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Accelerated verification of RTL assertions based on satisfiability solvers 基于可满足性求解器的RTL断言的加速验证
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224437
Ranan Fraer, Shahid Ikram, Gila Kamhi, Tim Leonard, Abdelillah Mokkedem
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引用次数: 14
Top-level validation of system-on-chip in Esterel Studio 在Esterel Studio中对片上系统进行顶层验证
Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. Pub Date : 2002-10-27 DOI: 10.1109/HLDVT.2002.1224425
G. Berry, Lionel Blanc, A. Bouali, Jerome Dormoy
{"title":"Top-level validation of system-on-chip in Esterel Studio","authors":"G. Berry, Lionel Blanc, A. Bouali, Jerome Dormoy","doi":"10.1109/HLDVT.2002.1224425","DOIUrl":"https://doi.org/10.1109/HLDVT.2002.1224425","url":null,"abstract":"We present a new tool-supported methodology for system on chip top-level validation (TLV). The addressed problem is the systematic validation of IP interaction to ensure correct global functional behavior of a SoC design, assuming that each IP has been individually validated. The goal is to generate functional tests for the final design that cover the interaction behavior in a systematic, well-defined, and complete way. The typical problem to be found is incorrect inter-IP data flow due to misconfiguration or missynchronization of IPs. The tool is Esterel Studio, a design and verification environment based on the SyncCharts hierarchical concurrent finite state machine (HFSM) formalism. SynchCharts are a graphical variant of the Esterel high-level synchronous programming language, which is used to specify and synthesize circuits and embedded software.","PeriodicalId":179418,"journal":{"name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127172555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
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