Igor Villalta, U. Bidarte, Julen Gomez-Cornejo, Jesús Lázaro, C. Cuadrado
{"title":"fpga的可靠性综述","authors":"Igor Villalta, U. Bidarte, Julen Gomez-Cornejo, Jesús Lázaro, C. Cuadrado","doi":"10.1109/DCIS.2015.7388570","DOIUrl":null,"url":null,"abstract":"Field Programmable Gate Arrays (FPGAs) are commonly used in safety-critical and mission-critical systems. In these applications failures are unacceptable, since they can lead to people injured or huge economical losses. Due to Moore's law and the continuous size reduction, electronic devices are able to perform more and more complex functionalities. However, they are becoming more and more vulnerable to radiation. Single event effects (SEE) are the major reliability concern in FPGAs, which are the effects provoked by radiation particles. Dependability has to be addressed at all stages of the system lifecycle, from design to decommissioning, in order to meet the dependability requirements. Since dependability issues have been observed in electronic systems, several dependability mechanisms have been developed. This work makes a review on the existing mechanisms necessary to obtain a dependable system and divides them in four groups; fault prevention, fault tolerance, fault removal and fault forecasting.","PeriodicalId":191482,"journal":{"name":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Dependability in FPGAs, a Review\",\"authors\":\"Igor Villalta, U. Bidarte, Julen Gomez-Cornejo, Jesús Lázaro, C. Cuadrado\",\"doi\":\"10.1109/DCIS.2015.7388570\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Field Programmable Gate Arrays (FPGAs) are commonly used in safety-critical and mission-critical systems. In these applications failures are unacceptable, since they can lead to people injured or huge economical losses. Due to Moore's law and the continuous size reduction, electronic devices are able to perform more and more complex functionalities. However, they are becoming more and more vulnerable to radiation. Single event effects (SEE) are the major reliability concern in FPGAs, which are the effects provoked by radiation particles. Dependability has to be addressed at all stages of the system lifecycle, from design to decommissioning, in order to meet the dependability requirements. Since dependability issues have been observed in electronic systems, several dependability mechanisms have been developed. This work makes a review on the existing mechanisms necessary to obtain a dependable system and divides them in four groups; fault prevention, fault tolerance, fault removal and fault forecasting.\",\"PeriodicalId\":191482,\"journal\":{\"name\":\"2015 Conference on Design of Circuits and Integrated Systems (DCIS)\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 Conference on Design of Circuits and Integrated Systems (DCIS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DCIS.2015.7388570\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Conference on Design of Circuits and Integrated Systems (DCIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DCIS.2015.7388570","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Field Programmable Gate Arrays (FPGAs) are commonly used in safety-critical and mission-critical systems. In these applications failures are unacceptable, since they can lead to people injured or huge economical losses. Due to Moore's law and the continuous size reduction, electronic devices are able to perform more and more complex functionalities. However, they are becoming more and more vulnerable to radiation. Single event effects (SEE) are the major reliability concern in FPGAs, which are the effects provoked by radiation particles. Dependability has to be addressed at all stages of the system lifecycle, from design to decommissioning, in order to meet the dependability requirements. Since dependability issues have been observed in electronic systems, several dependability mechanisms have been developed. This work makes a review on the existing mechanisms necessary to obtain a dependable system and divides them in four groups; fault prevention, fault tolerance, fault removal and fault forecasting.