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2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2020-04-01 DOI: 10.1109/HICSS.2010.402
L. Henriksen, B. Schei, S. Vangen, M. Lukasse
{"title":"Title page","authors":"L. Henriksen, B. Schei, S. Vangen, M. Lukasse","doi":"10.1109/HICSS.2010.402","DOIUrl":"https://doi.org/10.1109/HICSS.2010.402","url":null,"abstract":"","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115668989","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulations of noise-parameter verification using cascade with isolator or mismatched transmission line 带隔离器级联或不匹配传输线的噪声参数验证仿真
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-30 DOI: 10.1109/ARFTG.2007.8376224
J. Randa, Ken Wong, R. Pollard
{"title":"Simulations of noise-parameter verification using cascade with isolator or mismatched transmission line","authors":"J. Randa, Ken Wong, R. Pollard","doi":"10.1109/ARFTG.2007.8376224","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376224","url":null,"abstract":"Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the device under test, or DUT) and then measuring the tandem configuration of passive device plus DUT. The results of the measurements of the tandem configuration are then compared to the predictions obtained by cascading the noise parameters and S-parameters of the two individual components. In order that the comparisons be meaningful, uncertainties are computed for both predictions and simulated measurements.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"202 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124521882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Different measurement methods for characterizing and detecting memory effects in non-linear RF power amplifiers 非线性射频功率放大器中记忆效应表征和检测的不同测量方法
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376171
Yi He, D. Mccarthy, M. Dasilva
{"title":"Different measurement methods for characterizing and detecting memory effects in non-linear RF power amplifiers","authors":"Yi He, D. Mccarthy, M. Dasilva","doi":"10.1109/ARFTG.2007.8376171","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376171","url":null,"abstract":"Memory effects exhibited in RF power amplifiers (PA) have been identified as a major source of performance degradation in modern digital communication systems. While advanced amplifier linearization schemes, such as a digital predistortion (DPD) and envelope elimination restoration, are being used to improve efficiency and linearity in modern digital communication systems, they can also expose communication networks to unwanted emissions from memory effects if not carefully designed and tested. This paper gives a brief description of origins of memory effects in RF power amplifiers. Available methods to quantify memory effects caused by such as parasitic elements are reviewed. Finally a new method based on digital phosphor display technology (DPX) on Real Time Spectrum Analyzers for detecting the presence the memory effects is introduced and its unique capabilities to perform time-correlated measurement results are presented.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116387854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A new method to characterize substrate conductivity 表征衬底电导率的新方法
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376180
D. Xiao, D. Schreurs, W. De Raedt, J. Derluyn, M. Germain, B. Nauwelaers, G. Borghs
{"title":"A new method to characterize substrate conductivity","authors":"D. Xiao, D. Schreurs, W. De Raedt, J. Derluyn, M. Germain, B. Nauwelaers, G. Borghs","doi":"10.1109/ARFTG.2007.8376180","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376180","url":null,"abstract":"Transmission line structures are traditionally used to characterize the substrate conductivity. However this method needs dedicated designed structures to characterize the substrate loss. Moreover this method can not provide the information about the conductive layer if the depth of the embedded conductive layer is unknown. To overcome this problem a new method based on the Y-parameters of an open dummy is proposed to characterize the properties of the embedded conductive layer. This proposed method only needs the open dummy which is commonly available on an RF mask design. Moreover this method can give the properties of the conductive layer independent of the depth of the embedded conductive layer.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"130 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122922931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A simple method for extreme impedances measurement 一种测量极端阻抗的简单方法
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376178
M. Randus, K. Hoffmann
{"title":"A simple method for extreme impedances measurement","authors":"M. Randus, K. Hoffmann","doi":"10.1109/ARFTG.2007.8376178","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376178","url":null,"abstract":"The paper describes a new method for measurement of extreme impedances — impedances with a magnitude of the corresponding reflection coefficient approaching unity. The proposed method employs a common vector network analyzer (VNA) with a reference impedance of 50 Ω or 75Ω The method is based on subtracting a reference reflection coefficient from a reflection coefficient of the device under test (DUT) by a 180-deg 3dB hybrid coupler. This difference is then amplified and measured by the VNA as a transmission coefficient. The method was experimentally verified in frequency band from 1.5 to 3 GHz. A corresponding calibration and correction method is suggested. Applications of the method can be expected in measurements of emerging novel microwave and THz devices based on carbon nanotubes, whose impedances are in orders of tens or hundreds of kΩ.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121610847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Using time-domain measurements to improve assessments of precision coaxial air lines as standards of impedance at microwave frequencies 使用时域测量改进作为微波频率阻抗标准的精密同轴空气线路的评估
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376225
M. Horibe, N. Ridler
{"title":"Using time-domain measurements to improve assessments of precision coaxial air lines as standards of impedance at microwave frequencies","authors":"M. Horibe, N. Ridler","doi":"10.1109/ARFTG.2007.8376225","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376225","url":null,"abstract":"This paper presents an in-depth assessment of precision coaxial air lines for use as impedance standards at RF and microwave frequencies. The assessment is based primarily on using several different types of time-domain reflection measurement options that are available on commercial Vector Network Analyzers (VNAs). The paper includes a comparison of these time-domain measurement options, made independently at the national measurement institutes of Japan and the United Kingdom. Mechanical measurements and frequency-domain measurements are also included to complete the assessment of the lines.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132956982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Utilization of waveform measurements for degradation analysis of AlGaN/GaN HFETs 波形测量在AlGaN/GaN hfet降解分析中的应用
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376173
C. Roff, J. Bennedikt, P. Tasker, D. Wallis, K. Hilton, J. O. Maclean, D. Hayes, M. Uren, T. Martin
{"title":"Utilization of waveform measurements for degradation analysis of AlGaN/GaN HFETs","authors":"C. Roff, J. Bennedikt, P. Tasker, D. Wallis, K. Hilton, J. O. Maclean, D. Hayes, M. Uren, T. Martin","doi":"10.1109/ARFTG.2007.8376173","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376173","url":null,"abstract":"This paper employs, for the first time, RF waveform engineering to monitor device degradation over an RF \"burn in\" period. Measured RF current and voltage waveforms are used to monitor the degradation effects seen in GaN HFET transistors during large signal CW RF stress testing. The technique provides extra information on device performance compared with standard RF performance measures, demonstrating clearly where on the output IV plane the degradation is occurring and allowing device designers advanced insight into the degradation mechanisms limiting RF performance.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121847180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An integrated nonlinear behavior modeling system for RF power amplifiers/transmitters 射频功率放大器/发射机集成非线性行为建模系统
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376235
Taijun Liu, S. Boumaiza, F. Ghannouchi
{"title":"An integrated nonlinear behavior modeling system for RF power amplifiers/transmitters","authors":"Taijun Liu, S. Boumaiza, F. Ghannouchi","doi":"10.1109/ARFTG.2007.8376235","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376235","url":null,"abstract":"This paper proposes an integrated nonlinear behavior modeling system for RF power amplifiers/transmitters. The system includes several sub-routines such as: a) Signal generation/acquisition module used to feed the device under test with a modulated signal and to capture its output signal. b) Modeling module that first estimate and correct for the DUT delay and then identify the parameters of a given behavioral model (reverse or forward). c) Post-processing module which includes a time-domain, frequency domain and power domain validation features. It is also compatible with system level simulation tools such as Agilent-ADS and Simulink. Different dynamic nonlinear models and a variety of model identification algorithms can be applied to build the dynamic nonlinear behavior model of the power amplifier/transmitter.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124471308","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Wireless smart temperature sensor using pulse width modulation method 无线智能温度传感器采用脉宽调制方法
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376233
Wang-Hoon Lee, Young-Tae Lee, Jong‐Wan Kim, H. Takao, K. Sawada, M. Ishida
{"title":"Wireless smart temperature sensor using pulse width modulation method","authors":"Wang-Hoon Lee, Young-Tae Lee, Jong‐Wan Kim, H. Takao, K. Sawada, M. Ishida","doi":"10.1109/ARFTG.2007.8376233","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376233","url":null,"abstract":"The wireless smart sensors have been proposed for high-risk and chronically ill patients. The radio frequency (RF) transmitter is necessary to fabricate wireless smart sensors. This paper presents wireless smart temperature sensors (WSTS) with temperature sensor and the complementary metal-oxide-semiconductor (CMOS) RF transmitter using pulse width modulation (PWM) method. The major advantage of the PWM is a performance with low consumption power. In this paper, temperature sensor was fabricated using silicon on insulator (SOI) structure, and the circuitry for the transmitter was designed and simulated. The proposed WSTS consists of temperature sensor and RF transmitter using PWM. With the WSTS using PWM method, it will be possible to perform with low power consumption.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126862164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
400-Watt Doherty amplifier linearization using optimized memory polynomials predistorter 利用优化记忆多项式预失真器对400瓦多尔蒂放大器进行线性化
2007 70th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2007-11-01 DOI: 10.1109/ARFTG.2007.8376170
M. Fares, N. Messaoudi, S. Boumaiza, J. Wood
{"title":"400-Watt Doherty amplifier linearization using optimized memory polynomials predistorter","authors":"M. Fares, N. Messaoudi, S. Boumaiza, J. Wood","doi":"10.1109/ARFTG.2007.8376170","DOIUrl":"https://doi.org/10.1109/ARFTG.2007.8376170","url":null,"abstract":"This paper deals with the optimization of the memory polynomial predistorter complexity when used to compensate the nonlinear behavior of Power Amplifier (PA) exhibiting strong memory effects. The effectiveness of memory polynomials is validated experimentally using a realistic 400-Watt Doherty high power base station amplifier lineup. The performance of the Digital Predistortion (DPD) was evaluated using realistic test signals: one, and four carrier WCDMA. The use of DPD to compensate for the distortion in Doherty Power Amplifier yielded significant increases in performance: a 100% increase in Power Added Efficiency (PAE). In addition the complexity of the memory polynomial DPD was reduced by over half, as direct results of the reduction of the number of coefficients, while maintaining good performance.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130863600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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