{"title":"A method for evaluating upper bound of simultaneous switching gates using circuit partition","authors":"Kai Zhang, T. Shinogi, H. Takase, T. Hayashi","doi":"10.1109/ASPDAC.1999.760016","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.760016","url":null,"abstract":"This paper presents a method for evaluating an upper bound of simultaneous switching gates in combinational circuits. In this method, the original circuit is partitioned into subcircuits, and the upper bound is approximately computed as the sum of maximum switching gates for all subcircuits. In order to increase the accuracy, we adopted an evaluation function that takes account of both the interconnections among subcircuits and the number of generated subcircuits. Experimental results for ISCAS circuits show that the method efficiently evaluates the upper bounds of switching gates.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"602 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123205471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reduced-order modelling of time-varying systems","authors":"J. Roychowdhury","doi":"10.1109/ASPDAC.1999.759708","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.759708","url":null,"abstract":"We present a theory for reduced-order modelling of linear time-varying systems, together with efficient numerical methods for application to large systems. The technique, called TVP (Time-Varying Pade), is applicable to deterministic as well as noise analysis of many types of communication subsystems, such as mixers and switched-capacitor filters, for which existing model reduction techniques cannot be used. TVP is therefore suitable for hierarchical verification of entire communication systems. We present practical applications in which TVP generates macromodels which are more than two orders of magnitude smaller, but still replicate the input-output behaviour of the original systems accurately. The size reduction results in a speedup of more than 500.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124199438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fast instruction cache simulation strategies in a hardware/software co-design environment","authors":"M. Lajolo, L. Lavagno, A. Sangiovanni-Vincentelli","doi":"10.1109/ASPDAC.1999.760030","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.760030","url":null,"abstract":"Cache memories are one of the main factors that affect software performance, and their use is becoming increasingly common even in embedded systems. Efficient analysis of the effects of parameter variations (cache dimensions, degree of associativity, replacement policy, line size, ...) is at the same time an essential and very time-consuming aspect of embedded system design, whose complexity increases when multi-tasking and real-time aspects must be considered. We propose a new simulation-based methodology, focused on an approximate model of the cache and of the multi-tasking reactive software, that allows one to trade off smoothly between accuracy and simulation speed. In particular, we propose to accurately consider intra-task conflicts, but approximate inter-task conflicts by considering only a finite number of previous task executions. The rationale for this choice can be found in a common pattern in embedded systems, where a \"normal\" data flow results in a regular intra-task common flow, interrupted from time to time by some urgent event, that pessimistically can be consider as disrupting the cache behavior. The approach is conservative because re-execution of a task after a large amount of time will always be considered as not in cache, and the simulation speed-up is considerable, as shown by theoretical analysis and experimental results.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125815896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An efficient structural approach to board interconnect diagnosis","authors":"C. Lo, Philip C. H. Chan","doi":"10.1109/ASPDAC.1999.760020","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.760020","url":null,"abstract":"This paper presents a new structural approach for diagnosing board interconnects using boundary-scan. While existing diagnosis approaches assume only wired-AND or wired-OR bridging fault model, we consider a more complex bridging short fault model in CMOS circuit environment. The diagnostic test set is generated based on graph theoretic technique and the adjacency fault model is adopted. Both one-step and two-step diagnosis algorithms are given. They guarantee the complete diagnosis of multiple interconnect faults with no aliasing and confounding. The algorithms have been evaluated by simulation on several benchmark layouts and randomly generated layouts. Simulation results show that more than 50% reduction in the number of tests can be achieved for two-step diagnosis when the fault rate is very small, such as in a matured product line. This can significantly save the diagnosis cost for boundary-scan testing.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127733096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Enhancing the efficiency of reduction of large RC networks by pole analysis via congruence transformations","authors":"Zheng Hui, Z. Wenjun, Tian Li-lin, Yang Zhilian","doi":"10.1109/ASPDAC.1999.759718","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.759718","url":null,"abstract":"Among the RC reduction algorithms, the algorithm of PACT (Pole Analysis via Congruence Transformations) has been proved to have several advantages. However, the original implementation of the algorithm destroys the sparsity of the internal capacitance matrix. Consequently, the LASO process, used in the computation of the dominant eigenvalues and eigenvectors, becomes very time-consuming. Therefore, the efficiency of the algorithm needs to be improved. In this paper, a new method to implement the PACT algorithm is presented. In order to maintain the sparsity of the matrices, we use a special Lanczos algorithm to directly compute the eigenvalues and eigenvectors by solving a large sparse symmetric generalized eigenvalue problem, At the same time, this approach can avoid some matrix multiplication to speed up the reduction process. We have constructed a RC reduction tool with the new implementation method. The application of the tools to several RC networks has shown that this tool greatly outperforms the original implementation.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128116847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Y. Iguchi, M. Matsuura, Tsutomu Sasao, Atsumu Iseno
{"title":"Realization of regular ternary logic functions using double-rail logic","authors":"Y. Iguchi, M. Matsuura, Tsutomu Sasao, Atsumu Iseno","doi":"10.1109/ASPDAC.1999.760026","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.760026","url":null,"abstract":"In logic simulation, we often have to evaluate logic functions in the presence of unknown inputs. However, the naive method often produces incorrect values. In these cases, we can produce correct values by evaluating regular ternary logic functions instead of switching functions. This paper proposes a realization of regular ternary logic functions by using double-rail logic. This implementation requires O(2/sup n//n) logic cells, and O(n) time to simulate an n-variable logic function. We showed an FPGA realization that is about 100 times faster than software simulation.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134201609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Clock period minimization of semi-synchronous circuits by gate-level delay insertion","authors":"T. Yoda, A. Takahashi, Y. Kajitani","doi":"10.1109/ASPDAC.1999.759775","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.759775","url":null,"abstract":"A semi-synchronous circuit is a circuit in which every register is ticked by a clock periodically, but not necessarily simultaneously. A feature of semi-synchronous circuits is that the minimum delay between registers may be critical with respect to the clock period of the circuit. In this paper, we discuss a delay insertion method which makes such a semi-synchronous circuit faster. The maximum delay-to-register ratio of the cycles on the circuit gives a lower bound of the clock period. We show that this bound is achieved in the semi-synchronous framework by the proposed gate-level delay insertion method on the assumption that the delay of each element on the circuit is unique.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"194 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133752420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Waveform relaxation of linear integral-differential equations for circuit simulation","authors":"Yaolin Jiang, O. Wing","doi":"10.1109/ASPDAC.1999.759710","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.759710","url":null,"abstract":"We present waveform relaxation of linear integral-differential equations which occur in circuit simulation. We give sufficient conditions for convergence and numerical experiments to verify the theoretical results.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133878180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jinsong Bei, Hongxing Li, Jinian Bian, Hongxi Xue, X. Hong
{"title":"FSM modeling of synchronous VHDL design for symbolic model checking","authors":"Jinsong Bei, Hongxing Li, Jinian Bian, Hongxi Xue, X. Hong","doi":"10.1109/ASPDAC.1999.760034","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.760034","url":null,"abstract":"In this paper, we defined a new FSM model based on the synchronous behavior and symbolic representation technique. The algorithm to elaborate the model from the VHDL description of synchronous circuits is presented. By eliminating the unnecessary transition function, our model has much less states than Deharbe's mixed model. The experimental results demonstrate the model and modeling method can make symbolic model checking more practical.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134177340","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Testing interconnects of dynamic reconfigurable FPGAs","authors":"Chi-Feng Wu, Cheng-Wen Wu","doi":"10.1109/ASPDAC.1999.760013","DOIUrl":"https://doi.org/10.1109/ASPDAC.1999.760013","url":null,"abstract":"Field Programmable Gate Arrays (FPGAs) are an increasingly popular choice for fast prototyping and for products whose time to market is relatively short. Testing FPGAs before programming them is thus becoming a major concern to the manufacturers as well as the users. In this paper we propose a universal test for the interconnects of typical dynamic reconfigurable FPGAs. The proposed test configurations and corresponding test patterns for the Xilinx XC6200 FPGAs are shown to cover all interconnect faults. In our test, the total number of test configurations is only 7, which is independent of the FPGA size. The test time for XC6216 is less than 5 ms.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"222 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115536224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}