R. K., Vernon Jialiang Shen, Amitava Talukdar, A. Asundi
{"title":"Adaptive confocal system for 3-D profiling","authors":"R. K., Vernon Jialiang Shen, Amitava Talukdar, A. Asundi","doi":"10.1117/12.814569","DOIUrl":null,"url":null,"abstract":"Optical profilometers for micrometer resolutions are getting increasingly popular for non-contact measurement of surface profiles. Confocal profilometer is one such optical technique which can pick up sub-micron height variations of the object surface. Though the system is a single point measurement scanning in the X-Y directions enables one to plot the 3-D profile of the surface. However, the Z-scanning range is limited to ±1mm. In this work we report a system which can adapt itself to widen the scanning range in the Z-direction. For increasing the scan range we have added another translation stage in the Z axis which adapts itself when the system profiles a surface with step heights more than its original range. The X-Y-Z translation stage is connected to the computer and is controlled using a LabVIEW program. The 3-D plot is obtained by plotting the Z-values from the confocal system to the corresponding X-Y position of the translation stage. When ever the system goes out of range the Z translation stage is increased or decreased thus adapting itself to plot a 3D profile of the specimen.","PeriodicalId":191475,"journal":{"name":"International Symposium on Laser Metrology","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Laser Metrology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.814569","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Optical profilometers for micrometer resolutions are getting increasingly popular for non-contact measurement of surface profiles. Confocal profilometer is one such optical technique which can pick up sub-micron height variations of the object surface. Though the system is a single point measurement scanning in the X-Y directions enables one to plot the 3-D profile of the surface. However, the Z-scanning range is limited to ±1mm. In this work we report a system which can adapt itself to widen the scanning range in the Z-direction. For increasing the scan range we have added another translation stage in the Z axis which adapts itself when the system profiles a surface with step heights more than its original range. The X-Y-Z translation stage is connected to the computer and is controlled using a LabVIEW program. The 3-D plot is obtained by plotting the Z-values from the confocal system to the corresponding X-Y position of the translation stage. When ever the system goes out of range the Z translation stage is increased or decreased thus adapting itself to plot a 3D profile of the specimen.