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Dynamic STEM-EELS of Atom and Defect Evolution During Electron Beam Transformations 电子束变换过程中原子和缺陷演变的动态 STEM-EELS
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.1007
Kevin M. Roccapriore, Riccardo Torsi, Joshua Robinson, Sergei V Kalinin, M. Ziatdinov
{"title":"Dynamic STEM-EELS of Atom and Defect Evolution During Electron Beam Transformations","authors":"Kevin M. Roccapriore, Riccardo Torsi, Joshua Robinson, Sergei V Kalinin, M. Ziatdinov","doi":"10.1093/mam/ozae044.1007","DOIUrl":"https://doi.org/10.1093/mam/ozae044.1007","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141840277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Exploring Experimental Conditions for Analyzing Heterogeneous PbSn Solder Material By Using Electron Probe Microanalysis (EPMA) 利用电子探针显微分析 (EPMA) 探索分析异质铅锑焊料的实验条件
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.077
Christian Harris, Allyson Blanchard, Christopher Manspeaker, Mark Rodriguez
{"title":"Exploring Experimental Conditions for Analyzing Heterogeneous PbSn Solder Material By Using Electron Probe Microanalysis (EPMA)","authors":"Christian Harris, Allyson Blanchard, Christopher Manspeaker, Mark Rodriguez","doi":"10.1093/mam/ozae044.077","DOIUrl":"https://doi.org/10.1093/mam/ozae044.077","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141840475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Toward Probing Molecular Radiolysis Behavior in Gas Cell Electron Microscopy 在气室电子显微镜中探究分子的辐射分解行为
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.839
K. Koo, Xiaobing Hu, V. Dravid
{"title":"Toward Probing Molecular Radiolysis Behavior in Gas Cell Electron Microscopy","authors":"K. Koo, Xiaobing Hu, V. Dravid","doi":"10.1093/mam/ozae044.839","DOIUrl":"https://doi.org/10.1093/mam/ozae044.839","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141840554","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Newton vs. Gibbs: Do We Need Full Dynamics to Simulate Field Evaporation in Atom Probe Tomography? 牛顿与吉布斯：我们需要全动力学来模拟原子探针断层扫描中的场蒸发吗？
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.019
Jiayuwen Qi, Emmanuelle Marquis, Wolfgang Windl
{"title":"Newton vs. Gibbs: Do We Need Full Dynamics to Simulate Field Evaporation in Atom Probe Tomography?","authors":"Jiayuwen Qi, Emmanuelle Marquis, Wolfgang Windl","doi":"10.1093/mam/ozae044.019","DOIUrl":"https://doi.org/10.1093/mam/ozae044.019","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141840642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cryo-STEM Mapping of Phase Transitions in Oxide Quantum Materials with Atomic Resolution 以原子分辨率绘制氧化物量子材料中的相变冷冻-扫描电子显微镜图
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.746
N. Schnitzer, L. Bhatt, Ismail El Baggari, Berit H Goodge, David A Muller, L. Kourkoutis
{"title":"Cryo-STEM Mapping of Phase Transitions in Oxide Quantum Materials with Atomic Resolution","authors":"N. Schnitzer, L. Bhatt, Ismail El Baggari, Berit H Goodge, David A Muller, L. Kourkoutis","doi":"10.1093/mam/ozae044.746","DOIUrl":"https://doi.org/10.1093/mam/ozae044.746","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141840897","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation of the Influence of Growth Conditions on the Local Structure in High Entropy Oxides Using S/TEM 利用 S/TEM 研究生长条件对高熵氧化物局部结构的影响
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.663
Sai Venkata Gayathri Ayyagari, L. Miao, Gabriela E. Niculescu, M. Webb, John P. Barber, John T. Heron, Christina M Rost, N. Alem
{"title":"Investigation of the Influence of Growth Conditions on the Local Structure in High Entropy Oxides Using S/TEM","authors":"Sai Venkata Gayathri Ayyagari, L. Miao, Gabriela E. Niculescu, M. Webb, John P. Barber, John T. Heron, Christina M Rost, N. Alem","doi":"10.1093/mam/ozae044.663","DOIUrl":"https://doi.org/10.1093/mam/ozae044.663","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141841683","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Correlative In-Situ Liquid Cell Electrochemistry TEM and Cryogenic APT of Liquid-Solid Interfaces 液固界面的原位液池电化学 TEM 和低温 APT 相互关联
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.043
Neil Mulcahy, Lukas Worch, Ramin Jannat, Hongyu Sun, Mary P Ryan, B. Gault, James Douglas, Michele Conroy
{"title":"Correlative In-Situ Liquid Cell Electrochemistry TEM and Cryogenic APT of Liquid-Solid Interfaces","authors":"Neil Mulcahy, Lukas Worch, Ramin Jannat, Hongyu Sun, Mary P Ryan, B. Gault, James Douglas, Michele Conroy","doi":"10.1093/mam/ozae044.043","DOIUrl":"https://doi.org/10.1093/mam/ozae044.043","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141841864","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TEM Characterization of Radiation-Induced Segregation at Irradiation-Induced Dislocation loops in Al0.3CoCrFeNi and CoCrFeMnNi High Entropy Alloys Al0.3CoCrFeNi 和 CoCrFeMnNi 高熵合金中辐照诱发位错环处辐照偏析的 TEM 表征
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.659
Wei-Ying Chen, Nestor J Zaluzec
{"title":"TEM Characterization of Radiation-Induced Segregation at Irradiation-Induced Dislocation loops in Al0.3CoCrFeNi and CoCrFeMnNi High Entropy Alloys","authors":"Wei-Ying Chen, Nestor J Zaluzec","doi":"10.1093/mam/ozae044.659","DOIUrl":"https://doi.org/10.1093/mam/ozae044.659","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141842004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Performance of Machine Learning Models for Detecting Grain Boundaries in Transmission Electron Microscopy Images 用于检测透射电子显微镜图像中晶粒边界的机器学习模型的性能
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.177
Aiden Ochoa, Xinyuan Xu, Xing Wang
{"title":"Performance of Machine Learning Models for Detecting Grain Boundaries in Transmission Electron Microscopy Images","authors":"Aiden Ochoa, Xinyuan Xu, Xing Wang","doi":"10.1093/mam/ozae044.177","DOIUrl":"https://doi.org/10.1093/mam/ozae044.177","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141842032","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Correlative Characterisation of Neutron-Irradiation Damage Induced in Zr Alloys 中子辐照在锆合金中诱发的损伤的相关表征
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.040
Wenyu Zhang, Rajat Nama, P. Bagot, Chris R. M. Grovenor, Michael P Moody
{"title":"Correlative Characterisation of Neutron-Irradiation Damage Induced in Zr Alloys","authors":"Wenyu Zhang, Rajat Nama, P. Bagot, Chris R. M. Grovenor, Michael P Moody","doi":"10.1093/mam/ozae044.040","DOIUrl":"https://doi.org/10.1093/mam/ozae044.040","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141842058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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