Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.最新文献

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Slightly-off-specification failures in the time-triggered architecture 在时间触发的体系结构中出现轻微的不规范故障
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224420
A. Ademaj
{"title":"Slightly-off-specification failures in the time-triggered architecture","authors":"A. Ademaj","doi":"10.1109/HLDVT.2002.1224420","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224420","url":null,"abstract":"Slightly-off-specification (SOS) failures can occur at the interface between the analog and the digital world. If an erroneous node in a distributed system produces an output signal (in time or value) slightly outside the specified window, some nodes will correctly receive this signal, while others might fail to receive it. Such a scenario will result in an inconsistent state of the distributed system. We present the observed temporal SOS failures in the time-triggered architecture with the bus interconnection structure during the execution of the software implemented fault injection in the TTP/C communication controller. Solutions to avoid the occurrence of the temporal SOS failures in the time-triggered architecture are analyzed and presented.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"1134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113995030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
An effective and flexible approach to functional verification of processor families 一种有效而灵活的处理器系列功能验证方法
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224435
David Malandain, Pim Palmen, M.B. Taylor, M. Aharoni, Yaron Arbetman
{"title":"An effective and flexible approach to functional verification of processor families","authors":"David Malandain, Pim Palmen, M.B. Taylor, M. Aharoni, Yaron Arbetman","doi":"10.1109/HLDVT.2002.1224435","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224435","url":null,"abstract":"Functional verification is one of the most critical stages of microprocessor design. Its goal is to achieve the maximum level of confidence in the conformance of a processor design to its specification. A powerful methodology is necessary in order to cope with the major technical challenge which is posed by functional verification of a processor, and which stems from the vast state space that must be verified. This need becomes even more crucial when faced with the concurrent verification of several processor families. We describe a strategy for verification of several designs, which allows for maximum sharing of resources and knowledge among the verification projects, thus resulting in a significant increase in the efficiency of verification and in an associated reduction in the time required to verify a new design.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131539250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Experimental validation of fault detection and fault tolerance mechanisms 故障检测与容错机制的实验验证
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224450
P. Gawkowski, J. Sosnowski
{"title":"Experimental validation of fault detection and fault tolerance mechanisms","authors":"P. Gawkowski, J. Sosnowski","doi":"10.1109/HLDVT.2002.1224450","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224450","url":null,"abstract":"The paper deals with the problem of validating the effectiveness of hardware and software mechanisms decreasing system susceptibility to hardware faults. The validation process is based on the use of software implemented fault injector (FITS). The performed analysis concentrates on tuning the profile of faults and experiment set-ups. The presented simulation results are explained in context of the considered applications.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124381066","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
A 1000X speed up for properties completeness evaluation 属性完整性评估的速度提高了1000倍
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224422
A. Castelnuovo, A. Fedeli, A. Fin, F. Fummi, G. Pravadelli, U. Rossi, F. Sforza, F. Toto
{"title":"A 1000X speed up for properties completeness evaluation","authors":"A. Castelnuovo, A. Fedeli, A. Fin, F. Fummi, G. Pravadelli, U. Rossi, F. Sforza, F. Toto","doi":"10.1109/HLDVT.2002.1224422","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224422","url":null,"abstract":"Verification of circuit description by means of model checking means to write propositions, expressed in some temporal logic, expected to be true on the implementation according to the specification content. Completeness of the set of written properties is still an open problem. We propose a practical approach to the property coverage metrics definition based on fault injection; a combination of model checking, fault simulation and emulation allows to reduce the coverage measure to an affordable task. The application of these three different technologies is illustrated on a real example, on which it leads to the discovery of a missing property in a property set formerly trusted to be complete.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133687636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Generating concurrent test-programs with collisions for multi-processor verification 为多处理器验证生成带有冲突的并发测试程序
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224432
Allon Adir, G. Shurek
{"title":"Generating concurrent test-programs with collisions for multi-processor verification","authors":"Allon Adir, G. Shurek","doi":"10.1109/HLDVT.2002.1224432","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224432","url":null,"abstract":"We discuss collisions that are of interest to multiprocessor verification. Collisions occur when different processes access a shared resource. We investigate how the results of such collisions can be presented in test programs and suggest implementations for automatically generating such tests and predicting the results of collision scenarios. Most of the ideas presented are the result of years of experience with two multi-processor test generators from IBM (Genie and Genesys-Pro) which are also briefly presented.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114285343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Adaptive test program generation: planning for the unplanned 自适应测试程序生成:为计划外的项目做计划
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224433
Allon Adir, Roy Emek, E. Marcus
{"title":"Adaptive test program generation: planning for the unplanned","authors":"Allon Adir, Roy Emek, E. Marcus","doi":"10.1109/HLDVT.2002.1224433","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224433","url":null,"abstract":"Simulation of automatically-generated test programs is the primary means for verifying complex hardware designs and random test program generators therefore play a major role in the verification process of micro-processors. The input for a test program generator is typically an abstract specification-a template-of the tests to be generated. Due to randomness, generators often encounter situations that were not anticipated when the test specification was written. We introduce the concept of adaptive test program generation, which is designed to handle these unforeseen situations. We propose a technique that defines unexpected events together with their alternative program specifications. When an event is detected, its corresponding alternative specification is injected into the test program.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130395623","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A simple and effective compression scheme for test pins reduction 一个简单有效的压缩方案,测试销减少
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224447
M. Flottes, Regis Poirier, B. Rouzeyre
{"title":"A simple and effective compression scheme for test pins reduction","authors":"M. Flottes, Regis Poirier, B. Rouzeyre","doi":"10.1109/HLDVT.2002.1224447","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224447","url":null,"abstract":"We present a simple and effective method for test pin reduction. It must be noticed first that this method is particularly well adapted to the test of SoC since it only deals with test data and does not require any knowledge of the embedded cores. Secondly, it does not induce any delay penalty neither in the circuit itself nor during decompression.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121168199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A hierarchical approach for designing dependable systems 设计可靠系统的分层方法
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224430
M. Reorda, M. Violante, N. Mazzocca, S. Venticinque, A. Bobbio, G. Franceschinis
{"title":"A hierarchical approach for designing dependable systems","authors":"M. Reorda, M. Violante, N. Mazzocca, S. Venticinque, A. Bobbio, G. Franceschinis","doi":"10.1109/HLDVT.2002.1224430","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224430","url":null,"abstract":"New constraints, such as the need for reducing the cost and the time-to-market, are forcing designers of safety-critical systems to exploit commercial-off-the-shelf (COTS) components. To effectively deal with the specification and evaluation of such a kind of systems new design methodologies are required. We propose a new approach where COTS components building a safety critical system are first characterized through a detailed analysis process. The extracted information can then be exploited by a high-level analysis environment that allows evaluating a whole system with good accuracy and high efficiency.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115194808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Setting break-points in distributed time-triggered architecture 在分布式时间触发架构中设置断点
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224429
Idriz Smaili, A. Ademaj
{"title":"Setting break-points in distributed time-triggered architecture","authors":"Idriz Smaili, A. Ademaj","doi":"10.1109/HLDVT.2002.1224429","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224429","url":null,"abstract":"Setting a brake-point in a local node of a distributed real-time system freezes the execution of the application in the local node, while other nodes in the network continue execution of their part of a distributed application. This will lead to an inconsistent state of nodes in the system, because the physical time cannot be stopped and the system is no more consistent in the temporal domain. We present a new method for setting brake-points in distributed time-triggered systems. After a brake-point is set all nodes in the network freeze the execution of the local application at the same instant and enters a debug operation mode. This method can be applied on target systems, which use the concept of sparse time base, like the time-triggered architecture (TTA). During the debug mode a monitoring (debugger) node is used to exchange debugging commands and data with particular nodes in the network. The debugging process is transparent to distributed time-triggered applications. The proposed debugging technique can be applied also for software fault injection. It circumvents the problem of temporal intrusiveness during the debugging or software fault injection in time-triggered systems.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125278217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Automatic functional test program generation for pipelined processors using model checking 使用模型检查的流水线处理器自动功能测试程序生成
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224436
P. Mishra, N. Dutt
{"title":"Automatic functional test program generation for pipelined processors using model checking","authors":"P. Mishra, N. Dutt","doi":"10.1109/HLDVT.2002.1224436","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224436","url":null,"abstract":"Formal techniques offer an opportunity to significantly reduce the cost of microprocessor verification. We propose a model checking based approach to automatically generate functional test programs for pipelined processors. We specify the processor architecture in an Architecture Description Language (ADL). The processor model is extracted from the ADL specification. Specific properties are applied to the processor model using SMV model checker to generate test programs. We applied this methodology on a single-issue DLX processor to demonstrate the usefulness of our approach.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114995467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 32
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