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Microscopy and Microanalysis最新文献

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Identification of Hydrogen and Helium in Lunar Materials 月球材料中氢和氦的鉴定
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.094
Katherine D Burgess, B. A. Cymes, Rhonda M. Stroud
{"title":"Identification of Hydrogen and Helium in Lunar Materials","authors":"Katherine D Burgess, B. A. Cymes, Rhonda M. Stroud","doi":"10.1093/mam/ozae044.094","DOIUrl":"https://doi.org/10.1093/mam/ozae044.094","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141850192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In-Situ Electron Microscopy of Abnormal Grain Growth in Nanocrystalline Nickel 纳米晶镍异常晶粒生长的原位电子显微镜观察
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.284
Kamil Ulatowski, Mark P Coleman, Richard E Johnston, Ria L Mitchell, Andy Hollwell, Ben Tordoff, Ken M Y P’ng
{"title":"In-Situ Electron Microscopy of Abnormal Grain Growth in Nanocrystalline Nickel","authors":"Kamil Ulatowski, Mark P Coleman, Richard E Johnston, Ria L Mitchell, Andy Hollwell, Ben Tordoff, Ken M Y P’ng","doi":"10.1093/mam/ozae044.284","DOIUrl":"https://doi.org/10.1093/mam/ozae044.284","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141850426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM) for Advance Characterization of Grain Boundaries at the Nanoscale in Copper Bicrystals 用四维扫描透射电子显微镜 (4D-STEM) 在纳米尺度上对铜双晶的晶界进行高级表征
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.146
Theresa M Kucinski, Dongyue Xie, Nan Li, B. Savitzky, C. Ophus, Michael T Pettes
{"title":"Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM) for Advance Characterization of Grain Boundaries at the Nanoscale in Copper Bicrystals","authors":"Theresa M Kucinski, Dongyue Xie, Nan Li, B. Savitzky, C. Ophus, Michael T Pettes","doi":"10.1093/mam/ozae044.146","DOIUrl":"https://doi.org/10.1093/mam/ozae044.146","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141850935","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Exploring the Impact of Microstructure on the Mechanical Properties of High-Strength Zn Coating For Biomedical Application 探索微观结构对生物医学应用中高强度锌涂层机械性能的影响
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.633
M. Wątroba, K. Pratama, C. Tian, K. Maćkosz, A. Sharma, W. Bednarczyk, J. Michler, J. Schwiedrzik
{"title":"Exploring the Impact of Microstructure on the Mechanical Properties of High-Strength Zn Coating For Biomedical Application","authors":"M. Wątroba, K. Pratama, C. Tian, K. Maćkosz, A. Sharma, W. Bednarczyk, J. Michler, J. Schwiedrzik","doi":"10.1093/mam/ozae044.633","DOIUrl":"https://doi.org/10.1093/mam/ozae044.633","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141851104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In Situ Light Injection Study on Stacked WS2/WSe2 /hBN Hetero-Bilayers 叠层 WS2/WSe2 /hBN 异质层的原位光注入研究
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.818
Sriram Sankar, P. Haluai, Medha Dandu, T. Taniguchi, Kenji Watanabe, Archana Raja, Sandhya Susarla
{"title":"In Situ Light Injection Study on Stacked WS2/WSe2 /hBN Hetero-Bilayers","authors":"Sriram Sankar, P. Haluai, Medha Dandu, T. Taniguchi, Kenji Watanabe, Archana Raja, Sandhya Susarla","doi":"10.1093/mam/ozae044.818","DOIUrl":"https://doi.org/10.1093/mam/ozae044.818","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141851106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Formation of SiC by Magnesium-Thermal Synthesis 通过镁热合成形成碳化硅
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.635
Kevin Isaac Contreras Vargas, Caleb Carreño Gallardo, Patricia Amezaga Madrid, A. Ramirez-delacruz, Marco Antonio Ruiz Esparza Rodriguez, D. Lardizábal‐Gutiérrez
{"title":"Formation of SiC by Magnesium-Thermal Synthesis","authors":"Kevin Isaac Contreras Vargas, Caleb Carreño Gallardo, Patricia Amezaga Madrid, A. Ramirez-delacruz, Marco Antonio Ruiz Esparza Rodriguez, D. Lardizábal‐Gutiérrez","doi":"10.1093/mam/ozae044.635","DOIUrl":"https://doi.org/10.1093/mam/ozae044.635","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141851157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Exploring the Use of Electron Rutherford Backscattering for the Detection and Quantification of Light Elements in Scanning Electron Microscope (SEM) 探索利用电子卢瑟福反向散射在扫描电子显微镜（SEM）中检测和量化光元素
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.099
P. Staib
{"title":"Exploring the Use of Electron Rutherford Backscattering for the Detection and Quantification of Light Elements in Scanning Electron Microscope (SEM)","authors":"P. Staib","doi":"10.1093/mam/ozae044.099","DOIUrl":"https://doi.org/10.1093/mam/ozae044.099","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141851716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Influence of the Re-Melting on the Microstructure and Corrosion Resistance of New Welding Material 再熔对新型焊接材料微观结构和耐腐蚀性的影响
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.670
George Simion, Matteo Bertapelle, J. Mirza-Rosca, I. Voiculescu, E. Scutelnicu
{"title":"The Influence of the Re-Melting on the Microstructure and Corrosion Resistance of New Welding Material","authors":"George Simion, Matteo Bertapelle, J. Mirza-Rosca, I. Voiculescu, E. Scutelnicu","doi":"10.1093/mam/ozae044.670","DOIUrl":"https://doi.org/10.1093/mam/ozae044.670","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141838529","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of Stoichiometric Accuracy with Deep-Ultraviolet Laser-Assisted Atom Probe Tomography of Hydroxyapatite 利用深紫外激光辅助原子探针断层扫描评估羟基磷灰石的化学计量准确性
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.028
Jack R. Grimm, Sandra D Taylor, Arun Devaraj
{"title":"Evaluation of Stoichiometric Accuracy with Deep-Ultraviolet Laser-Assisted Atom Probe Tomography of Hydroxyapatite","authors":"Jack R. Grimm, Sandra D Taylor, Arun Devaraj","doi":"10.1093/mam/ozae044.028","DOIUrl":"https://doi.org/10.1093/mam/ozae044.028","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141838633","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Correlated Multi-Scale Characterization of Crystals in a Conductive Polymer 导电聚合物中晶体的多尺度相关表征
IF 2.9 4区 工程技术
Microscopy and Microanalysis Pub Date : 2024-07-01 DOI: 10.1093/mam/ozae044.261
Alison Trachet, K. Schepker, Gary Scheiffele
{"title":"Correlated Multi-Scale Characterization of Crystals in a Conductive Polymer","authors":"Alison Trachet, K. Schepker, Gary Scheiffele","doi":"10.1093/mam/ozae044.261","DOIUrl":"https://doi.org/10.1093/mam/ozae044.261","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141838791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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