{"title":"宽带非侵入式电压探头与LSNA应用","authors":"S. Cripps","doi":"10.1109/ARFTG.2007.8376179","DOIUrl":null,"url":null,"abstract":"A technique for measuring the real-time voltage in microwave circuits is described. The voltage probe has a flat response over wide bandwidths, making it especially useful for real time waveform measurement in circuits which use non-linear devices. The probe has excellent spatial resolution and very low intrusive coupling into the circuit under test. Applications in large signal network analysis (LSNA) and power amplifier (PA) design are reviewed.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A broadband non-intrusive voltage probe with LSNA applications\",\"authors\":\"S. Cripps\",\"doi\":\"10.1109/ARFTG.2007.8376179\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A technique for measuring the real-time voltage in microwave circuits is described. The voltage probe has a flat response over wide bandwidths, making it especially useful for real time waveform measurement in circuits which use non-linear devices. The probe has excellent spatial resolution and very low intrusive coupling into the circuit under test. Applications in large signal network analysis (LSNA) and power amplifier (PA) design are reviewed.\",\"PeriodicalId\":199632,\"journal\":{\"name\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2007.8376179\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2007.8376179","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A broadband non-intrusive voltage probe with LSNA applications
A technique for measuring the real-time voltage in microwave circuits is described. The voltage probe has a flat response over wide bandwidths, making it especially useful for real time waveform measurement in circuits which use non-linear devices. The probe has excellent spatial resolution and very low intrusive coupling into the circuit under test. Applications in large signal network analysis (LSNA) and power amplifier (PA) design are reviewed.