Dependability in FPGAs, a Review

Igor Villalta, U. Bidarte, Julen Gomez-Cornejo, Jesús Lázaro, C. Cuadrado
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引用次数: 6

Abstract

Field Programmable Gate Arrays (FPGAs) are commonly used in safety-critical and mission-critical systems. In these applications failures are unacceptable, since they can lead to people injured or huge economical losses. Due to Moore's law and the continuous size reduction, electronic devices are able to perform more and more complex functionalities. However, they are becoming more and more vulnerable to radiation. Single event effects (SEE) are the major reliability concern in FPGAs, which are the effects provoked by radiation particles. Dependability has to be addressed at all stages of the system lifecycle, from design to decommissioning, in order to meet the dependability requirements. Since dependability issues have been observed in electronic systems, several dependability mechanisms have been developed. This work makes a review on the existing mechanisms necessary to obtain a dependable system and divides them in four groups; fault prevention, fault tolerance, fault removal and fault forecasting.
fpga的可靠性综述
现场可编程门阵列(fpga)通常用于安全关键型和任务关键型系统。在这些应用中,失败是不可接受的,因为它们可能导致人员受伤或巨大的经济损失。由于摩尔定律和不断缩小的尺寸,电子设备能够执行越来越复杂的功能。然而,它们越来越容易受到辐射的影响。单事件效应(SEE)是fpga中主要的可靠性问题,它是由辐射粒子引起的效应。为了满足可靠性要求,必须在系统生命周期的所有阶段(从设计到退役)都解决可靠性问题。由于在电子系统中已经观察到可靠性问题,因此已经开发了几种可靠性机制。这项工作对获得可靠系统所需的现有机制进行了审查,并将其分为四组;故障预防、故障容错、故障排除和故障预测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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