Journal of Synchrotron Radiation最新文献

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Operando double-edge high-resolution X-ray absorption spectroscopy study of BiVO4 photoanodes BiVO4 光阳极的操作态双刃高分辨率 X 射线吸收光谱研究
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-04-15 DOI: 10.1107/s1600577524002741
Piccioni, A., Kopula Kesavan, J., Amidani, L., Mazzaro, R., Berardi, S., Caramori, S., Pasquini, L., Boscherini, F.
{"title":"Operando double-edge high-resolution X-ray absorption spectroscopy study of BiVO4 photoanodes","authors":"Piccioni, A., Kopula Kesavan, J., Amidani, L., Mazzaro, R., Berardi, S., Caramori, S., Pasquini, L., Boscherini, F.","doi":"10.1107/s1600577524002741","DOIUrl":"https://doi.org/10.1107/s1600577524002741","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"120 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140561688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of dual-beamline photoelectron momentum microscopy for valence orbital analysis 开发用于价轨道分析的双光束线光电子动量显微镜
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-04-15 DOI: 10.1107/s1600577524002406
Hagiwara, K., Nakamura, E., Makita, S., Suga, S., Tanaka, S.-, Kera, S., Matsui, F.
{"title":"Development of dual-beamline photoelectron momentum microscopy for valence orbital analysis","authors":"Hagiwara, K., Nakamura, E., Makita, S., Suga, S., Tanaka, S.-, Kera, S., Matsui, F.","doi":"10.1107/s1600577524002406","DOIUrl":"https://doi.org/10.1107/s1600577524002406","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"57 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140561932","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measuring magnetic hysteresis curves with polarized soft X-ray resonant reflectivity 利用偏振软 X 射线共振反射测量磁滞曲线
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-04-10 DOI: 10.1107/s160057752400119x
Fan, R., Kiranjot,, Aboljadayel, R.O.M., Alsaeed, K., Bencok, P., Burn, D.M., Hindmarch, A.T., Steadman, P.
{"title":"Measuring magnetic hysteresis curves with polarized soft X-ray resonant reflectivity","authors":"Fan, R., Kiranjot,, Aboljadayel, R.O.M., Alsaeed, K., Bencok, P., Burn, D.M., Hindmarch, A.T., Steadman, P.","doi":"10.1107/s160057752400119x","DOIUrl":"https://doi.org/10.1107/s160057752400119x","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"25 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140561571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-pressure X-ray photon correlation spectroscopy at fourth-generation synchrotron sources 第四代同步辐射源的高压 X 射线光子相关光谱学
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-04-10 DOI: 10.1107/s1600577524001784
Cornet, A., Ronca, A., Shen, J., Zontone, F., Chushkin, Y., Cammarata, M., Garbarino, G., Sprung, M., Westermeier, F., Deschamps, T., Ruta, B.
{"title":"High-pressure X-ray photon correlation spectroscopy at fourth-generation synchrotron sources","authors":"Cornet, A., Ronca, A., Shen, J., Zontone, F., Chushkin, Y., Cammarata, M., Garbarino, G., Sprung, M., Westermeier, F., Deschamps, T., Ruta, B.","doi":"10.1107/s1600577524001784","DOIUrl":"https://doi.org/10.1107/s1600577524001784","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"49 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140561676","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A sub-100 nm thickness flat jet for extreme ultraviolet to soft X-ray absorption spectroscopy 用于极紫外至软 X 射线吸收光谱分析的厚度小于 100 纳米的平面射流
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-04-09 DOI: 10.1107/s1600577524001875
De Angelis, D., Longetti, L., Bonano, G., Pelli Cresi, J.S., Foglia, L., Pancaldi, M., Capotondi, F., Pedersoli, E., Bencivenga, F., Krstulovic, M., Menk, R.H., D'Addato, S., Orlando, S., de Simone, M., Ingle, R.A., Bleiner, D., Coreno, M., Principi, E., Chergui, M., Masciovecchio, C., Mincigrucci, R.
{"title":"A sub-100 nm thickness flat jet for extreme ultraviolet to soft X-ray absorption spectroscopy","authors":"De Angelis, D., Longetti, L., Bonano, G., Pelli Cresi, J.S., Foglia, L., Pancaldi, M., Capotondi, F., Pedersoli, E., Bencivenga, F., Krstulovic, M., Menk, R.H., D'Addato, S., Orlando, S., de Simone, M., Ingle, R.A., Bleiner, D., Coreno, M., Principi, E., Chergui, M., Masciovecchio, C., Mincigrucci, R.","doi":"10.1107/s1600577524001875","DOIUrl":"https://doi.org/10.1107/s1600577524001875","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"30 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140561451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Iterative Bragg peak removal on X-ray absorption spectra with automatic intensity correction 通过自动强度校正迭代去除 X 射线吸收光谱上的布拉格峰
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-04-09 DOI: 10.1107/s1600577524002327
Shimogawa, R., Marcella, N., O'Connor, C.R., Kim, T.-S., Reece, C., Lubomirsky, I., Frenkel, A.I.
{"title":"Iterative Bragg peak removal on X-ray absorption spectra with automatic intensity correction","authors":"Shimogawa, R., Marcella, N., O'Connor, C.R., Kim, T.-S., Reece, C., Lubomirsky, I., Frenkel, A.I.","doi":"10.1107/s1600577524002327","DOIUrl":"https://doi.org/10.1107/s1600577524002327","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"41 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140561333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modelling the power threshold and optimum thermal deformation of indirectly liquid-nitro­gen cryo-cooled Si monochromators 间接液氮低温冷却硅单色仪的功率阈值和最佳热变形建模
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-04-09 DOI: 10.1107/s1600577524002133
Khosroabadi, H., Alianelli, L., Sanchez-Navarro, P., Peach, A., Sawhney, K.
{"title":"Modelling the power threshold and optimum thermal deformation of indirectly liquid-nitro­gen cryo-cooled Si monochromators","authors":"Khosroabadi, H., Alianelli, L., Sanchez-Navarro, P., Peach, A., Sawhney, K.","doi":"10.1107/s1600577524002133","DOIUrl":"https://doi.org/10.1107/s1600577524002133","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"186 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140561567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
X-ray beam diagnostics at the MID instrument of the European X-ray Free-Electron Laser Facility 欧洲 X 射线自由电子激光设施 MID 仪器的 X 射线束诊断技术
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-04-08 DOI: 10.1107/s1600577524001279
Boesenberg, U., Ansaldi, G., Bartmann, A., Batchelor, L., Brausse, F., Hallmann, J., Jo, W., Kim, C., Klein, B., Lobato, I., Lu, W., Möller, J., Petrov, I., Rodriguez-Fernandez, A., Schmidt, A., Scholz, M., Shayduk, R., Sukharnikov, K., Zozulya, A., Madsen, A.
{"title":"X-ray beam diagnostics at the MID instrument of the European X-ray Free-Electron Laser Facility","authors":"Boesenberg, U., Ansaldi, G., Bartmann, A., Batchelor, L., Brausse, F., Hallmann, J., Jo, W., Kim, C., Klein, B., Lobato, I., Lu, W., Möller, J., Petrov, I., Rodriguez-Fernandez, A., Schmidt, A., Scholz, M., Shayduk, R., Sukharnikov, K., Zozulya, A., Madsen, A.","doi":"10.1107/s1600577524001279","DOIUrl":"https://doi.org/10.1107/s1600577524001279","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"240 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140561465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
At-wavelength metrology of an X-ray mirror using a downstream wavefront modulator 利用下游波前调制器对 X 射线反射镜进行波长测量
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-04-08 DOI: 10.1107/s1600577524002157
Zhou, T., Hu, L., Wang, H.
{"title":"At-wavelength metrology of an X-ray mirror using a downstream wavefront modulator","authors":"Zhou, T., Hu, L., Wang, H.","doi":"10.1107/s1600577524002157","DOIUrl":"https://doi.org/10.1107/s1600577524002157","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"109 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140561668","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy 利用透射 X 射线纳米衍射显微镜对薄膜的应力、变形和断裂进行现场表征
IF 2.5 3区 物理与天体物理
Journal of Synchrotron Radiation Pub Date : 2024-01-01 DOI: 10.1107/s1600577523010093
Lotze, G., Iyer, A.H.S., Bäcke, O., Kalbfleisch, S., Colliander, M.H.
{"title":"In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy","authors":"Lotze, G., Iyer, A.H.S., Bäcke, O., Kalbfleisch, S., Colliander, M.H.","doi":"10.1107/s1600577523010093","DOIUrl":"https://doi.org/10.1107/s1600577523010093","url":null,"abstract":"","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"1 1","pages":""},"PeriodicalIF":2.5,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138683331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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