Microscopy and Microanalysis最新文献_第9页

Compensating Image Distortions in a Commercial Reflectron-Type Atom Probe. 补偿商用反射电子式原子探针的图像畸变

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae052

Martina Heller, Benedict Ott, Peter Felfer

{"title":"Compensating Image Distortions in a Commercial Reflectron-Type Atom Probe.","authors":"Martina Heller, Benedict Ott, Peter Felfer","doi":"10.1093/mam/ozae052","DOIUrl":"10.1093/mam/ozae052","url":null,"abstract":"In atom probe tomography, the spatial resolution and accuracy of the data critically depend on the 3D reconstruction of the 2D detector data. Atom probes with a reflectron have an improved mass resolving power and must include a model of the imaging properties of the reflectron. However, for modern wide-angle reflectron instruments, these imaging properties are not trivial and need to be determined for the reflectron used. This is typically done by the instrument manufacturer, and due to the proprietary nature of the instrument design, the imaging properties are opaque to the user. In this paper, we provide a method to determine the imaging properties of a reflectron that can easily be carried out on commercial instrumentation. This method is used to provide the user with a transformation function from the provided detector data, which can already contain some corrections applied, to a virtual detector placed before the reflectron. From there on, 3D reconstructions can be carried out analogous to straight flight path instruments. Correction algorithms and reference data for Imago/CAMECA LEAP 3000, 4000, 5000, and 6000 series instruments are also provided.","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":"1152-1162"},"PeriodicalIF":2.9,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141450877","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Silica-embedded Gold Nanoparticles Analyzed by Atom Probe Tomography. 通过原子探针断层扫描分析硅包金纳米粒子

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae024

Gustav Eriksson, Mats Hulander, Mattias Thuvander, Martin Andersson

{"title":"Silica-embedded Gold Nanoparticles Analyzed by Atom Probe Tomography.","authors":"Gustav Eriksson, Mats Hulander, Mattias Thuvander, Martin Andersson","doi":"10.1093/mam/ozae024","DOIUrl":"10.1093/mam/ozae024","url":null,"abstract":"Nanoparticles are utilized in a multitude of applications due to their unique properties. Consequently, characterization of nanoparticles is crucial, and various methods have been employed in these pursuits. One such method is Atom Probe Tomography (APT). However, existing sample preparation techniques for APT generally involve embedding of the nanoparticles in a matrix different from their environment in solutions or at solid-liquid interfaces. In this work, we demonstrate a methodology based on silica embedding and explore how it can be utilized to form a matrix for nanoparticles suitable for APT analysis. Through chemisorption to a surface, gold nanoparticles were densely packed, ensuring a high probability of encountering at least one particle in the APT analyses. The nanoparticle-covered surface was embedded in a silica film, replacing the water and thus making this method suitable for studying nanoparticles in their hydrated state. The nanoparticle's silver content and its distribution, originating from the nanoparticle synthesis, could be identified in the APT analysis. Sodium clusters, possibly originating from the sodium citrate used to stabilize the particles in solution, were observed on the nanoparticle surfaces. This indicates the potential for silica embedding to be used for studying ligands on nanoparticles in their hydrated state.","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":"1036-1046"},"PeriodicalIF":2.9,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140207284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View. 为原子探针试样原位镀金属膜，以提高产量、性能和视野。

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae006

Tim M Schwarz, Eric Woods, Mahander P Singh, Xinren Chen, Chanwon Jung, Leonardo S Aota, Kyuseon Jang, Mathias Krämer, Se-Ho Kim, Ingrid McCarroll, Baptiste Gault

{"title":"In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View.","authors":"Tim M Schwarz, Eric Woods, Mahander P Singh, Xinren Chen, Chanwon Jung, Leonardo S Aota, Kyuseon Jang, Mathias Krämer, Se-Ho Kim, Ingrid McCarroll, Baptiste Gault","doi":"10.1093/mam/ozae006","DOIUrl":"10.1093/mam/ozae006","url":null,"abstract":"Atom probe tomography requires needle-shaped specimens with a diameter typically below 100 nm, making them both very fragile and reactive, and defects (notches at grain boundaries or precipitates) are known to affect the yield and data quality. The use of a conformal coating directly on the sharpened specimen has been proposed to increase yield and reduce background. However, to date, these coatings have been applied ex situ and mostly are not uniform. Here, we report on the controlled focused-ion beam in situ deposition of a thin metal film on specimens immediately after specimen preparation. Different metallic targets e.g. Cr were attached to a micromanipulator via a conventional lift-out method and sputtered using Ga or Xe ions. We showcase the many advantages of coating specimens from metallic to nonmetallic materials. We have identified an increase in data quality and yield, an improvement of the mass resolution, as well as an increase in the effective field-of-view. This wider field-of-view enables visualization of the entire original specimen, allowing to detect the complete surface oxide layer around the specimen. The ease of implementation of the approach makes it very attractive for generalizing its use across a very wide range of atom probe analyses.","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":"1109-1123"},"PeriodicalIF":2.9,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139747008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Nanoporous Gold Thin Films as Substrates to Analyze Liquids by Cryo-atom Probe Tomography. 以纳米多孔金薄膜为基底，利用低温原子探针断层扫描技术分析液体。

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae041

Eric V Woods, Aparna Saksena, Ayman A El-Zoka, Leigh T Stephenson, Tim M Schwarz, Mahander P Singh, Leonardo S Aota, Se-Ho Kim, Jochen Schneider, Baptiste Gault

{"title":"Nanoporous Gold Thin Films as Substrates to Analyze Liquids by Cryo-atom Probe Tomography.","authors":"Eric V Woods, Aparna Saksena, Ayman A El-Zoka, Leigh T Stephenson, Tim M Schwarz, Mahander P Singh, Leonardo S Aota, Se-Ho Kim, Jochen Schneider, Baptiste Gault","doi":"10.1093/mam/ozae041","DOIUrl":"10.1093/mam/ozae041","url":null,"abstract":"Cryogenic atom probe tomography (cryo-APT) is being developed to enable nanoscale compositional analyses of frozen liquids. Yet, the availability of readily available substrates that allow for the fixation of liquids while providing sufficient strength to their interface is still an issue. Here, we propose the use of 1-2-µm-thick binary alloy film of gold-silver sputtered onto flat silicon, with sufficient adhesion without an additional layer. Through chemical dealloying, we successfully fabricate a nanoporous substrate, with an open-pore structure, which is mounted on a microarray of Si posts by lift-out in the focused-ion beam system, allowing for cryogenic fixation of liquids. We present cryo-APT results obtained after cryogenic sharpening, vacuum cryo-transfer, and analysis of pure water on the top and inside the nanoporous film. We demonstrate that this new substrate has the requisite characteristics for facilitating cryo-APT of frozen liquids, with a relatively lower volume of precious metals. This complete workflow represents an improved approach for frozen liquid analysis, from preparation of the films to the successful fixation of the liquid in the porous network, to cryo-APT.","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":"1172-1180"},"PeriodicalIF":2.9,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141248364","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Influence of the Emitter Shape on the Field-of-View in Atom Probe Tomography. 原子探针断层成像中发射器形状对视场的影响

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae016

Masoud Dialameh, Yu-Ting Ling, Janusz Bogdanowicz, Vyacheslav S Zharinov, Olivier Richard, Wilfried Vandervorst, Claudia Fleischmann

{"title":"Influence of the Emitter Shape on the Field-of-View in Atom Probe Tomography.","authors":"Masoud Dialameh, Yu-Ting Ling, Janusz Bogdanowicz, Vyacheslav S Zharinov, Olivier Richard, Wilfried Vandervorst, Claudia Fleischmann","doi":"10.1093/mam/ozae016","DOIUrl":"10.1093/mam/ozae016","url":null,"abstract":"Atom probe tomography (APT) is a unique analytical technique that offers three-dimensional elemental mapping with a spatial resolution down to the sub-nanometer. When APT is applied on complex heterogenous systems and/or under certain experimental conditions, that is, laser illumination, the specimen shape can deviate from an ideal hemisphere. Insufficient consideration of this aspect can introduce artifacts in the reconstructed dataset, ultimately degrading its spatial accuracy. So far, there has been limited investigation into the detailed evolution of emitter shape and its impact on the field-of-view (FOV). In this study, we numerically and experimentally investigated the FOV for asymmetric emitters and its evolution throughout the analysis depth. Our analysis revealed that, for asymmetric emitters, the ions evaporated from the topmost region of the specimen (summit) project approximately to the detector center. Furthermore, we demonstrated the implications of this finding on the FOV location for asymmetric emitters. Based on our findings, the location of the center of the FOV can deviate from the specimen central axis with an evolution depending on the evolution of the emitter shape. This study highlights the importance of accounting for the specimen shape when developing advanced data reconstruction schemes to enhance spatial resolution and accuracy.","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":"1130-1137"},"PeriodicalIF":2.9,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140049782","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy. 使用脚本控制聚焦离子束/扫描电子显微镜进行原子探针断层扫描的特定位点自动尖端制备方法。

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae015

Jun Uzuhashi, Tadakatsu Ohkubo, Kazuhiro Hono

引用次数: 0

Crystallographic Dependence of Field Evaporation Energy Barrier in Metals Using Field Evaporation Energy Loss Spectroscopy Mapping. 利用场蒸发能量损失光谱图绘制金属中场蒸发能量势垒的晶体学依赖性。

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae083

François Vurpillot, Constantinos Hatzoglou, Benjamin Klaes, Loic Rousseau, Jean-Baptiste Maillet, Ivan Blum, Baptiste Gault, Alfred Cerezo

{"title":"Crystallographic Dependence of Field Evaporation Energy Barrier in Metals Using Field Evaporation Energy Loss Spectroscopy Mapping.","authors":"François Vurpillot, Constantinos Hatzoglou, Benjamin Klaes, Loic Rousseau, Jean-Baptiste Maillet, Ivan Blum, Baptiste Gault, Alfred Cerezo","doi":"10.1093/mam/ozae083","DOIUrl":"10.1093/mam/ozae083","url":null,"abstract":"Atom probe tomography data are composed of a list of coordinates of the reconstructed atoms in the probed volume. The elemental identity of each atom is derived from time-of-flight mass spectrometry, with no local chemical information readily available. In this study, we use a data processing technique referred to as field evaporation energy loss spectroscopy (FEELS), which analyzes the tails of mass peaks. FEELS was used to extract critical energetic parameters that are related to the activation energy for atoms to escape from the surface under intense electrostatic field and dependent of the path followed by the departing atoms. We focused our study on pure face-centered cubic metals. We demonstrate that the energetic parameters can be mapped in two-dimensional with nanometric resolution. A dependence on the considered crystallographic planes is observed, with sets of planes of low Miller indices showing a lower sensitivity to the field. The temperature is also an important parameter in particular for aluminum, which we attribute to an energetic transition between two paths of field evaporation between 25 and 60 K close to (002) pole. This paper shows that the information that can be retrieved from the measured energy loss of surface atoms is important both experimentally and theoretically.","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":"1091-1099"},"PeriodicalIF":2.9,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142291232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Direct Observation of Trace Elements in Barium Titanate of Multilayer Ceramic Capacitors Using Atom Probe Tomography. 利用原子探针断层扫描技术直接观察多层陶瓷电容器钛酸钡中的微量元素。

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae032

Kyuseon Jang, Mi-Yang Kim, Chanwon Jung, Se-Ho Kim, Daechul Choi, Seong-Chan Park, Christina Scheu, Pyuck-Pa Choi

引用次数: 0

In Situ Pulsed Hydrogen Implantation in Atom Probe Tomography. 原子探针断层成像中的原位脉冲氢植入。

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae040

Jean-Baptiste Maillet, Gerald Da Costa, Benjamin Klaes, Christian Bacchi, Antoine Normand, Charly Vaudaulon, François Vurpillot

{"title":"In Situ Pulsed Hydrogen Implantation in Atom Probe Tomography.","authors":"Jean-Baptiste Maillet, Gerald Da Costa, Benjamin Klaes, Christian Bacchi, Antoine Normand, Charly Vaudaulon, François Vurpillot","doi":"10.1093/mam/ozae040","DOIUrl":"10.1093/mam/ozae040","url":null,"abstract":"The investigation of hydrogen in atom probe tomography appears as a relevant challenge due to its low mass, high diffusion coefficient, and presence as a residual gas in vacuum chambers, resulting in multiple complications for atom probe studies. Different solutions were proposed in the literature like ex situ charging coupled with cryotransfer or H charging at high temperature in a separate chamber. Nevertheless, these solutions often faced challenges due to the complex control of specimen temperature during hydrogen charging and subsequent analysis. In this paper, we propose an alternative route for in situ H charging in atom probe derived from a method developed in field ion microscopy. By applying negative voltage nanosecond pulse on the specimen in an atom probe chamber under a low pressure of H2, it is demonstrated that a high dose of H can be implanted in the range 2-20 nm beneath the specimen surface. An atom probe chamber was modified to enable direct negative pulse application with controlled gas pressure, pulse repetition rate, and pulse amplitude. Through electrodynamical simulations, we show that the implantation energy falls within the range 100-1,000 eV and a theoretical depth of implantation was predicted and compared to experiments.","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":"1221-1236"},"PeriodicalIF":2.9,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140958448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Suppressing Lithium Migration in a Carbon Fiber Negative Electrode During Atom Probe Tomography Analysis. 在原子探针断层扫描分析过程中抑制碳纤维负电极中的锂迁移。

IF 2.9 4区工程技术

Microscopy and Microanalysis Pub Date : 2025-02-03 DOI: 10.1093/mam/ozae058

Marcus Johansen, Mahander P Singh, Baptiste Gault, Fang Liu

引用次数: 0