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2010 IEEE International Symposium on Electromagnetic Compatibility最新文献

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Efficient macromodeling of power-bus structures based on 2D-integral equation approach 基于二维积分方程方法的电力母线结构高效宏观建模
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711306
M. Leone, O. Kroning
{"title":"Efficient macromodeling of power-bus structures based on 2D-integral equation approach","authors":"M. Leone, O. Kroning","doi":"10.1109/ISEMC.2010.5711306","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711306","url":null,"abstract":"A numerically very efficient simulation method for the analysis of arbitrarily shaped power-bus structures on printed-circuit boards is presented. It is based on a 2D contour integral-equation method in combination with a subsequent macromodeling step, for simulation in time- and frequency domain. For this purpose a vector-fitting approach is applied, yielding a SPICE-compatible equivalent circuit representation of the power bus. The presented approaches allow us to embed the power planes as a linear N port into a circuit simulator, in order to perform a complete analysis of a power-bus system with active and passive components and the complete decoupling circuitry. The accuracy of the suggested method is validated by independent 3D-full wave simulations and experimental results.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126432956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Efficient mid-frequency plane inductance computation 高效的中频平面电感计算
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711387
Fan Zhou, A. Ruehli, J. Fan
{"title":"Efficient mid-frequency plane inductance computation","authors":"Fan Zhou, A. Ruehli, J. Fan","doi":"10.1109/ISEMC.2010.5711387","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711387","url":null,"abstract":"In power distribution networks (PDN), the modelling of the mid-frequency inductance for Zpp type plane pairs is very important. It is a key step for the placement of the decoupling capacitors. This paper gives an efficient approach for the calculation of the inductance for different capacitor placements. The PEEC based formulations takes advantage of the opposite currents in the planes. This leads to compute time reductions and memory savings for both the element calculation and the matrix solve step. We also use a formulation where placement of capacitors leads to only small changes in the circuit matrix. Comparisons with other models are made to validate our results.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"43 10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125755893","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
An electromagnetics-based parallel transient simulator of linear complexity for the analysis of very large-scale integrated circuits and packages 一种基于电磁的线性复杂度并行暂态模拟器，用于分析超大规模集成电路和封装
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711307
Duo Chen, D. Jiao
{"title":"An electromagnetics-based parallel transient simulator of linear complexity for the analysis of very large-scale integrated circuits and packages","authors":"Duo Chen, D. Jiao","doi":"10.1109/ISEMC.2010.5711307","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711307","url":null,"abstract":"A parallel transient electromagnetic simulator of linear complexity and linear speedup is developed to simulate very large-scale integrated circuits and packages from DC to very high frequencies. In this simulator, through suitable basis functions and linear algebraic techniques, we directly and rigorously decompose the original 3-D system matrix into multiple 1-D matrices with negligible computational overhead. Each one-dimensional matrix is made tridiagonal, and hence can be solved readily in linear complexity. We then achieve an almost embarrassingly parallel implementation of the linear-complexity electromagnetic solver with a low communication-to-computation ratio. Numerical experiments on very large-scale integrated circuits and packages have demonstrated superior performance and linear speedup of the proposed parallel transient simulator. It successfully simulates a large-scale combined die-package system from a real product, which involves more than 3.5 billion unknowns, in fast CPU run time.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126016977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Rapid simulation of the statistical variation of crosstalk in cable harness bundles 电缆束串扰统计变化的快速模拟
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711347
Xiang Li, Meilin Wu, D. Beetner, T. Hubing
{"title":"Rapid simulation of the statistical variation of crosstalk in cable harness bundles","authors":"Xiang Li, Meilin Wu, D. Beetner, T. Hubing","doi":"10.1109/ISEMC.2010.5711347","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711347","url":null,"abstract":"Accurate assessment of crosstalk problems in cable harnesses requires simulation methods that account for statistical variation in harness parameters. Use of the T-parameter method to rapidly estimate the statistical variation of crosstalk in cable harness bundles is outlined. Crosstalk is calculated by segmenting the harness into a cascade of equal length multi-conductor transmission lines (MTLs). Methods to test the influence of the statistical variation in wire positions, height, and number of twists are proposed using both T-parameter simulation and analytical methods. The analytical method uses the mean and variance of crosstalk estimated for fixed harness parameter values to estimate the mean and variance when parameters vary with known probability density functions. The analytical method may thus save additional computation time, since simulations are only required for a relatively small number of fixed parameter values. More importantly, the analytical method may give additional insight into the cause of problems. A comparison of the simulated and analytical results shows the analytical method can accurately estimate statistical variation for the parameters studied.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"200 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121627238","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Spectral analysis of conducted emissions of DC/DC converters DC/DC变换器传导辐射的光谱分析
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711324
D. Bellan, F. Marliani, S. Pignari, G. Spadacini
{"title":"Spectral analysis of conducted emissions of DC/DC converters","authors":"D. Bellan, F. Marliani, S. Pignari, G. Spadacini","doi":"10.1109/ISEMC.2010.5711324","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711324","url":null,"abstract":"This paper investigates spectral properties of conducted emissions (CE) of DC/DC converters used in space applications (e.g., onboard space vehicles). This is done in order to improve the accuracy of prediction models, recently developed, which foresee measurement of CE in the time-domain and subsequent time-to-frequency transformation. In particular, two phenomena are addressed in this work: (a) The time-variant behavior of CE, due to the instability of the DC/DC converter switching frequency; (b) the finite sensitivity of the measurement system resulting from the related noise floor. Proper signal processing procedures are proposed in order to bound the effects of such phenomena, and comparison of predictions versus experimental measurements are used to assess the effectiveness of the proposed approach.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132381265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Reduction of noise in near-field measurements 降低近场测量中的噪声
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711266
Christopher Osterwise, S. Grant, D. Beetner
{"title":"Reduction of noise in near-field measurements","authors":"Christopher Osterwise, S. Grant, D. Beetner","doi":"10.1109/ISEMC.2010.5711266","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711266","url":null,"abstract":"Near-field measurements are sometimes corrupted by ambient noise from either far- or near-field sources. Far-field noise can be removed by performing measurements in a shielded room, but this option is not always available. An adaptive noise cancellation technique is proposed for cancelling ambient electromagnetic interference from measurements taken in a noisy environment. A time-domain, non-recursive, block-processing algorithm was selected to generate the adaptive linear filter. Measurements in the near field of a clocked-logic electronic device in a noisy environment are compared with measurements of the same device in a noise-free environment to demonstrate that the algorithm properly removes ambient electromagnetic noise from the recorded signals. Electromagnetic noise signals in the frequency range of 10 to 700 MHz are reduced in magnitude by 20 dB or more, often to the level of thermal noise.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130084578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
An automated measurement system for cosite interference analysis 一种用于复合干扰分析的自动测量系统
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711393
Matthew Young, Matthew C. Miller, F. German
{"title":"An automated measurement system for cosite interference analysis","authors":"Matthew Young, Matthew C. Miller, F. German","doi":"10.1109/ISEMC.2010.5711393","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711393","url":null,"abstract":"Cosite electromagnetic interference can be accurately simulated when measured data characterizing the broadband behavior of individual RF systems operating in the cosite environment is available. In this paper, a measurement system is presented that performs the broadband transmitter and receiver characterizations necessary for analyzing the cosite problem. An overview of the system is provided along with resulting measurements and observations from a validation exercise.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130482335","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Fast calculation of dielectric substrate losses in microwave applications by the FD2TD method using a new formalism 用FD2TD方法快速计算微波介质衬底损耗
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711280
C. Buccella, V. De Santis, M. Feliziani, F. Maradei
{"title":"Fast calculation of dielectric substrate losses in microwave applications by the FD2TD method using a new formalism","authors":"C. Buccella, V. De Santis, M. Feliziani, F. Maradei","doi":"10.1109/ISEMC.2010.5711280","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711280","url":null,"abstract":"The paper deals with the electromagnetic characterization of a dielectric substrate by a numerical analysis. The electromagnetic analysis is performed by a frequency-dependent finite difference time domain (FD2TD) method with a new formulation. A multi-pole Debye dispersive relation is used to model frequency-dependent properties of dispersive dielectrics. The proposed method is suitable to predict efficiently substrate dielectric losses in microwave and RF applications.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"63 8","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134005554","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
On the use of a reverberation chamber to test the performance and the immunity of a WLAN system 利用混响室测试无线局域网系统的性能和抗扰度
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711357
V. M. Primiani, F. Moglie, R. Recanatini
{"title":"On the use of a reverberation chamber to test the performance and the immunity of a WLAN system","authors":"V. M. Primiani, F. Moglie, R. Recanatini","doi":"10.1109/ISEMC.2010.5711357","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711357","url":null,"abstract":"The paper presents some results concerning the use of a reverberation chamber (RC) to test a wireless local area network (WLAN) system using the standard IEEE 802.11b/g. The whole link (access point and terminal) was operating inside the RC under different chamber loading conditions and varying the stirrer rotating speed. The effects of this multipath environment on system performances were checked measuring three transmission quality estimators: the ping average round trip time, the cyclic redundancy check (CRC) error, and the data retries. The behavior of these parameters, as function of the bitrate set for the link, was also analyzed. The same RC was used to carry out a radiated immunity test on the same WLAN. The undesired signal was both a modulated and continuous wave injected into the used channel and into adjacent channels. The modulated wave is that prescribed by the IEC 61000-4-3 standard.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"144 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131521836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Effects of channel length on calculation accuracy of lightning return stroke electromagnetic fields 通道长度对雷电回程电磁场计算精度的影响
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711303
Tongyu Ding, Shao-qing Zhang, Qun Wu
{"title":"Effects of channel length on calculation accuracy of lightning return stroke electromagnetic fields","authors":"Tongyu Ding, Shao-qing Zhang, Qun Wu","doi":"10.1109/ISEMC.2010.5711303","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711303","url":null,"abstract":"Finite-difference time-domain (FDTD) method has been widely used in the calculation of lightning generated electromagnetic fields, and the length of lightning discharge channel is usually set to be 2500∼3000m according to the height of cloud layer, this is rather time consuming. In order to save the computation time, we shorten the channel length to 1000m, calculate the electric and magnetic fields at flat ground due to lightning return stroke. To compare the results with those of H=2500m, we found that, the error caused by the shortening only occurs in the decreasing period of the lightning waveforms, and the relative error of Ez is about 3% for near field, while the computation time is only 1/3 of that calculated with H=2500m. This analysis of relative error and calculation accuracy will provide more comprehensive criterions on computational parameters for lightning electromagnetic pulse.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131642271","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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