International Symposium on Laser Metrology最新文献_第9页

Structure measurement of phase grating on post-magnification digital micro-holography 后放大数字显微全息相位光栅的结构测量

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814508

Wenjing Zhou, Yingjie Yu, A. Asundi

引用次数: 0

The effects of post-annealing on pulse laser deposition of Zr0.8Sn0.2TiO4thin film on Si(100) 后退火对脉冲激光沉积zr0.8 sn0.2 tio4薄膜在Si(100)上的影响

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814587

C. Chuang, M. Shih, M. Weng

引用次数: 0

A path planning method for large-scale blade profile measurement based on neutral network 基于神经网络的大型叶片型线测量路径规划方法

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814566

Fei Zhang, Zhuangde Jiang, Jianjun Ding, Bing Li, Lei Chen

{"title":"A path planning method for large-scale blade profile measurement based on neutral network","authors":"Fei Zhang, Zhuangde Jiang, Jianjun Ding, Bing Li, Lei Chen","doi":"10.1117/12.814566","DOIUrl":"https://doi.org/10.1117/12.814566","url":null,"abstract":"For solving the problem of programming measurement path when inspecting Blade Profile, and improving the efficiency and precision, the self-adaptive dynamic path planning model of blade profile measurement is proposed, using Back Propagation Neutral Network, based on the blade measuring characteristic and non-contact measurement system of blade profile detecting in laser triangular principle. For the feature of blade profile measuring, with the factors affecting the Probe precision and efficiency (the range of depth of field, incident angle), we plan the probe position of next measurement point by selecting 3 layer BP networks of , using practically measured blade profile as Training Sample, and regarding probe coordinates of corresponding profile measuring point as networks input. This paper discusses and explains the factors affecting measurement path planning, the creating and training of the BP networks profile measurement path planning in details. Because of the use of Neural Network learning the ability of approximating nonlinear mapping in any precision and the application of regarding blade profile data as BP network training sample, measuring movement path can combine with the blade curvature variation closely. Then, practically measuring precision and efficiency are improved, and the Path Planning problem is solved, brought by curvature varying greatly of blade profile in large blade profile measurement. At last, a group of experimental data is given, and the results of experiment are analyzed in detail.","PeriodicalId":191475,"journal":{"name":"International Symposium on Laser Metrology","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126821511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Adaptive confocal system for 3-D profiling 三维轮廓的自适应共聚焦系统

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814569

R. K., Vernon Jialiang Shen, Amitava Talukdar, A. Asundi

引用次数: 0

A hybrid x-ray and microscopy method for diametrical profile measurement of internal holes in steel components 一种用于钢构件内孔直径轮廓测量的x射线和显微镜混合方法

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814550

T. Liu, A. Malcolm, X. M. Yin, S. J. Liew, T. Prawiradiraja

{"title":"A hybrid x-ray and microscopy method for diametrical profile measurement of internal holes in steel components","authors":"T. Liu, A. Malcolm, X. M. Yin, S. J. Liew, T. Prawiradiraja","doi":"10.1117/12.814550","DOIUrl":"https://doi.org/10.1117/12.814550","url":null,"abstract":"High-resolution X-ray is now an essential tool for internal defect and structure inspection in electronics and advanced materials industry. However, it is always a challenge to use it for accurate dimensional measurement due to the nature of the fan-beam X-ray source, particularly for cylindrical objects. This paper presents a novel hybrid X-ray and microscopy method for the profile measurement of the internal hole of a cylinder-shaped steel component. The part to be measured has a beer bottle shape but is open at the bottom side. The objective is to measure the diametrical profile of the internal hole with an accuracy of about 10μm. Traditionally this is measured with using a microscope after cutting and polishing the specimen. This is not only a tedious work, but is also inaccurate due to the uncertainty in cutting and polishing. This report demonstrates that the two edge-profiles of the internal hole can be obtained with X-ray inspection by sequentially placing each of them at the central of the X-ray beam so that the fan-beam effect can be minimized. The resolution of the X-ray inspection is about 6µm under a 20x magnification. Subsequently, the diameter of the hole is measured at two positions through the open end using a microscope with a 20x and a 10x objectives respectively. The results obtained with the two methods are then combined to generate the whole diametrical profile of the internal hole.","PeriodicalId":191475,"journal":{"name":"International Symposium on Laser Metrology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130112349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Application research of spectrum measurement technology in thin-film thickness wideband monitoring system 频谱测量技术在薄膜厚度宽带监测系统中的应用研究

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814620

Jun Han, Xiao-yan Shang, Yu-ying An, Xu Jiang, F. Wang

{"title":"Application research of spectrum measurement technology in thin-film thickness wideband monitoring system","authors":"Jun Han, Xiao-yan Shang, Yu-ying An, Xu Jiang, F. Wang","doi":"10.1117/12.814620","DOIUrl":"https://doi.org/10.1117/12.814620","url":null,"abstract":"The correct monitoring of thin-film thickness is one of the main problems during the course of optical thin-film component manufacture, in recent years, the method which is spectrum intensity measurement of thin-film component for controlling thin-film thickness has been one of the most effective methods. When this method is used Chow spectrum intensity is real-time, correctly measured is critical. Compared with the conventional method which is mechanical scanning by stepper motor driving the grating of monochromator and receiving by photoelectrical multiplier tube, in structure, the author combines the grating spectrometer with the linear CCD, which makes the problem of spectrum intensity real-time measurement better solved, the result is satisfied. In this paper, the structure of system affecting the spectrum intensity measurement accuracy is analyzed, By experiment, the relative parameters are determined, the spectrum wavelength is calibrated, root-mean-square error is 0.234nm, which is up to the requirement of monitoring wavelength resolution in the course of thin-film deposition; The algorithm is used for the real-time compensation of spectrum intensity measurement data, which make the effect of CCD photoelectrical response non-uniformity and nonlinear less; By changing the integral time magnitude, the rate of signal to noise of the spectrum signal is improved, it satisfies the requirement of real-time thin film thickness control.","PeriodicalId":191475,"journal":{"name":"International Symposium on Laser Metrology","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131517607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Study on measurement method for projectile location based on light screen 基于光幕的弹丸定位测量方法研究

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814594

F. Han, Qunhua Liu, Guobin Sun

{"title":"Study on measurement method for projectile location based on light screen","authors":"F. Han, Qunhua Liu, Guobin Sun","doi":"10.1117/12.814594","DOIUrl":"https://doi.org/10.1117/12.814594","url":null,"abstract":"In weapon-ammunition system, firing accuracy of projectile is major characteristic parameter weighing fire effect and capability of weapon-ammunition system for target. At present, firing accuracy of projectile is obtained by measuring the two-dimensional coordinates of projectile for target. In order to measure the parameters of two-dimensional coordinates of projectile for target, a new type of measurement system is proposed. The measurement system is composed of four high sensitivity light screens (known as target) with special geometrical frame. Light source of the screens is formed by special infrared LED array. The PIN infrared photodiodes array is used as the sensors. The longest effective distance between light source and sensors is 4m. It is impossible to achieve using traditional methods. Four light screens and high-precision timers are combined in order to acquire the value of time when the projectile flies across the position of four light screens. The real-time data acquirement and processing and display of two-dimensional coordinates and the projectile velocity can be realized. The principle of measurement system and the design of high sensitivity light screen are introduced emphatically. The measurement system was verified by using five kinds of small caliber pellets. As compared with the paper target sheet, the measurement system designed can meet the demand of check-up test of gun, bullet and ammunition. The firing testing in the target field has proved that the measurement system has the advantages of simple construction, easy operation and high precision and high sensitivity.","PeriodicalId":191475,"journal":{"name":"International Symposium on Laser Metrology","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133936740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Development of a multi-resolution measurement system based on light sectioning method 基于光切分法的多分辨率测量系统的研制

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814618

Weiguang Zhang, Hong Zhao, Xiang Zhou, Lu Zhang

{"title":"Development of a multi-resolution measurement system based on light sectioning method","authors":"Weiguang Zhang, Hong Zhao, Xiang Zhou, Lu Zhang","doi":"10.1117/12.814618","DOIUrl":"https://doi.org/10.1117/12.814618","url":null,"abstract":"With the rapid development of shape measurement technique, multi-resolution approach becomes one of valid way to enhance the accuracy. There are, however, still some key techniques such as simultaneous calibration and data fusion of several sensors being further studied. A multi-resolution system, which use light sectioning method, is developed and has been successful in many application areas for blade of aviation engine example. It can measure the shape of blade at high speed and high accuracy. The system is composed of four laser linear light sources, four or five cameras and three highprecision mechanical movement devices. Two cameras have relatively low amplifying ratios, and focus on the basin or back of blade where the radius of curvature is large. Other cameras have high amplifying ratios, and fix on the entering or ending edge of blade where the radius of curvature is small. So the system has 3600 measurement range and can carry out multi-resolution 3-D shape measurement with greatly different amplifying ratios of cameras. One measurement process has been finished when the blade mounted on mechanical movement device move up or down one time. Also the model building and principle of the measurement system, an algorithm of calibration and data fusion of several cameras are presented that calculate 3-D coordinates of one section of blade. The result shows that the accuracy of the system is about 0.05mm for the sectional circumradius approximately 50 mm measurement range, and also proves the system is feasible and efficient.","PeriodicalId":191475,"journal":{"name":"International Symposium on Laser Metrology","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127409408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Electronics speckle interferometry applications for NDE of spacecraft structural components 电子散斑干涉法在航天器结构部件无损检测中的应用

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814580

M. Rao, R. Samuel, A. Ananthan, S. Dasgupta, P. Nair

引用次数: 1

The study of sheath flow dark zone phenomenon in dynamic individual cells scattering measurement 动态单体散射测量中鞘流暗区现象的研究

International Symposium on Laser Metrology Pub Date : 2008-09-29 DOI: 10.1117/12.814604

Lu Zhang, Hong Zhao, Xiaoping Wang, Weiguang Zhang

{"title":"The study of sheath flow dark zone phenomenon in dynamic individual cells scattering measurement","authors":"Lu Zhang, Hong Zhao, Xiaoping Wang, Weiguang Zhang","doi":"10.1117/12.814604","DOIUrl":"https://doi.org/10.1117/12.814604","url":null,"abstract":"Dynamic cells scattering is one of the most efficient approaches exploring in measurements of cells size, morphology and growth states. This technique can be widely applied in real-time detection for pharmaceutical industry, food industry, liquor industry and other biological fields. A novel method named dynamic individual cells scattering measurement is designed in this paper, which can make cells pass through quartz glass measurement zone one by one with sheath flow driving force. During the experiments, an obvious phenomenon has been found which is called sheath flow dark zone phenomenon (SFDZ). Under the influence of SFDZ, sheath flow forming detection becomes very difficult. In this paper, the causes giving rise to SFDZ have been analyzed. And an improved method is put forward, in which the orifice inside the measurement zone is set as an optical system. Then the illuminating system is redesigned. In this way, almost all the illuminating light can enter orifice so that the total reflection energy decreases substantially. A comparison experiments have been done, which proves the efficiency of this redesigned optical system and its sound effects on SFDZ avoiding.","PeriodicalId":191475,"journal":{"name":"International Symposium on Laser Metrology","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130274281","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0