Design (ISQED) Pub Date : 2012-03-19 DOI: 10.1109/ISQED.2012.6187511
Zafar Takhirov, B. Nazer, A. Joshi
{"title":"Error mitigation in digital logic using a feedback equalization with schmitt trigger (FEST) circuit","authors":"Zafar Takhirov, B. Nazer, A. Joshi","doi":"10.1109/ISQED.2012.6187511","DOIUrl":"https://doi.org/10.1109/ISQED.2012.6187511","url":null,"abstract":"Voltage scaling is commonly used to reduce the energy consumption of digital CMOS logic. However, as the supply voltage decreases, transistor switching times increase, leading to intersymbol interference (ISI) between successive outputs of the digital logic. This limits the amount of voltage scaling that can be applied for a target performance. We describe a novel circuit-level technique that couples feedback equalization with a Schmitt trigger (FEST) to suppress this ISI, which in turn enables further voltage scaling while ensuring reliable operation at the desired target performance. For a 4-bit, 22 nm Kogge-Stone adder designed for 2 GHz operation, the proposed technique lowers the critical voltage (beyond which frequent timing errors occur) from 580 mV (nominal design) to 510 mV (design with FEST circuit), providing a 20% decrease in energy per operation. We also apply this technique to a 3-tap 4-bit finite impulse response (FIR) filter operating at 500 MHz, and observe that the critical voltage drops from 680 mV (nominal design) to 510 mV (design with FEST circuit) and the energy per operation can be decreased by up to 40%.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133986029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
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