发布求助
文献互助 智能选刊 最新文献

2007 70th ARFTG Microwave Measurement Conference (ARFTG)最新文献

筛选
英文 中文
Short-range detection and measurement of small high-speed objects in microwave frequency region 微波频段高速小物体的近程检测与测量
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376182
M. Randus, P. Hudec, K. Hoffmann
{"title":"Short-range detection and measurement of small high-speed objects in microwave frequency region","authors":"M. Randus, P. Hudec, K. Hoffmann","doi":"10.1109/ARFTG.2007.8376182","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376182","url":null,"abstract":"Systems of active defense of vehicles or buildings are based on detection and measurement of potentially dangerous anti-armor missiles. Radar measurement of these missiles is complicated by their usually very low radar cross-section (RCS) values. Knowledge of RCS values plays crucial role in design of reliable detection system. The purpose of this paper is to present first results of 3D electromagnetic field simulations of accurate models of two common types of anti-armor missiles. The results are discussed with respect to the impact on detection and measurement range of active-defense systems.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115535481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
TDR and S-parameters performance requirements for fault isolation and serial data applications 故障隔离和串行数据应用的TDR和s参数性能要求
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376228
D. Smolyansky
{"title":"TDR and S-parameters performance requirements for fault isolation and serial data applications","authors":"D. Smolyansky","doi":"10.1109/ARFTG.2007.8376228","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376228","url":null,"abstract":"In this paper, we define full suite of requirements for TDR rise time and S-parameter measurement bandwidth for fault isolation and serial data applications. First, we look at the resolution requirements for fault isolation, and analyze some myths and realities surrounding the resolution issue. Then, we analyze the requirements for rise time in various serial data standards, how to determine the right rise time for a standard, and how it translates into TDR rise time requirements. Finally, we look dynamic range and frequency content of serial data signals, look at how to determine the dynamic range requirements, and how the bandwidth should be determined. Together, these analyses provide a designer with a complete set of guidelines for selection of his time and frequency domain measurements.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128344236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A broadband non-intrusive voltage probe with LSNA applications 宽带非侵入式电压探头与LSNA应用
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376179
S. Cripps
{"title":"A broadband non-intrusive voltage probe with LSNA applications","authors":"S. Cripps","doi":"10.1109/ARFTG.2007.8376179","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376179","url":null,"abstract":"A technique for measuring the real-time voltage in microwave circuits is described. The voltage probe has a flat response over wide bandwidths, making it especially useful for real time waveform measurement in circuits which use non-linear devices. The probe has excellent spatial resolution and very low intrusive coupling into the circuit under test. Applications in large signal network analysis (LSNA) and power amplifier (PA) design are reviewed.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121868433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
On-wafer power measurements of BAW filters non-linearities BAW滤波器非线性的片上功率测量
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376231
M. Mabrouk, F. Ndagijimana, N. Corrao, P. Benech, A. Ghazel
{"title":"On-wafer power measurements of BAW filters non-linearities","authors":"M. Mabrouk, F. Ndagijimana, N. Corrao, P. Benech, A. Ghazel","doi":"10.1109/ARFTG.2007.8376231","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376231","url":null,"abstract":"In the wireless communications systems, one of the main parameters should be known for every component is the limit of its linear zone. The linearity or non-linearity of filters contributes to the ones of systems and have to be characterized. This paper describes on-wafer power measurements and its use to determine output power at 1dB compression and IMD of BAW filters for radiocommunications wireless applications around 2.0GHz.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114509424","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Voltage transient measurement and extraction of power RF MOSFET thermal time constants 电压瞬态测量及功率射频MOSFET热时间常数的提取
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376176
C. Baylis, L. Dunleavy
{"title":"Voltage transient measurement and extraction of power RF MOSFET thermal time constants","authors":"C. Baylis, L. Dunleavy","doi":"10.1109/ARFTG.2007.8376176","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376176","url":null,"abstract":"Thermal time constants have been measured for a high-power Si VDMOSFET using a transient setup measuring voltage across a small resistor placed in series with the drain of the device. A voltage step is applied to the gate of the transistor to step the device from threshold to possessing a significant DC power dissipation. Exponential models are fit to the transient results. The traditional one-pole fit is compared to a two-pole fit. It is discovered that the two-pole fit provides a slightly better prediction of the transient.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124234949","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A microwave study on the applications of dielectric parameters for estimating blood parameters 介电参数在血液参数估计中的微波应用研究
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376181
V. M. Rao, B. Rao
{"title":"A microwave study on the applications of dielectric parameters for estimating blood parameters","authors":"V. M. Rao, B. Rao","doi":"10.1109/ARFTG.2007.8376181","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376181","url":null,"abstract":"An X-band microwave, (9–10 GHz) technique to determine the dielectric blood parameters as an indicatrix for the severity of diabetic disease is reported. Relevance of dielectric parameters as the main indicators in the area of diagnostic tools is discussed. An experimental set-up and the relevant procedural details for the measurement of microwave blood parameters for the diabetic disease is presented","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122604902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On quantifying the effects of receiver linearity on VNA calibrations 接收机线性度对VNA校准的量化影响
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376223
J. Martens
{"title":"On quantifying the effects of receiver linearity on VNA calibrations","authors":"J. Martens","doi":"10.1109/ARFTG.2007.8376223","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376223","url":null,"abstract":"As more dynamic range is required in many measurements, it becomes more interesting to better understand how receiver non-linearities affect VNA calibrations and resulting measurements. By separating these problems and employing semi-realistic models of receiver behavior, one can get a better look at where issues may occur and how they will be manifested as a function of calibration type. Starting with simple 1-port calibrations and working up to multiport calibrations, the quantitative effects for some practical nonlinear models will be studied. Results include some strong dependencies on raw test set parameters for all calibrations and some noticeable effects of asymmetry/line variance in the TRL class of calibration techniques.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122382963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
70th ARFTG conference organizers 第70届ARFTG会议组织者
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/arftg.2007.8376168
G. Collins
{"title":"70th ARFTG conference organizers","authors":"G. Collins","doi":"10.1109/arftg.2007.8376168","DOIUrl":"https://doi.org/10.1109/arftg.2007.8376168","url":null,"abstract":"President J Gregory Burns, Northrup Grumman Vice President, Publicity Leonard Hayden, Cascade Microtech Secretary Nick Ridler, NPL Treasurer Ken Wong, Agilent Technologies Exhibits Joseph L. Tauritz, Universiteit Twente Education David Walker, NIST Publications Brian Pugh, SiPort Nominations Mohamed Sayed, MMS Standards Bill Eisenstadt, University of Florida Electronic Communications Ronald Ginley, NIST Membership Raymond W. Tucker, Air Force Research Lab Technical Coordinator Thomas G. Ruttan, Intel Workshops Dominique Schreurs, K U Leuven Awards Uwe Arz, PTB MTT-S Liaison Charles Wilker, Dupont Superconductivity","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"247 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114335967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session A: RF power amplifier characterization A部分:射频功率放大器特性
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/arftg.2007.8376169
J. Plá, M. Fares, N. Messaoudi, S. Boumaiza, J. Wood, Yi He, D. Mccarthy, S. Doo, P. Roblin, V. Balasubramanian, Richard Taylor, K. Dandu, G. Jessen, R. Rojas, C. Roff, J. Bennedikt, P. Tasker, D. Wallis, K. Hilton, J. O. Maclean, D. Hayes, M. Uren, T. Martin, J. Gering, S. Nedeljkovic, F. Kharabi, J. McMacken, M. Marchetti, K. Buisman, M. Pelk, L. Smith, L. Vreede, C. Baylis, L. Dunleavy
{"title":"Session A: RF power amplifier characterization","authors":"J. Plá, M. Fares, N. Messaoudi, S. Boumaiza, J. Wood, Yi He, D. Mccarthy, S. Doo, P. Roblin, V. Balasubramanian, Richard Taylor, K. Dandu, G. Jessen, R. Rojas, C. Roff, J. Bennedikt, P. Tasker, D. Wallis, K. Hilton, J. O. Maclean, D. Hayes, M. Uren, T. Martin, J. Gering, S. Nedeljkovic, F. Kharabi, J. McMacken, M. Marchetti, K. Buisman, M. Pelk, L. Smith, L. Vreede, C. Baylis, L. Dunleavy","doi":"10.1109/arftg.2007.8376169","DOIUrl":"https://doi.org/10.1109/arftg.2007.8376169","url":null,"abstract":"","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"258 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133685901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信