2015 IEEE 33rd VLSI Test Symposium (VTS)最新文献

Efficient built-in self test of regular logic characterization vehicles 高效内置自检常规逻辑表征车辆

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116303

Ben Niewenhuis, R. D. Blanton

引用次数: 7

Abstraction-based relation mining for functional test generation 基于抽象的功能测试生成关系挖掘

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116286

K. Gent, M. Hsiao

引用次数: 4

Statistical techniques for predicting system-level failure using stress-test data 使用压力测试数据预测系统级故障的统计技术

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116260

Harry H. Chen, Shih-Hua Kuo, Jonathan Tung, M. Chao

引用次数: 8

Horizontal-FPN fault coverage improvement in production test of CMOS imagers CMOS成像仪生产测试中水平fpn故障覆盖率的提高

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116278

R. Fei, Jocelyn Moreau, S. Mir, Alexis Marcellin, C. Mandier, E. Huss, G. Palmigiani, P. Vitrou, Thomas Droniou

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引用次数: 3

Enabling unauthorized RF transmission below noise floor with no detectable impact on primary communication performance 使未经授权的射频传输低于噪声底，对主要通信性能没有可检测的影响

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116257

Doohwang Chang, B. Bakkaloglu, S. Ozev

引用次数: 15

Impact of parameter variations on FinFET faults 参数变化对FinFET故障的影响

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116276

Gurgen Harutunyan, Grigor Tshagharyan, Y. Zorian

引用次数: 8

A low cost jitter separation and characterization method 一种低成本的抖动分离与表征方法

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116248

Li Xu, Yan Duan, Degang Chen

引用次数: 8

Test vector omission with minimal sets of simulated faults 具有最小模拟故障集的测试向量遗漏

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116297

I. Pomeranz

引用次数: 0

Fault diagnosis for flow-based microfluidic biochips 基于流动的微流控生物芯片故障诊断

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116245

Kai Hu, B. Bhattacharya, K. Chakrabarty

引用次数: 10

Test compaction by test cube merging for four-way bridging faults 通过测试立方体合并来测试四路桥接故障的压实

2015 IEEE 33rd VLSI Test Symposium (VTS) Pub Date : 2015-04-27 DOI: 10.1109/VTS.2015.7116298

I. Pomeranz

{"title":"Test compaction by test cube merging for four-way bridging faults","authors":"I. Pomeranz","doi":"10.1109/VTS.2015.7116298","DOIUrl":"https://doi.org/10.1109/VTS.2015.7116298","url":null,"abstract":"Test compaction that accommodates the constraints of test data compression can be achieved by generating test cubes for target faults, and then merging the test cubes. This paper describes an improved test cube merging procedure for four-way bridging faults. The procedure is motivated by the prevalence of bridging defects and the fact that test sets for bridging faults are larger than test sets for single stuck-at faults. A four-way bridging fault gi/ai/hi models the case where a value ai of a line hi dominates the value of a line gi. A basic test cube merging procedure considers a set of test cubes Cdet that detects target faults. The paper extends the set of test cubes to include, in addition to Cdet, a set of test cubes Cdom that assign values to dominating lines. Test cubes from Cdom have significantly fewer specified values than test cubes from Cdet. When test cubes from Cdom are merged with test cubes from Cdet, each resulting test cube detects more faults, and fewer test cubes are needed for detecting the same set of target faults.","PeriodicalId":187545,"journal":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125381064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2