Nentwich, M., Zschornak, M., Weigel, T., Köhler, T., Novikov, D., Meyer, D.C., Richter, C.
{"title":"Treatment of multiple-beam X-ray diffraction in energy-dependent measurements","authors":"Nentwich, M., Zschornak, M., Weigel, T., Köhler, T., Novikov, D., Meyer, D.C., Richter, C.","doi":"10.1107/s1600577523009670","DOIUrl":"https://doi.org/10.1107/s1600577523009670","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"105 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138715442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Silveira, A., Greving, I., Longo, E., Scheel, M., Weitkamp, T., Fleck, C., Shahar, R., Zaslansky, P.
{"title":"Deep learning to overcome Zernike phase-contrast nanoCT artifacts for automated micro-nano porosity segmentation in bone","authors":"Silveira, A., Greving, I., Longo, E., Scheel, M., Weitkamp, T., Fleck, C., Shahar, R., Zaslansky, P.","doi":"10.1107/s1600577523009852","DOIUrl":"https://doi.org/10.1107/s1600577523009852","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"49 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138716013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Counting on the future: fast charge-integrating detectors for X-ray nanoimaging.","authors":"Junjing Deng, Antonino Miceli, Chris Jacobsen","doi":"10.1107/S1600577523007269","DOIUrl":"https://doi.org/10.1107/S1600577523007269","url":null,"abstract":"<p><p>A fast charge-integrating detector has been showcased for high-resolution X-ray ptychography. The advancement in developing detectors of this kind, with rapid framing capabilities, holds paramount significance in harnessing the full potential of emerging diffraction-limited synchrotron sources for X-ray nanoimaging.</p>","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"30 Pt 5","pages":"859-860"},"PeriodicalIF":2.5,"publicationDate":"2023-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10481263/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10169445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Structural properties in ruptured mitral chordae tendineae measured by synchrotron-based X-ray phase computed tomography.","authors":"Yojiro Koda, Takuro Tsukube, Masato Hoshino, Naoto Yagi, Hatsue Ishibashi-Ueda, Kenji Okada","doi":"10.1107/S1600577523005167","DOIUrl":"https://doi.org/10.1107/S1600577523005167","url":null,"abstract":"Tissue density measured by synchrotron-based X-ray phase computed tomography is shown to be associated with the fragility of the ruptured mitral chordae tendineae.","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"30 Pt 5","pages":"995-1002"},"PeriodicalIF":2.5,"publicationDate":"2023-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10481270/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10176197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wan Zhang, Dechong Zhu, Yanfeng Sui, Junhui Yue, Jianshe Cao, Jun He
{"title":"Exploring beam size measurement based on the Talbot effect at BEPCII.","authors":"Wan Zhang, Dechong Zhu, Yanfeng Sui, Junhui Yue, Jianshe Cao, Jun He","doi":"10.1107/S1600577523006355","DOIUrl":"https://doi.org/10.1107/S1600577523006355","url":null,"abstract":"<p><p>Vertical beam size measurements were carried out at Beijing Electron-Positron Collider II (BEPCII) using a phase grating and an absorption grating based on the Talbot effect. The transverse coherence of synchrotron radiation is closely related to beam size. Due to the partial coherence of the synchrotron radiation source, the coherence length can be calculated by measuring the visibility decay of interferograms recorded at different distances behind the gratings. A vertical beam size of 68.19 ± 2 µm was obtained based on the relationship between the coherence length and beam size at the 3W1 beamline of BEPCII. A comparison of the vertical emittance derived from the grating Talbot method and the synchrotron radiation visible light interferometer method was presented. The vertical emittances from the two methods are 1.41 nm rad and 1.40 nm rad, respectively. The 0.1% difference indicates that the grating Talbot method for beam size measurement is reliable. This technique has great potential for small beam size measurement of fourth-generation synchrotron radiation light sources, considering its small diffraction limitation and simple experimental setups.</p>","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"30 Pt 5","pages":"910-916"},"PeriodicalIF":2.5,"publicationDate":"2023-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10481274/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10169449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tommaso Mandolini, Julien Chantel, Sébastien Merkel, Yann Le Godec, Nicolas Guignot, Andrew King, Jerome Hosdez, Laura Henry, Nadège Hilairet
{"title":"Deformation of two-phase aggregates with in situ X-ray tomography in rotating Paris-Edinburgh cell at GPa pressures and high temperature.","authors":"Tommaso Mandolini, Julien Chantel, Sébastien Merkel, Yann Le Godec, Nicolas Guignot, Andrew King, Jerome Hosdez, Laura Henry, Nadège Hilairet","doi":"10.1107/S1600577523005374","DOIUrl":"https://doi.org/10.1107/S1600577523005374","url":null,"abstract":"The use of a high-pressure torsion apparatus to deform multi-phase aggregates under high shear strain is explored, and in situ X-ray tomography data at high pressure and high temperature are collected. Step-by-step procedures on strain measurements and image processing are outlined, and results on the studied materials are presented in 2D and 3D.","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"30 Pt 5","pages":"962-977"},"PeriodicalIF":2.5,"publicationDate":"2023-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10481265/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10530742","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jaianth Vijayakumar, Hao Yuan, Nicolas Mille, Stefan Stanescu, Sufal Swaraj, Vincent Favre-Nicolin, Ebrahim Najafi, Adam P Hitchcock, Rachid Belkhou
{"title":"Soft X-ray spectro-ptychography of boron nitride nanobamboos, carbon nanotubes and permalloy nanorods.","authors":"Jaianth Vijayakumar, Hao Yuan, Nicolas Mille, Stefan Stanescu, Sufal Swaraj, Vincent Favre-Nicolin, Ebrahim Najafi, Adam P Hitchcock, Rachid Belkhou","doi":"10.1107/S1600577523003399","DOIUrl":"10.1107/S1600577523003399","url":null,"abstract":"<p><p>Spectro-ptychography offers improved spatial resolution and additional phase spectral information relative to that provided by scanning transmission X-ray microscopes. However, carrying out ptychography at the lower range of soft X-ray energies (e.g. below 200 eV to 600 eV) on samples with weakly scattering signals can be challenging. Here, results of soft X-ray spectro-ptychography at energies as low as 180 eV are presented, and its capabilities are illustrated with results from permalloy nanorods (Fe 2p), carbon nanotubes (C 1s) and boron nitride bamboo nanostructures (B 1s, N 1s). The optimization of low-energy X-ray spectro-ptychography is described and important challenges associated with measurement approaches, reconstruction algorithms and their effects on the reconstructed images are discussed. A method for evaluating the increase in radiation dose when using overlapping sampling is presented.</p>","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"30 Pt 4","pages":"746-757"},"PeriodicalIF":2.4,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10325009/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"9791617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}