Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).最新文献_第4页

An analytic software testability model 分析软件可测试性模型

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181724

Jin-Cherng Lin, Szu-Wen Lin

引用次数: 14

Design for two-pattern testability of controller-data path circuits 控制器-数据路径电路双模式可测试性设计

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181689

Atlaf Ul Amin, S. Ohtake, H. Fujiwara

引用次数: 3

Extending EDA environment from design to test 将EDA环境从设计扩展到测试

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181742

R. Rajsuman

引用次数: 4

A scheduling method in high-level synthesis for acyclic partial scan design 非循环部分扫描设计的高级综合调度方法

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181699

Tomoo Inoue, T. Miura, A. Tamura, H. Fujiwara

引用次数: 1

Easily testable and fault-tolerant design of FFT butterfly networks 易于测试和容错的FFT蝴蝶网络设计

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181716

Shyue-Kung Lu, Chien-Hung Yeh

引用次数: 2

Hierarchical fault simulation using behavioral and gate level hardware models 使用行为和门级硬件模型的分层故障仿真

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181740

S. Mirkhani, Meisam Lavasani, Z. Navabi

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引用次数: 19

Improving the efficiency of static compaction based on chronological order enumeration of test sequences [logic testing] 基于时间顺序枚举测试序列提高静态压缩效率[逻辑测试]

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181686

I. Pomeranz, S. Reddy

{"title":"Improving the efficiency of static compaction based on chronological order enumeration of test sequences [logic testing]","authors":"I. Pomeranz, S. Reddy","doi":"10.1109/ATS.2002.1181686","DOIUrl":"https://doi.org/10.1109/ATS.2002.1181686","url":null,"abstract":"Chronological order enumeration is a static compaction procedure for synchronous sequential circuits that to-date produces the shortest test sequences overall for benchmark circuits. The chronological order enumeration procedure was not meant to compete in computational complexity with the highly-efficient restoration based compaction procedure. Rather, it was developed so as to provide a more aggressive target for static and dynamic test compaction procedures. Nevertheless, we describe in this work several algorithmic methods to improve the efficiency of compaction based on chronological order enumeration. These improvements reduce the run time of chronological order enumeration significantly using the same basic implementation. With these improvements, chronological order enumeration is shown to be faster and more effective than restoration based compaction for sequences produced by an ATPG that already uses restoration based compaction as part of the test generation process. For uncompacted sequences, restoration based compaction followed by the improved chronological order enumeration process is shown to be an effective combination.","PeriodicalId":199542,"journal":{"name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","volume":"76 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120841700","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Fault detection and fault diagnosis techniques for lookup table FPGAs 查找表fpga的故障检测与故障诊断技术

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181717

Shyue-Kung Lu, Chung-Yang Chen

引用次数: 14

A simple wrapped core linking module for SoC test access 一个简单的封装核心链接模块SoC测试访问

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181735

Jaehoon Song, Sungju Park

引用次数: 3

Robust space compaction of test responses 测试响应的鲁棒空间压缩

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI: 10.1109/ATS.2002.1181720

A. Dmitriev, M. Gössel, K. Chakrabarty

引用次数: 0