Albert Álvarez-Carulla, J. Colomer-Farrarons, J. López-Sánchez, P. Miribel-Català
{"title":"Piezoelectric harvester-based self-powered adaptive circuit with wireless data transmission capability for structural health monitoring","authors":"Albert Álvarez-Carulla, J. Colomer-Farrarons, J. López-Sánchez, P. Miribel-Català","doi":"10.1109/DCIS.2015.7388594","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388594","url":null,"abstract":"A novel piezoelectric harvester-based self-powered adaptive solution with wireless data transmission capability for structural health monitoring is presented. This work demonstrates the accomplishment of maximum power transferred condition for a wide range load conditions and for different amplitudes and frequencies oscillation of the piezoelectric transducer. The characterization of the wireless transmission of temperature and open voltage circuit of the piezoelectric transducer is also presented to support the use of this solution as a wireless self-powered adaptive structural health monitor solution.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126156661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Leong, J. Semião, M. Santos, I. Teixeira, J. P. Teixeira, A. Batista, B. Gonçalves, J. Marques
{"title":"Fast radiation monitoring in FPGA-based designs","authors":"C. Leong, J. Semião, M. Santos, I. Teixeira, J. P. Teixeira, A. Batista, B. Gonçalves, J. Marques","doi":"10.1109/DCIS.2015.7388590","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388590","url":null,"abstract":"In nanoscale FPGAs, variability, aging and radiation effects significantly limit system performance and reliability, which is a relevant problem in safety-critical applications associated with long life operation products. The impact of Single Event Upsets (SEU) on system correct operation is usually estimated by the FPGA vendor. In this paper a technique for fast radiation monitoring, taking aging effects into account is proposed for FPGA-based designs. In order to monitor SEU in memory, a novel SEU sensor is proposed, reusing BRAM resources to estimate the Soft Error Rate (SER). The proposed BRAM-based sensor allows a much faster evaluation of radiation effects than the one obtained with traditional monitoring such as monitoring of the FPGA configuration memory. Simultaneous use of aging and SEU sensors enables the activation of mitigation techniques, e.g., circuit reconfiguration for a more robust functionality. Simulation and experimental results are presented, using Virtex6 and Spartan6 boards and two real-world applications - a data acquisition system for PET-based medical imaging, and a fast plant system controller for the ITER reactor. Neutron radiation tests were performed- in the Portuguese Research Reactor (RPI).","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116757542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"DC-DC converter power stage with cascoded transistors and automatic dead time generation","authors":"I. Filanovsky, J. Jarvenhaara, N. Tchamov","doi":"10.1109/DCIS.2015.7388560","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388560","url":null,"abstract":"The paper presents a cascoded power stage with automatic dead time generation. The circuit is using the inter-transistor node voltages of the cascode configuration as feedback control signals to delay turning ON the power transistors. The circuit is designed as the output stage of a fully-integrated buck converter. The steady-state operation is described. The waveforms simulated on 45-nm CMOS process show that in steady-state operation the short-circuit path and body diode conductions are avoided while effective zero-voltage switching (ZVS) are provided both for ground and power supply line; the calculated dead times are in a good agreement with simulation results.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122596059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Mateos-Angulo, D. Mayor-Duarte, S. Khemchandani, J. del Pino
{"title":"A low-power fully integrated CMOS RF receiver for 2.4-GHz-band IEEE 802.15.4 standard","authors":"S. Mateos-Angulo, D. Mayor-Duarte, S. Khemchandani, J. del Pino","doi":"10.1109/DCIS.2015.7388563","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388563","url":null,"abstract":"This paper presents a low power 2.4 GHz receiver front-end for 2.4-GHz-band IEEE 802.15.4 standard in 0.18 μm CMOS technology. This receiver adopts a low-IF architecture and comprises a variable gain single-ended low-noise amplifier (LNA), a quadrature passive mixer, a variable gain transimpedance amplifier (TIA) and a complex filter for image rejection. The receiver front-end achieves 42 dB voltage conversion gain, 10.3 dB noise figure (NF), 28 dBc image rejection and -5 dBm input third-order intercept point (IIP3). It only consumes 5.5 mW.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133276296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Compact wide-range sinusoidal signal generator for in vivo Impedance Spectroscopy","authors":"M. Nawito, H. Richter, J. Burghartz","doi":"10.1109/DCIS.2015.7388593","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388593","url":null,"abstract":"This work presents a compact wide-range fully integrated sinusoidal signal generator for in vivo Electrochemical Impedance Spectroscopy applications. The circuit is based on a novel architecture combining aspects of direct digital synthesis and interpolation digital to analog conversion. The signal generator demonstrates very precise frequency tuning and high spectral purity, while offering a simple architecture and an uncomplicated clocking scheme. The circuit is fabricated using a 0.5μm sea of transistors CMOS process and occupies 0.32mm2 of active die area. Consuming 110μA at a 3V supply, the circuit covers eight decades of frequency from 1mHz to 100kHz and meets the necessary low energy and high precision requirements for implantable bio-diagnostics.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129922444","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Abelardo Baez Quevedo, G. Callicó, S. López, J. López, R. Sarmiento, Alejandro Nicolás, P. Sánchez, E. Villar
{"title":"System level methodology based on VIPPE applied to the implementation of a scalable video decoder on the ZynQ platform","authors":"Abelardo Baez Quevedo, G. Callicó, S. López, J. López, R. Sarmiento, Alejandro Nicolás, P. Sánchez, E. Villar","doi":"10.1109/DCIS.2015.7388604","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388604","url":null,"abstract":"One of the first problems that a hardware designer needs to solve when facing a new and complex electronic design, is to know in advance where the critical parts of the design are, and how many resources the design will require. This information will ease the developing of feasible systems and will help in the design of well suited architectures. The Open SVC (Scalable Video Coding) Decoder (OSD) is an open source system created at IETR/INSA at Rennes that implements a SV decoder written in language. The scalable video encoder supposes an important overload compared with its counterpart non-scalable video encoder, which inherently already exhibits a very high computational load. Due to the huge number of functions that form part of the SV video decoder, a set of internal modules that better describes the internal structure of the decoder has been defined. In this scenario, two aspects have been selected to be the critical ones: the computational load and the transaction of data. In order to adopt appropriate decisions related with the system implementation.. This paper presents a methodology based on VIPPE that will be used to perform the profiling of a complex system like the OSD over a user-defined platform, the ZynQ from Xilinx in this case, composed by two ARM cores and an FPGA. The profiling results will guided the implementation of the OSD on the aforementioned ZynQ platform. The methodology can be easily extrapolated to any other complex design.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125847163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Interconnection coupling on lightly doped substrate for millimeter wave frequencies","authors":"V. Gerakis, A. Hatzopoulos","doi":"10.1109/DCIS.2015.7388559","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388559","url":null,"abstract":"A study of the impact of metal guard rings on the coupling between two interconnects is presented. The structure is designed over a bulk silicon substrate with epitaxial layer, so the coupling through the substrate is also involved. A lightly doped profile is adopted and is simulated by means of an electromagnetic simulator for various interconnects' distances and different metal layers, assuming a 65 nm bulk CMOS technology. The impact of various guard ring design (geometrical) parameters is examined. Furthermore, the increase of isolation (resulting in reduction of the noise coupling) between interconnects by cutting the guard rings, or by using multiple rings, is also analyzed. S parameters are used to compare the various structures.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124165375","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Igor Villalta, U. Bidarte, Julen Gomez-Cornejo, Jesús Lázaro, C. Cuadrado
{"title":"Dependability in FPGAs, a Review","authors":"Igor Villalta, U. Bidarte, Julen Gomez-Cornejo, Jesús Lázaro, C. Cuadrado","doi":"10.1109/DCIS.2015.7388570","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388570","url":null,"abstract":"Field Programmable Gate Arrays (FPGAs) are commonly used in safety-critical and mission-critical systems. In these applications failures are unacceptable, since they can lead to people injured or huge economical losses. Due to Moore's law and the continuous size reduction, electronic devices are able to perform more and more complex functionalities. However, they are becoming more and more vulnerable to radiation. Single event effects (SEE) are the major reliability concern in FPGAs, which are the effects provoked by radiation particles. Dependability has to be addressed at all stages of the system lifecycle, from design to decommissioning, in order to meet the dependability requirements. Since dependability issues have been observed in electronic systems, several dependability mechanisms have been developed. This work makes a review on the existing mechanisms necessary to obtain a dependable system and divides them in four groups; fault prevention, fault tolerance, fault removal and fault forecasting.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133987894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Defeating Simple Power Analysis attacks in cache memories","authors":"M. Neagu, L. Miclea, S. Manich","doi":"10.1109/DCIS.2015.7388557","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388557","url":null,"abstract":"A wide range of attacks that target cache memories in secure systems have been reported in the last half decade. Cold-boot attacks can be thwarted through the recently proposed Interleaved Scrambling Technique (IST). However, side channel attacks like the Simple Power Analysis (SPA) can still circumvent this protection. Error detection and correction codes (EDC/ECC) are employed in memories to increase reliability, but they can also be used to increase the security. This paper proposes to boost the IST with an ECC code in order to create a cache resistant against SPA-attacks. The redundancy provided by the ECC code is used to create confusion by enlarging the search space where the hacker has to look for to find the secret keys.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134284122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Morales, E. Castillo, L. Parrilla, A. García, A. Otín
{"title":"Towards Project-Based Learning applied to the Electronic Engineering studies","authors":"D. Morales, E. Castillo, L. Parrilla, A. García, A. Otín","doi":"10.1109/DCIS.2015.7388615","DOIUrl":"https://doi.org/10.1109/DCIS.2015.7388615","url":null,"abstract":"During the last course of grade studies the use of learning techniques encouraging the team-working and autonomy is the desirable paradigm. Project-Based Learning (PBL) is the currently most-favored pedagogical model for achieving these objectives in electrical engineering studies. In this context we proposed the PBL for an optional subject taught on the last course of Industrial Electronic Engineering degree, entitled “Circuits and electronic systems for biomedical applications”. At the beginning of the course the instructor proposes different micro projects that the students have to develop during the course. This approach allows carrying out an evaluation of the competences in a continuous and personalized way. The experience of this pedagogical model shows that students can confront and solve unforeseen problems that enhance the expected skills for an electrical engineer.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127588568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}