带隔离器级联或不匹配传输线的噪声参数验证仿真

J. Randa, Ken Wong, R. Pollard
{"title":"带隔离器级联或不匹配传输线的噪声参数验证仿真","authors":"J. Randa, Ken Wong, R. Pollard","doi":"10.1109/ARFTG.2007.8376224","DOIUrl":null,"url":null,"abstract":"Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the device under test, or DUT) and then measuring the tandem configuration of passive device plus DUT. The results of the measurements of the tandem configuration are then compared to the predictions obtained by cascading the noise parameters and S-parameters of the two individual components. In order that the comparisons be meaningful, uncertainties are computed for both predictions and simulated measurements.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"202 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Simulations of noise-parameter verification using cascade with isolator or mismatched transmission line\",\"authors\":\"J. Randa, Ken Wong, R. Pollard\",\"doi\":\"10.1109/ARFTG.2007.8376224\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the device under test, or DUT) and then measuring the tandem configuration of passive device plus DUT. The results of the measurements of the tandem configuration are then compared to the predictions obtained by cascading the noise parameters and S-parameters of the two individual components. In order that the comparisons be meaningful, uncertainties are computed for both predictions and simulated measurements.\",\"PeriodicalId\":199632,\"journal\":{\"name\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"202 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2007.8376224\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2007.8376224","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

给出了噪声参数测量验证过程的仿真结果。验证过程包括首先分别测量无源器件和感兴趣的放大器或晶体管(被测器件,或DUT),然后测量无源器件加DUT的串联配置。然后将串联结构的测量结果与通过级联两个单独组件的噪声参数和s参数获得的预测结果进行比较。为了使比较有意义,对预测和模拟测量都计算了不确定度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Simulations of noise-parameter verification using cascade with isolator or mismatched transmission line
Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the device under test, or DUT) and then measuring the tandem configuration of passive device plus DUT. The results of the measurements of the tandem configuration are then compared to the predictions obtained by cascading the noise parameters and S-parameters of the two individual components. In order that the comparisons be meaningful, uncertainties are computed for both predictions and simulated measurements.
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