TDR and S-parameters performance requirements for fault isolation and serial data applications

In this paper, we define full suite of requirements for TDR rise time and S-parameter measurement bandwidth for fault isolation and serial data applications. First, we look at the resolution requirements for fault isolation, and analyze some myths and realities surrounding the resolution issue. Then, we analyze the requirements for rise time in various serial data standards, how to determine the right rise time for a standard, and how it translates into TDR rise time requirements. Finally, we look dynamic range and frequency content of serial data signals, look at how to determine the dynamic range requirements, and how the bandwidth should be determined. Together, these analyses provide a designer with a complete set of guidelines for selection of his time and frequency domain measurements.