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Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts最新文献

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Fretting damage in tin-plated aluminum and copper connectors 镀锡铝和铜连接器的微动损坏
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/33.31426
M. Braunovic
{"title":"Fretting damage in tin-plated aluminum and copper connectors","authors":"M. Braunovic","doi":"10.1109/33.31426","DOIUrl":"https://doi.org/10.1109/33.31426","url":null,"abstract":"A number of bolted-type tin-plated aluminum and copper connectors commonly used for distribution transformers were examined using scanning electron microscopy, energy-dispersive X-ray analysis, Auger electron spectroscopy, X-ray analysis, and optical microscopy. In addition, the contact resistance of the connector contact zones was measured using a point probe. The connectors studied had been removed from service because of unsatisfactory performance under normal operating conditions as manifested either by overheating or instability. The results of the detailed examination show the presence of extensive fretting damage in the contacting surfaces. The fretting debris was composed mainly of tin oxide and oxidized base metal particles. Localized melting and wear of the tin plating down to the underlying substrate were also observed in some of the connectors examined.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"271 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134009324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 32
Conduction through surface films on aluminum wire 通过铝线表面膜传导
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16113
J. Aronstein, T. Hare
{"title":"Conduction through surface films on aluminum wire","authors":"J. Aronstein, T. Hare","doi":"10.1109/HOLM.1988.16113","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16113","url":null,"abstract":"Conduction through undisturbed surface films on commercial aluminum wire is experimentally evaluated by establishing an area of contact on the wire surface without applying mechanical pressure, using a conductive silver epoxy. The measurements indicate the film conduction is substantially higher than has been estimated on the basis of the properties of pure aluminum oxide. Using applied electrical conditions similar to those of building wire applications, the potential drop is measured to be the same magnitude as is observed in failing aluminum wire connections. The results show that the behavior of failing aluminum connections can be accounted for by the conduction and breakdown properties of the surface film, in the absence of mechanically induced metallic asperity junctions.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116812411","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Limiting design parameters for future high speed, high current density sliding electrical contacts 未来高速、高电流密度滑动电触点的限制设计参数
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16123
H. Rylander, J. Gully, Z. Eliezer
{"title":"Limiting design parameters for future high speed, high current density sliding electrical contacts","authors":"H. Rylander, J. Gully, Z. Eliezer","doi":"10.1109/HOLM.1988.16123","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16123","url":null,"abstract":"Summary form only given. Most sliding contact designs are limited by a combination of electrical heating and sliding friction which produces an intense heat release in the small volume at the brush-rotor interface, thereby reaching upper temperature limits of concurrently available materials in a short time. As the brush temperature increases, wear increases rapidly while brush performance deteriorates. The authors describe a new consolidation method now being developed that uses an electrical high-energy/high-rate consolidation process for the manufacture of such high-temperature tribological materials. For copper-graphite, the high-current consolidation process induces local melting of the copper powder, resulting in a very high degree of geometrical conformability. At the same time, the short holding time at high temperature reduces the problems of oxidation at the copper-graphite interface.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121721681","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design and calibration of appropriate connector qualification/reliability tests 设计和校准适当的连接器资格/可靠性测试
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16097
E. S. Sproles
{"title":"Design and calibration of appropriate connector qualification/reliability tests","authors":"E. S. Sproles","doi":"10.1109/HOLM.1988.16097","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16097","url":null,"abstract":"Summary form only given. Timely development of information on connector reliability requires development of calibrated, relevant laboratory tests. Development of such tests for connectors requires an understanding of the failure mechanisms active in a connector system. It is the goal of the test designer to think of all the things that might go wrong with the connector, and to design and calibrate appropriate tests to quantify their impact on the connector. Clearly, this problem is so complex that this goal is rarely achieved, and any practical test program will always include some arbitrariness. The author presents what is known about a number of failure mechanisms and discusses how to develop a rational test program to evaluate connector performance.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123680359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Arc mobility on new and eroded Ag/CdO and Ag/SnO2 contacts 新的和侵蚀的Ag/CdO和Ag/SnO2触点上的电弧迁移率
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/holm.1988.16093
H. Manhart, W. Reider, C. Veit
{"title":"Arc mobility on new and eroded Ag/CdO and Ag/SnO2 contacts","authors":"H. Manhart, W. Reider, C. Veit","doi":"10.1109/holm.1988.16093","DOIUrl":"https://doi.org/10.1109/holm.1988.16093","url":null,"abstract":"The mobility of break arcs in a magnetic blast-field was investigated in both a model switch and a commercial contactor. After contact separation, three arc motion phenomena were measured independently: initial reduced arc motion (immobility and creeping), subsequent running, and final commutation from the contacts to the arc runners. Contacts made from Ag/CdO and from Ag/SnO/sub 2/ were compared in both new and eroded states. The results of erosion measurements under various stress conditions were consistent with the mobility phenomena observed.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125074770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Materials for sliding contacts in the twenty-first century 二十一世纪的滑动触点材料
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16126
R. A. Burton
{"title":"Materials for sliding contacts in the twenty-first century","authors":"R. A. Burton","doi":"10.1109/HOLM.1988.16126","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16126","url":null,"abstract":"Summary form only given. The author discusses ceramic superconductors, low-temperature formation of ceramics, organic conductors, nanometer-scale composites, and ultralow-wear solids in terms of their potential uses in the field of sliding electrical contacts. For electrical contacts he suggests the possibility of high-lubricity, high-conductivity current collectors molded as a unit with supports, braids, and springs in low-cost reliable assemblies for small motors and a variety of control and information transfer sliprings. He notes that superconductors, and especially the high-temperature ceramic ones, represent a national technological thrust. These conductive ceramics possess structural stability, hardness, and strength. Sol-gel, pyrolysis, and other low-temperature techniques for forming inorganic solids offer the chance to tailor brushes with built-in lubricant, conductors, and reinforcement.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"s1-7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127197607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An analysis of field failure of passive and active components, including connectors 无源和有源元件(包括连接器)的现场故障分析
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16098
D. Campbell
{"title":"An analysis of field failure of passive and active components, including connectors","authors":"D. Campbell","doi":"10.1109/HOLM.1988.16098","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16098","url":null,"abstract":"Summary form only given, as follows. The author briefly describes current work on establishing and running an organization for the collection and analysis of field-failure data on passive and active components in electronic equipment. The data collection is described and the essential features are noted of the data format that is being used. Data have now been collected from all the sources for nearly two years, and the results obtained are presented. Statistical analysis covering three major areas is discussed. They are: the establishment of a field-failure hierarchy showing which components caused the most problems in equipment; analysis of the effect of specific aspects of the component usage on the failure rates observed; and detailed examination of the data supplied to determine possible failure of components due to faults in circuit design. Connectors are also discussed where appropriate.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129625784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Field experience and long-term stability of high current contacts 现场经验和长期稳定的大电流触点
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16112
Karl-Erik Olsson, A. Oberg
{"title":"Field experience and long-term stability of high current contacts","authors":"Karl-Erik Olsson, A. Oberg","doi":"10.1109/HOLM.1988.16112","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16112","url":null,"abstract":"A large number of static electrical contacts were investigated with respect to their long-term stability of contact resistance. The contacts studied were of two types: (1) an aluminum to aluminum busbar contact, and (2) an aluminium to nickel-plated-copper clamped contact. Both contact types were subjected to the same electrical load: 500-1000 A, RMS. The contacts were operated in an indoor environment. Investigations of the contacts were made annually 8-11 years after commissioning. The contact resistances were recorded and treated statistically. It was found that the type (1) contacts were stable, whereas the type (2) contacts showed a significantly increasing contact resistance. In addition, metallographic investigations were performed on selected contacts. Correlations were found between the contact resistance value and the extent of material deterioration at the contact surface.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126288679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The porosity of gold plating by dust contamination 镀金孔隙度受粉尘污染
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16132
Zhang Ji-gao, Zhou Ka-Da, Du Chang-Xiu
{"title":"The porosity of gold plating by dust contamination","authors":"Zhang Ji-gao, Zhou Ka-Da, Du Chang-Xiu","doi":"10.1109/HOLM.1988.16132","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16132","url":null,"abstract":"The porosity of electric contacts caused by dust contamination during gold plating was much more serious than that caused by simply a roughness of the substrate. Nevertheless, experimental results showed that even when plating on a dusty substrate, porosity was still closely related to the substrate roughness. Dust contamination on rougher substrates produced larger numbers of pores. Pores caused during gold plating were inspected by both scanning electron microscopy and X-ray energy spectrometry. Silicon and aluminium, as well as other elements of dust particles found in the pores, showed the existence of dust contamination on the substrate. Various chemical and ultrasonic cleaning methods were tested in an attempt to improve the plating quality and to reduce pore formation at the contacts. It was found that ultrasonic cleaning in acetone for more than 20 minutes is necessary for reducing porosity and increasing the sliding duration.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115346534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
The effect of high temperature on the release of heavy metals from AgCdO and AgSnO2 contacts 高温对AgCdO和AgSnO2触点重金属释放的影响
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/holm.1988.16090
P. Slade
{"title":"The effect of high temperature on the release of heavy metals from AgCdO and AgSnO2 contacts","authors":"P. Slade","doi":"10.1109/holm.1988.16090","DOIUrl":"https://doi.org/10.1109/holm.1988.16090","url":null,"abstract":"An experiment was undertaken to study the release of heavy metals from AgCdO and AgSnO/sub 2/ contacts when they were subjected to high temperatures similar to those that would occur in a fire. Samples of AgCdO ( approximately 15 wt.% CdO) and AgSnO/sub 2/ ( approximately 15 wt.% SnO/sub 2/) were placed in a furnace and heated for 1 h at temperatures ranging from 800 degrees C to 1240 degrees C. The contact mass loss was measured at each temperature and the material evolved from the contacts was captured and analyzed using ESCA analysis. Cadmium was released from the AgCdO contact samples, but even at the highest temperature (1240 degrees C) only 8% of the original Cd was lost from the contact. In the case of AgSnO/sub 2/ no Sn was released, but a very small amount of Ag was captured from the heated contacts. The major conclusion is that, unless these contact materials were directly exposed to hot flames for long periods of time, very little heavy metal would be released into the environment during a fire.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128136131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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