L. Henriksen, B. Schei, S. Vangen, M. Lukasse
{"title":"标题页","authors":"L. Henriksen, B. Schei, S. Vangen, M. Lukasse","doi":"10.1109/HICSS.2010.402","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Title page\",\"authors\":\"L. Henriksen, B. Schei, S. Vangen, M. Lukasse\",\"doi\":\"10.1109/HICSS.2010.402\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":199632,\"journal\":{\"name\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HICSS.2010.402\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HICSS.2010.402","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0