SPIE Laser Damage最新文献_第8页

Revisiting mechanisms of molecular contamination induced laser optic damage 分子污染诱导激光光学损伤的机理研究

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.753588

J. Canham

引用次数: 2

Comparison of ns and sub-ns laser conditioning of KDP and DKDP crystals for high power lasers 高功率激光中KDP和DKDP晶体的ns和sub-ns激光调理比较

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.752826

C. Maunier, B. Bertussi, D. Damiani, T. Donval, G. Duchateau, A. Dyan, G. Gaborit, L. Lamaignère, X. Leborgne, M. Loiseau, H. Mathis, G. Razé

引用次数: 6

Effect of instrumental response time in exponential-decay-based cavity ring-down techniques for high reflectivity measurement 高反射率测量中基于指数衰减的腔衰荡技术中仪器响应时间的影响

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.758948

Yuan Gong, Bincheng Li

{"title":"Effect of instrumental response time in exponential-decay-based cavity ring-down techniques for high reflectivity measurement","authors":"Yuan Gong, Bincheng Li","doi":"10.1117/12.758948","DOIUrl":"https://doi.org/10.1117/12.758948","url":null,"abstract":"Exponential-decay based cavity ring-down (CRD) techniques, such as the pulsed-CRD and continuous-wave (cw) CRD employing a fast switch to shut down the laser beam, are widely used for high reflectivity measurement. In this paper the influence of the response time of the experimental apparatus on the high reflectivity measurement is investigated theoretically and experimentally. Theoretical expressions taking into account the instrumental response time are given for both pulsed- and cw-CRD techniques, respectively. By establishing a simple cw-CRD setup employing detectors with different response time, the influence of the instrumental response time on the high reflectivity measurement is experimentally investigated. By applying a multi-parameter estimation technique to determine simultaneously the cavity decay time and the overall response time of the experimental apparatus via fitting the experimental CRD signal to the corresponding theoretical model, the influence of a long instrumental response time on the reflectivity determination is eliminated. The reflectivities of the cavity mirror measured with detectors with different rise time are in excellent agreement. On the other hand, the error of high reflectivity measurement increases with the increasing rise/fall time of the apparatus in cases that the CRD signals obtained by detectors with relatively slow rise time are simply treated with a single exponential decay fitting procedure.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"121 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115704901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Photothermal detuning: a sensitive technique for absorption measurement of optical thin films 光热失谐:一种用于光学薄膜吸收测量的灵敏技术

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.758949

H. Hao, Bincheng Li, Mingqiang Liu, Yuan Gong

引用次数: 2

Scattering-induced downstream beam modulation by plasma scalded mirrors 等离子体烫伤反射镜散射诱导的下游光束调制

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.748446

J. Schmidt, M. Runkel, K. E. Martin, C. Stolz

引用次数: 10

Comparative studies of laser-induced damage threshold measurements in highly reflecting mirrors 高反射镜中激光损伤阈值测量的比较研究

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.753705

A. Melninkaitis, D. Mikšys, R. Grigonis, V. Sirutkaitis, M. Jupé, D. Ristau

引用次数: 2

Damage thresholds and morphology of the front- and back-irradiated SiO2 thin films containing gold nanoparticles as artificial absorbing defects 含金纳米粒子作为人工吸收缺陷的前后辐照SiO2薄膜的损伤阈值和形貌

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.752616

S. Papernov, A. Schmid, J. Oliver, A. Rigatti

引用次数: 3

High-resolution 3D imaging of surface damage sites in fused silica with optical coherence tomography 光学相干层析成像熔融二氧化硅表面损伤部位的高分辨率三维成像

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.748452

G. Guss, I. Bass, R. Hackel, C. Mailhiot, S. Demos

引用次数: 13

High laser damage threshold surface relief micro-structures for anti-reflection applications 用于抗反射应用的高激光损伤阈值表面浮雕微结构

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.754223

D. S. Hobbs, B. MacLeod

{"title":"High laser damage threshold surface relief micro-structures for anti-reflection applications","authors":"D. S. Hobbs, B. MacLeod","doi":"10.1117/12.754223","DOIUrl":"https://doi.org/10.1117/12.754223","url":null,"abstract":"Microstructures built into the surfaces of an optic or window, are an effective replacement for thin-film coatings in anti-reflection (AR) and narrow-band filter applications. AR microstructures exhibit particularly noteworthy performance where an average reflection loss of less than 0.2% over a four-octave range (400-1800nm) has been demonstrated, and a loss of less than 0.03% is routinely achieved for narrow-band applications. Because AR micro-textures provide a gradual change in the refractive index at a material boundary, it is expected that light can propagate through the boundary without material damage at energy levels that are much higher than that found with thin-film interference coatings. Recently, it was shown that the laser induced damage threshold (LIDT) of an inexpensive borosilicate glass window containing AR microstructures was nearly 57 J/cm2 at 1064nm (20ns pulse). This LIDT is two to three times greater than the damage threshold of single-layer sol-gel AR coatings on fused silica often reported in the literature. The development of surface relief AR textures for use in high-energy laser applications is presented. Data from scanning electron microscope (SEM) analysis, reflection measurements, and LIDT testing, is shown for high performance AR microstructures fabricated in fused silica, and borosilicate glass. Results of LIDT testing at wavelengths ranging from the near ultraviolet through the near infrared confirm the initial result that AR microstructures can operate at pulsed laser power levels at least two times higher than thin-film coatings. For near infrared applications such as laser weapons and fiber optic communications requiring high performance AR, LIDT levels for AR microstructures in fused silica are found to be at least five times greater than conventional multi-layer thin film coatings. An initial surface absorption test at 1064nm shows that AR microstructures may also exhibit improved lifetimes within continuous wave laser systems.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"72 S1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113968596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 45

Growth of laser damage in fused silica: diameter to depth ratio 熔融石英中激光损伤的生长:直径与深度比

SPIE Laser Damage Pub Date : 2007-10-10 DOI: 10.1117/12.748441

M. Norton, J. Adams, C. Carr, Eugene E. Donohue, M. Feit, R. Hackel, W. G. Hollingsworth, J. Jarboe, M. Matthews, A. Rubenchik, M. Spaeth

引用次数: 43