{"title":"设计和校准适当的连接器资格/可靠性测试","authors":"E. S. Sproles","doi":"10.1109/HOLM.1988.16097","DOIUrl":null,"url":null,"abstract":"Summary form only given. Timely development of information on connector reliability requires development of calibrated, relevant laboratory tests. Development of such tests for connectors requires an understanding of the failure mechanisms active in a connector system. It is the goal of the test designer to think of all the things that might go wrong with the connector, and to design and calibrate appropriate tests to quantify their impact on the connector. Clearly, this problem is so complex that this goal is rarely achieved, and any practical test program will always include some arbitrariness. The author presents what is known about a number of failure mechanisms and discusses how to develop a rational test program to evaluate connector performance.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design and calibration of appropriate connector qualification/reliability tests\",\"authors\":\"E. S. Sproles\",\"doi\":\"10.1109/HOLM.1988.16097\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Summary form only given. Timely development of information on connector reliability requires development of calibrated, relevant laboratory tests. Development of such tests for connectors requires an understanding of the failure mechanisms active in a connector system. It is the goal of the test designer to think of all the things that might go wrong with the connector, and to design and calibrate appropriate tests to quantify their impact on the connector. Clearly, this problem is so complex that this goal is rarely achieved, and any practical test program will always include some arbitrariness. The author presents what is known about a number of failure mechanisms and discusses how to develop a rational test program to evaluate connector performance.<<ETX>>\",\"PeriodicalId\":191800,\"journal\":{\"name\":\"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.1988.16097\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1988.16097","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design and calibration of appropriate connector qualification/reliability tests
Summary form only given. Timely development of information on connector reliability requires development of calibrated, relevant laboratory tests. Development of such tests for connectors requires an understanding of the failure mechanisms active in a connector system. It is the goal of the test designer to think of all the things that might go wrong with the connector, and to design and calibrate appropriate tests to quantify their impact on the connector. Clearly, this problem is so complex that this goal is rarely achieved, and any practical test program will always include some arbitrariness. The author presents what is known about a number of failure mechanisms and discusses how to develop a rational test program to evaluate connector performance.<>