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2010 IEEE International Symposium on Electromagnetic Compatibility最新文献

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Modeling of the immunity of ICs to EFTs 集成电路对电磁场免疫的建模
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711323
Ji Zhang, Jayong Koo, D. Beetner, R. Moseley, S. Herrin, D. Pommerenke
{"title":"Modeling of the immunity of ICs to EFTs","authors":"Ji Zhang, Jayong Koo, D. Beetner, R. Moseley, S. Herrin, D. Pommerenke","doi":"10.1109/ISEMC.2010.5711323","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711323","url":null,"abstract":"Investigation of the immunity of ICs to EFTs is increasingly important. In this paper, an accurate model of a microcontroller is developed and verified. This model consists of two parts: a passive Power Distribution Network (PDN) model and an active I/O protection network model. Measurement methods are designed to extract the parameters of the passive PDN model. The accuracy of the overall model of the IC is verified using both S parameter tests and EFT injection tests. The model is able to accurately predict the voltage and current at power-supply and I/O pins and correctly accounts for the active components of the I/O protection network.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132661459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Mobile phones electromagnetic interference in medical environments: A review 医疗环境下手机电磁干扰研究综述
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711291
M. Fernández-Chimeno, Ferran Silva
{"title":"Mobile phones electromagnetic interference in medical environments: A review","authors":"M. Fernández-Chimeno, Ferran Silva","doi":"10.1109/ISEMC.2010.5711291","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711291","url":null,"abstract":"This paper presents a review of the effect of electromagnetic interferences of mobile phones in medical environment. The review is focussed in two areas, EMI in implantable devices like pacemakers or ICD, and EMI in medical equipment in hospital areas with life supporting equipment like intensive care units (ICU) or operating rooms (OR). The applied methodology for interference testing is different for all the analyzed studies, and the results range from 100% of interfered devices to no effect. The majority of authors recommend maintaining a safety distance both between cellular phones and medical devices. Also, it is necessary to establish clear policies for the use of mobile phones in critical areas in hospitals. Finally, it is necessary to develop a family of EMC standards for testing in-situ the effects of non-medical devices inside medical facilities. This will permit medical staff to take profit from new technologies in their daily work in a safe way.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"173 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133778792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
High-resolution propagation measurements using biconical antennas and signal processing 使用双锥天线和信号处理的高分辨率传播测量
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711252
R. Johnk, John D. Ewan, N. DeMinco, Ronald L. Carey, P. McKenna, C. Behm, T. Riley, Steven Carroll, M. A. McFarland, James W. Leslie
{"title":"High-resolution propagation measurements using biconical antennas and signal processing","authors":"R. Johnk, John D. Ewan, N. DeMinco, Ronald L. Carey, P. McKenna, C. Behm, T. Riley, Steven Carroll, M. A. McFarland, James W. Leslie","doi":"10.1109/ISEMC.2010.5711252","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711252","url":null,"abstract":"This paper describes how commercially-available EMC biconical antennas can be used to perform high-resolution propagation measurements. A measurement procedure and signal processing sequence is described that greatly improves the range resolution and fidelity of transmission measurements using a pair of biconical antennas. Measurement results are provided for a number of different scenarios both indoors and outdoors. Direct comparisons are also provided with the Numerical Electromagnetics Code (NEC). The results obtained so far look quite promising and demonstrate the viability of the approach.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"34 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124146084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Investigations of the EM-coupling in the near and far field of a transmitting antenna according to EUROCAE ED-130 欧空局ED-130发射天线近场和远场电磁耦合的研究
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711382
T. Dyballa, J. Luiken ter Haseborg
{"title":"Investigations of the EM-coupling in the near and far field of a transmitting antenna according to EUROCAE ED-130","authors":"T. Dyballa, J. Luiken ter Haseborg","doi":"10.1109/ISEMC.2010.5711382","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711382","url":null,"abstract":"In EUROCAE ED-130 two test procedures for radiated field EMC tests are pointed out. These procedures differ in the distance of the field transmitting antenna to the equipment under test (EUT). To cover the use of portable electronic devices (PED) next to the tested system, immunity tests are preformed in the near and far field region of the transmitting antenna. In this paper these tests are realized with sample test devices to obtain differences and similarities of these different test procedures.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114838104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Modeling connector contact condition using a contact failure model with equivalent inductance 利用等效电感的接触失效模型对连接器接触状态进行建模
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711371
Yu-ichi Hayashi, Songping Wu, J. Fan, T. Mizuki, H. Sone
{"title":"Modeling connector contact condition using a contact failure model with equivalent inductance","authors":"Yu-ichi Hayashi, Songping Wu, J. Fan, T. Mizuki, H. Sone","doi":"10.1109/ISEMC.2010.5711371","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711371","url":null,"abstract":"It is found from previous studies on the immunity issues of CATV coaxial cables due to contact failure that, when contact resistance is small, the contact distribution and the number of contact points become factors that affect the degradation in immunity of the cables. However, when contact resistance is relatively large, the effects of the contact distribution and the number of contact points are negligible. In this paper, the physics of this phenomenon is further studied. Simulation results, validated by measurement, reveal that the contact distribution and the number of contact points contribute to parasitic inductances that could change the current distribution among the contact points, and further affect the immunity performance of the cables. Using a contact failure model proposed in this paper, cable contact scenarios at the connectors with different contact distributions and numbers of contact points can be simply simulated by changing the inductance term in the model.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117241976","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Measurement of differential mode propagation in printed circuit board for satellites applications 卫星用印刷电路板差分模式传播的测量
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711236
P. Tarquini, F. de Paulis, D. di Febo, G. Antonini, A. Orlandi, V. Ricchiuti
{"title":"Measurement of differential mode propagation in printed circuit board for satellites applications","authors":"P. Tarquini, F. de Paulis, D. di Febo, G. Antonini, A. Orlandi, V. Ricchiuti","doi":"10.1109/ISEMC.2010.5711236","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711236","url":null,"abstract":"This work deals with a test procedure for EMC/SI measurements on artificial satellites for telecommunication applications. This work proposes a fast method to compare the effects of different test setups for the measurement of conducted emissions and introduces a different test setup for this category of EUT.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124066637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An equivalent three-dipole model for IC radiated emissions based on TEM cell measurements 基于瞬变电磁炉测量的等效三偶极子模型
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711354
Siming Pan, Jingook Kim, Sungnam Kim, Jaesu Park, Heon-Cheol Oh, J. Fan
{"title":"An equivalent three-dipole model for IC radiated emissions based on TEM cell measurements","authors":"Siming Pan, Jingook Kim, Sungnam Kim, Jaesu Park, Heon-Cheol Oh, J. Fan","doi":"10.1109/ISEMC.2010.5711354","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711354","url":null,"abstract":"An equivalent dipole model is proposed in this paper to represent the source of radiated electromagnetic emissions from an integrated circuit (IC). The height of an IC is usually much smaller than its length and width, so only three dipole moments are sufficient to characterize an IC in terms of its electromagnetic emissions. The dipole moments can be extracted from three TEM cell measurements. The radiated fields from the IC can then be calculated based on the extracted dipole sources. This IC emission model with three dipole moments is validated using the far-field measurements in a semi anechoic chamber for a test IC. For complex structures, it is desirable that the extracted dipole moments can be incorporated into a commercial full-wave tool as equivalent sources to simulate the radiations from an IC. This is demonstrated using an approach developed in this paper.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128532236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 33
Simulation and design of printed circuit boards utilizing novel embedded capacitance material 利用新型嵌入式电容材料的印刷电路板仿真与设计
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711276
Yu Xuequan, Yan Hang, Zhang Gezi, Wang Haisan
{"title":"Simulation and design of printed circuit boards utilizing novel embedded capacitance material","authors":"Yu Xuequan, Yan Hang, Zhang Gezi, Wang Haisan","doi":"10.1109/ISEMC.2010.5711276","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711276","url":null,"abstract":"the effects of a novel embedded capacitance material on PI-Power integrity, SI-Signal integrity and EMC-Electro Magnetic Compatibility were simulated and measured by comparing a multilayer board with embedded capacitance to a conventional multilayer board utilizing conventional FR-4 material. SIwave software was used to simulate electrical properties and EMC of the embedded capacitance material board and conventional FR-4 material board up to a frequency of 4 GHz. Finally, the application prospects of embedded capacitance materials are analysed.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126411510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Forward and reverse link constraints in UHF RFID with passive tags 带无源标签的超高频射频识别中的正向和反向链路约束
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711359
D. Kuester, D. Novotny, J. Guerrieri
{"title":"Forward and reverse link constraints in UHF RFID with passive tags","authors":"D. Kuester, D. Novotny, J. Guerrieri","doi":"10.1109/ISEMC.2010.5711359","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711359","url":null,"abstract":"This paper examines the relative roles of the forward and reverse links in determining the operational range of passive UHF RFID systems. Simple free space examples in free space show when the forward or reverse link may be the main range constraint in practical systems, depending on reader and tag characteristics. Measurements of transmission and scattering off of a dipole in a real environment demonstrate showed different multipath effects; transmission power fading squared disagreed with backscattered fading in the test environment by up to 8 dB within a measurement range of 2 m.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113971969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Comparison of measured and computed near and far fields of a Heatsink using the Feature Selective Validation (FSV) method 使用特征选择验证(FSV)方法对散热器近场和远场的测量和计算进行比较
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711369
A. Bhobe, P. Sochoux
{"title":"Comparison of measured and computed near and far fields of a Heatsink using the Feature Selective Validation (FSV) method","authors":"A. Bhobe, P. Sochoux","doi":"10.1109/ISEMC.2010.5711369","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711369","url":null,"abstract":"In this paper we outline the comparison of far field electric field of a Heatsink using the Frequency Selective Validation (FSV) method. Numerical simulations are performed using 3D-EM tools like Ansoft HFSS and CST Microstripes. The FSV method has been used to compare the data between the two different numerical approaches as well as with the measured data. Though the E-field data shows a good agreement between measurement and simulations, the FSV data analysis proves a poor to good agreement to measurements.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132705282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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